System and processor implemented method for improved image quality and generating an image of a target illuminated by quantum particles
First Claim
1. A system for generating an image of a target illuminated by quantum entangled particles comprising:
- an illumination system comprising;
at least one source of quantum entangled particle pairs; and
a beamsplitter receiving the quantum entangled particle pairs, such that one particle from each pair of particle generated by each source interfere on the beamsplitter causing the interfered particles to be directed towards a target and the remaining particle pairs are not directed towards the target,wherein the illumination system is configured so that the interfered particles interact with the target;
a measuring system comprising a first detector and a second detector that are configured to perform at least one spatially resolved measurement of particles, where the first detector measures one of the remaining particle pairs and the second detector measures the other of the remaining particle pairs; and
a processor configured to generate an image of the target based upon the correlated measured values and spatial information from the first detector and the second detector.
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Abstract
According to some embodiments, system and methods for image improvement comprise: receiving a plurality of frames of a given region of interest, the frames comprised of a plurality of pixels; determining, based on a quantum property of the frames, a normalized pixel intensity value for each pixel of each of the plurality of frames; and generating an improved image of the given region of interest based on the plurality of frames and the corresponding normalized pixel intensity values for the frames, the order of the image being two. Also embodiments for generating an image of a target illuminated by quantum entangled particles, such as, photons, are disclosed.
28 Citations
20 Claims
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1. A system for generating an image of a target illuminated by quantum entangled particles comprising:
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an illumination system comprising; at least one source of quantum entangled particle pairs; and a beamsplitter receiving the quantum entangled particle pairs, such that one particle from each pair of particle generated by each source interfere on the beamsplitter causing the interfered particles to be directed towards a target and the remaining particle pairs are not directed towards the target, wherein the illumination system is configured so that the interfered particles interact with the target; a measuring system comprising a first detector and a second detector that are configured to perform at least one spatially resolved measurement of particles, where the first detector measures one of the remaining particle pairs and the second detector measures the other of the remaining particle pairs; and a processor configured to generate an image of the target based upon the correlated measured values and spatial information from the first detector and the second detector. - View Dependent Claims (7, 8, 9, 10, 11, 17, 18, 19)
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2. The system of 1, further comprising:
electronics configured to determine coincidences based on measurements of the first and second detectors which occur within a predetermined time interval.
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3. The system of 2, wherein the processor is configured to generate at least a second order image using the coincidences.
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4. The system of 2, wherein the processor is configured to apply an image improvement method for generating at least a second order image using at least one measurable quantum property.
- 5. The system of 1, further comprising an optical delay element configured to introduce a time delay for particles reaching the measuring system.
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12. The method of 11, further comprising:
- determining coincidences based on measurements of the first and second detectors which occur within a predetermined time interval.
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13. The method of 12, wherein generating the image of the target comprises generating at least a second order image using the determined coincidences.
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14. The method of 11, further comprising:
- applying an image improvement method for generating at least a second order image using at least one measurable quantum property.
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15. The method of 11, further comprising:
- introducing a time delay for particles reaching the measuring system.
- View Dependent Claims (16, 20)
Specification