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Test system with temporary test structures

  • US 9,157,954 B2
  • Filed: 06/03/2011
  • Issued: 10/13/2015
  • Est. Priority Date: 06/03/2011
  • Status: Active Grant
First Claim
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1. A test system for detecting manufacturing defects in conductive electronic device antenna structures under test, comprising:

  • temporary test structures that are brought into contact with the conductive electronic device antenna structures under test only during testing;

    a fixture that receives the conductive electronic device antenna structures under test and the temporary test structures, wherein the temporary test structures are configured to enhance the detection of manufacturing defects; and

    test probe structures configured to convey radio-frequency test signals to the conductive electronic device antenna structures under test and to receive corresponding test data from the conductive electronic device antenna structures under test while the radio-frequency test signals are being conveyed to the conductive electronic device antenna structures under test.

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