Measurement method

• US 9,130,854 B2
• Filed: 05/16/2012
• Issued: 09/08/2015
• Est. Priority Date: 05/17/2011
• Status: Active Grant

• Current Assignee: British Telecommunications PLC (BT Group PLC)
• Original Assignee: British Telecommunications PLC (BT Group PLC)
• Inventors: Hatch, Christopher Byron, Beaumont, Stephen Charles
• Primary Examiner(s): HAILE, AWET A
• Application Number:
  US14/119,806
• Publication Number:
  US 20140198667A1
• Time in Patent Office: 1,210 Days
• Field of Search: 370/242, 370/247, 370/249, 370/252, 370/255, 379/9, 379/22.03, 379/27.01, 379/30, 379/382
• US Class Current: 1/1
• CPC Class Codes: H04L 43/12 Network monitoring probes
• CPC Class Codes: H04L 43/50 Testing arrangements
• CPC Class Codes: H04M 3/305 testing of physical copper line parameters, e.g. capacitance or resistance locating faults in cables G01R31/08
• CPC Class Codes: Y04S 40/00 Systems for electrical power generation, transmission, distribution or end-user application management characterised by the use of communication or information technologies, or communication or information technology specific aspects supporting them

Abstract

The performance of a test apparatus for a communications network may be inferred by analyzing a set of performance data results measured on a number of different lines in the network. Once a sample of sufficient size for a particular test apparatus has been created then it is possible to infer the performance of the test apparatus based on the ratio of passes to fails recorded.

Claims

1. A method of determining the performance of a test apparatus, the method comprising:

a) attaching a test apparatus to a communications network, the communications network comprising a plurality of local exchanges, each of the local exchanges being connected to a plurality of customer premises by a metallic loop;

b) applying one or more test signals to a metallic loop;

c) determining one or more metallic loop parameters in accordance with measurements made whilst the one or more test signals were applied to the metallic loop, wherein the one or more metallic loop parameters comprise an insertion loss, a resistance of the metallic loop, and a capacitance between two wires that comprise the metallic loop;

d) comparing the one or more metallic loop parameters to predetermined threshold values;

e) determining a status of the metallic loop on the basis of the comparison performed in d) by;

(i) determining an estimate for a length of the metallic loop for each of the one or more metallic loop parameters based on the measured parameter value and a pre-determined further value associated with each of the one or more metallic loop parameters,

(ii) determining a weighted average metallic loop length based on the plurality of metallic loop length estimates, and

(iii) inferring a condition of the metallic loop based on the weighted average determined in (ii) and the plurality of metallic loop length estimates determined in (i) by determining a ratio of the estimated metallic loop length to the weighted average metallic loop length for each of the plurality of metallic loop parameters;

f) storing data relating to the status of the metallic loop in a database; and

g) determining the performance of the test apparatus on the basis of the data stored in the database which relates to tests carried out by that test apparatus.

2. A method according to claim 1, wherein the performance of the test apparatus is determined to be acceptable if a ratio of acceptable test results to unacceptable test results is greater than a predetermined threshold value.

3. A method according to claim 2, wherein the ratio of acceptable test results to unacceptable test results is determined based on a pre-determined number of measurements.

4. A method according to claim 2, wherein the performance of the test apparatus is determined to be acceptable if the ratio of acceptable test results to unacceptable test results is greater than 75% and this ratio has been calculated from at least 20 measurements.

5. A method according to claim 1, wherein in (iii), the condition of the metallic loop can be inferred as being acceptable if each of the plurality of ratios is less than a first predetermined value.

6. A method according to claim 1, wherein it can be inferred that the metallic loop may have an unacceptable condition in the future if each of the plurality of ratios determined in (iii) is greater than the first predetermined value but less than a second predetermined value.

7. A method according to claim 1, wherein in (iii), it can be inferred that the metallic loop has an unacceptable condition if each of the plurality of ratios determined in (iii) is greater than the second predetermined value.

8. A test apparatus comprising a processing unit, memory means and data storage means, the apparatus being configured, in use, to perform a method according to claim 1.

9. A test apparatus according to claim 8, wherein the apparatus comprises a portable network testing apparatus.