Reconfigurable electric field probe
First Claim
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1. A method for electromagnetic compatibility (EMC) testing, comprising:
- positioning a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip;
targeting an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and
performing at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor.
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Abstract
Systems and methods for EMC, EMI and ESD testing are described. A probe comprises a center conductor extending along an axis of the probe, a probe tip, and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip. One or more actuators may change the relative positions of the probe tip and shield with respect to a device under test, thereby enabling control of sensitivity and resolution of the probe.
8 Citations
36 Claims
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1. A method for electromagnetic compatibility (EMC) testing, comprising:
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positioning a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip; targeting an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and performing at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An apparatus for electromagnetic compatibility (EMC) testing, comprising:
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means for positioning a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip; means for targeting an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and means for performing at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. An apparatus for electromagnetic compatibility (EMC) testing, comprising:
a processing system configured to; position a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip; target an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and perform at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27)
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28. A non-transitory computer program product, comprising:
a non-transitory computer-readable medium comprising code for; positioning a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip; targeting an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and performing at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36)
Specification