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High temperature gold-free wafer bonding for light emitting diodes

  • US 9,142,743 B2
  • Filed: 08/02/2011
  • Issued: 09/22/2015
  • Est. Priority Date: 08/02/2011
  • Status: Active Grant
First Claim
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1. A method of manufacture comprising:

  • (a) wafer bonding a carrier wafer structure to a device wafer structure by melting a bond metal disposed between the carrier wafer structure and the device wafer structure, wherein the device wafer structure comprises a silicon substrate and an epitaxial Light Emitting Diode (LED) structure formed on the silicon substrate, wherein the epitaxial LED structure comprises an n-type layer, a p-type layer, and an active layer disposed between the n-type layer and the p-type layer, wherein the active layer comprises an amount of indium, wherein the carrier wafer structure comprises a carrier, wherein the bond metal layer includes substantially no gold and wherein the wafer bonding of (a) results in a wafer bonded structure;

    (b) after (a) removing the silicon substrate from the wafer bonded structure;

    (c) after (b) forming first and second electrodes, the first electrode being in contact with the n-type layer, the second electrode being in contact with the p-type layer; and

    (d) singulating the wafer bonded structure thereby forming an LED device,wherein the bond metal comprises aluminum and silicon.

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