Characterization and calibration of large area solid state photomultiplier breakdown voltage and/or capacitance

• US 9,164,144 B2
• Filed: 12/27/2012
• Issued: 10/20/2015
• Est. Priority Date: 12/27/2012
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Dolinsky, Sergei Ivanovich
• Primary Examiner(s): Valone, Thomas F
• Application Number:
  US13/727,959
• Publication Number:
  US 20140184197A1
• Time in Patent Office: 1,027 Days
• Field of Search: 324/96
• US Class Current: 1/1
• CPC Class Codes: G01J 1/08 Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
• CPC Class Codes: G01J 1/4228 arrangements with two or more detectors, e.g. for sensitivity compensation
• CPC Class Codes: G01J 11/00 Measuring the characteristics of individual optical pulses or of optical pulse trains
• CPC Class Codes: G01R 31/2837 Characterising or performance testing, e.g. of frequency response transient response G01R27/28
• CPC Class Codes: G01T 1/20184 Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
• CPC Class Codes: G01T 1/208 Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section

Abstract

Exemplary embodiments are directed to characterizing a solid state photomultiplier (SSPM). The SSPM can be exposed to a light pulse that triggers a plurality of microcells of the SSPM and an output signal of the SSPM generated in response to the light pulse can be processed. The output signal of the SSPM can be proportional to a gain of the SSPM and a quantity of microcells in the SSPM and a value of an electrical parameter of the SSPM can be determined based on a relationship between the output signal of the SSPM and an over voltage applied to the SSPM.

Claims

1. A method of characterizing a solid state photomultiplier (SSPM) comprising:

exposing the SSPM to a light pulse that triggers a plurality of microcells of the SSPM, wherein an intensity of the light pulse generates at least two primary electron-hole pairs for each of the microcells;

processing an output signal of the SSPM generated in response to the light pulse, the output signal being proportional to a gain of the SSPM and a quantity of microcells in the SSPM;

applying a bias voltage to the SSPM to configure the plurality of microcells in a Geiger mode of operation; and

determining a value of an electrical parameter of the SSPM based on a relationship between the output signal of the SSPM and a bias voltage applied to the SSPM.

2. The method of claim 1, wherein the electrical parameter is a breakdown voltage for the microcells and the relationship is a function of the output signal and the bias voltage applied to the SSPM.

3. The method of claim 1, wherein the electrical parameter is a capacitance for the microcells and the relationship is a function of a derivative of the output signal with respect to the bias voltage applied to the SSPM.

4. The method of claim 1, wherein the SSPM is incorporated into at least one of a nuclear detector or an optical detector.

5. The method of claim 4, further comprising adjusting the bias voltage applied to the SSPM in response to determining the value of the electrical parameter to calibrate the gain of the microcells.

6. The method of claim 1, further comprising:

exposing the SSPM to one or more additional light pulses, each of the one or more additional light pulses having different intensities;

processing an output signal of the SSPM generated in response to each of the one or more additional light pulses;

evaluating a current of the output signal for each of the one or more additional light pulses as a function of the bias voltage applied to the SSPM; and

determining the value of the electrical parameter of the SSPM in response to each of the one or more additional light pulses to characterize the SSPM.

7. The system of claim 1, wherein the SSPM is incorporated into at least one of a nuclear detector or an optical detector.

8. The system of claim 7, further comprising adjusting the bias voltage applied to the SSPM in response to determining the value of the electrical parameter to calibrate the gain of the microcells.

9. The method of claim 1, wherein the light pulse has a duration that is less than a recovery time of the SSPM.

10. A system for determining an electrical parameter of a solid state photomultiplier comprising:

a light source configured to emit light pulses at different intensities towards a solid state photomultiplier to trigger a plurality of microcells in the SSPM, wherein the different intensities of the light pulses emitted by the light source generates at least two primary electron-hole pairs for each of the microcells;

circuitry configured to process an output signal of an SSPM, the output signal being proportional to a gain of the SSPM and a quantity of microcells in the SSPM; and

a processing device programmed to control emission of the light pulses from the light source and control processing of the output signal by the circuitry and to determine an electrical parameter of the SSPM based on a relationship between the output signal of the SSPM and a bias voltage applied to the SSPM, wherein the application of the bias voltage configures the plurality of microcells in a Geiger mode of operation.

11. The system of claim 10, wherein the electrical parameter is a breakdown voltage for the microcells and the relationship is a function of the output signal and the bias voltage applied to the SSPM.

12. The system of claim 10, wherein the electrical parameter is a capacitance for the microcells and the relationship is a function of a derivative of the output signal with respect to the bias voltage applied to the SSPM.

13. The system of claim 10, wherein the different intensities of the light pulses emitted by the light source generates at least approximately ten primary electron-hole pairs for each of the microcells.

14. The system of claim 10, wherein the processing device is programmed to evaluate a current of the output signal for each of the light pulses as a function of the bias voltage applied to the SSPM and determine the value of the electrical parameter of the SSPM in response to each of the light pulses to characterize the SSPM.

15. The system of claim 10, wherein the processing device is programmed to evaluate an average current over a specified time period of the output signal for the light pulses as a function of the bias voltage applied to the SSPM and determine the value of the electrical parameter of the SSPM in response to the light pulses to characterize the SSPM.

16. The system of claim 10, wherein the light pulse has a duration that is less than a recovery time of the SSPM.