Orthogonal acceleration TOF with ion guide mode

• US 9,129,790 B2
• Filed: 03/13/2014
• Issued: 09/08/2015
• Est. Priority Date: 03/14/2013
• Status: Active Grant

• Current Assignee: Perkin Elmer Life Sciences
• Original Assignee: Perkinelmer Health Sciences Incorporated (Perkinelmer Incorporated)
• Inventors: Welkie, David G.
• Primary Examiner(s): Ippolito, Nicole
• Assistant Examiner(s): Chang, Hanway
• Application Number:
  US14/209,982
• Publication Number:
  US 20140264005A1
• Time in Patent Office: 544 Days
• Field of Search: 250/281, 250/282, 250/286, 250/287
• US Class Current: 1/1
• CPC Class Codes: H01J 49/062 Ion guides linear ion traps performing mass selection H01J49/4225, mass filters H01J49/421
• CPC Class Codes: H01J 49/401 characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode

Abstract

Mass spectrometry systems include an electronic controller and a time-of-flight mass analyzer in communication with the electronic controller. The time-of-flight mass analyzer includes a pulsing region defining a channel that extends along an axis. The pulsing region includes: a first electrode extending along the axis, the first electrode defining one or more apertures; a second electrode extending along the axis, the first and second electrodes being positioned on opposing sides of the axis in a first direction perpendicular to the axis. The electronic controller is programmed to apply a first set of voltages to the electrodes to constrain a motion of ions propagating along the axis in a radial direction relative to the axis, and apply a second set of voltages to the electrodes to accelerate the ions out of the pulsing region through the one or more apertures.

Claims

1. A system, comprising:

an electronic controller; and

a time-of-flight mass analyzer in communication with the electronic controller, the time-of-flight mass analyzer comprising;

a pulsing region defining a channel that extends along an axis, the pulsing region comprising;

a first electrode extending along the axis, the first electrode defining one or more apertures;

a second electrode extending along the axis, the first and second electrodes being positioned on opposing sides of the axis in a first direction perpendicular to the axis;

a third electrode extending along the axis; and

a fourth electrode extending along the axis, the third and fourth electrodes being positioned on opposing sides of a plane defined by the axis and the first direction,

wherein;

the electronic controller is programmed to apply a first set of voltages to the electrodes to constrain a motion of ions propagating along the axis in a radial direction relative to the axis, and apply a second set of voltages to the electrodes to accelerate the ions out of the pulsing region through the one or more apertures, where the first set of voltages comprises RF voltages applied to the first and second electrodes, the RF voltages being in phase with each other.

2. The system of claim 1, wherein the time-of-flight mass analyzer accelerates the ions in the first direction.

3. The system of claim 1, further comprising one or more additional pairs of electrodes extending along the axis, each pair comprising electrodes on opposite sides of the plane.

4. The system of claim 3, wherein the RF voltages applied to the one or more additional pairs of electrodes are in phase with RF voltages applied to the third and fourth electrodes.

5. The system of claim 1, wherein the first set of voltages further comprises RF voltages applied to the third and fourth electrodes that are in phase with each other.

6. The system of claim 1, wherein the RF voltages applied to the first and second electrodes are out of phase with the RF voltages applied to the third and fourth electrodes.

7. The system of claim 1, wherein the first set of voltages comprises RF voltages that have square waveforms or sinusoidal waveforms.

8. The system of claim 1, wherein the second set of voltages comprises DC voltages that establish a potential gradient in the first direction.

9. The system of claim 1, wherein the electronic controller is programmed to sequentially apply the first set of voltages and then the second set of voltages to the electrodes.

10. A method, comprising:

directing ions into a channel extending along an axis in a pulsing region of a time-of-flight mass analyzer;

applying RF voltages to electrodes extending along the axis to constrain a motion of the ions in a radial direction relative to the axis; and

applying DC voltages to the electrodes to accelerate the ions out of the pulsing region in a direction orthogonal to the axis,

wherein applying the RF voltages comprises applying in-phase voltages to a first pair of electrodes positioned on opposing sides of the axis in a first direction perpendicular to the axis, the first pair of electrodes comprising an electrode that defines one or more apertures through which the ions exit the pulsing region.

