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Reconfigurable electric field probe

  • US 9,151,779 B2
  • Filed: 11/13/2012
  • Issued: 10/06/2015
  • Est. Priority Date: 11/13/2012
  • Status: Expired due to Fees
First Claim
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1. A method for electromagnetic compatibility (EMC) testing, comprising:

  • positioning a probe proximate to a device under test (DUT), wherein the probe comprises a center conductor extending along an axis of the probe and having a probe tip at one end and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip;

    targeting an area of interest on the DUT by adjusting a geometry between the probe tip and the shield; and

    performing at least one EMC test on the DUT, wherein adjusting the geometry between the probe tip and the shield comprises moving the shield in a direction parallel to the center conductor.

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