11. The method of claim 10, wherein applying the RF voltages further comprises applying in-phase voltages to a second pair of electrodes positioned on opposing sides of a plane defined by the axis and the first direction.

12. The method of claim 10, further comprising detecting the ions accelerated out of the pulsing region.

13. The method of claim 12, wherein the ions travel to a detector through a flight tube.

14. The method of claim 10, wherein the RF and DC voltages are repeatedly sequentially applied to the electrodes to direct a series of packets of ions out of the pulsing region.

15. A mass spectrometry system, comprising:

an ion source;

a time-of-flight analyzer assembly comprising a pulsing region, a flight tube and a detector;

an ion transport assembly arranged to receive ions from the ion source and direct the ions to the pulsing region of the time-of-flight analyzer assembly; and

an electronic controller in communication with the time-of-flight analyzer assembly,

wherein;

the pulsing region defines a channel that extends along an axis and the pulsing region comprises a first electrode extending along the axis, the first electrode defining one or more apertures,

a second electrode extending along the axis, the first and second electrodes being positioned on opposing sides of the axis in a first direction perpendicular to the axis;

a third electrode extending along the axis; and

a fourth electrode extending along the axis, the third and fourth electrodes being positioned on opposing sides of a plane defined by the axis and the first direction

during operation the electronic controller causes the pulsing region to operate sequentially in a first mode, in which ions in an ion beam are confined to trajectories along an axis of the pulsing region, and a second mode, in which the ions are accelerated in a direction orthogonal to the axis into the flight tube, where the first mode comprises applying a first set of voltages to the electrodes, the first set of voltages comprising applying to the first and second electrodes RF voltages that are in phase with each other, and the second mode comprises applying a second set of voltages to the electrodes.

16. The system of claim 15, wherein the ion transport assembly comprises one or more ion guides.

17. The system of claim 16, wherein the one or more ion guides comprise one or more multiple ion guides.

18. The system of claim 15, wherein the ion transport assembly and the time-of-flight analyzer assembly are housed in one or more vacuum chambers.

19. The system of claim 15, wherein the ion source is a continuous ion source.

20. The system of claim 15, further comprising one or more additional pairs of electrodes extending along the axis, each pair comprising electrodes on opposite sides of the plane.

21. The system of claim 15, wherein the first set of voltages further comprises RF voltages applied to the third and fourth electrodes that are in phase with each other.

22. The system of claim 15, wherein the RF voltages applied to the first and second electrodes are out of phase with RF voltages applied to the third and fourth electrodes.

23. The system of claim 15, wherein the second set of voltages comprises DC voltages that establish a potential gradient in the first direction.

24. The system of claim 15, wherein the electronic controller is programmed to sequentially apply the first set of voltages and then the second set of voltages to the electrodes.

25. A method for analyzing ions using a time-of-flight mass analyzer, the method comprising:

ionizing a sample to generate ions;

directing the ions to a pulsing region of a time-of-flight mass analyzer;

providing a first electric field within the pulsing region to guide the ions along an axis within the pulsing region;

providing a second electric field within the pulsing region to accelerate the ions perpendicular to the axis and out of the pulsing region;

detecting the accelerated ions at a detector; and

analyzing a mass of the ions based on a time-of-flight from the pulsing region to the detector,

wherein providing the first electric field comprises applying a first RF voltage waveform to a first pair of the electrodes, the first pair of electrodes comprising an electrode that defines one or more apertures through which the ions exit the pulsing region.

26. The method of claim 25, wherein a second RF voltage waveform out of phase with the first RF voltage waveform is applied to a second pair of the electrodes.

27. The method of claim 25, wherein the second electric field is provided by applying a second set of voltages to the electrodes.

28. The method of claim 27, wherein the second set of voltages are DC voltages.

29. The method of claim 28, wherein the DC voltages cause the ions to exit the pulsing region through one or more apertures in one of the electrodes.