Capacitance to code converter with sigma-delta modulator
First Claim
1. A method comprising:
- measuring a mutual capacitance on a sense element of a matrix-scanning device using a modulation circuit, wherein the matrix-scanning device comprises a plurality of drive lines and a plurality of sense lines and the sense element is located at an intersection of one of the plurality of drive lines and one of the plurality of sense lines, wherein the measuring the mutual capacitance comprises;
applying a drive signal to the one of the plurality of drive lines using an excitation source; and
sensing, by the modulation circuit, the drive signal on the one of the plurality of sense lines to measure the mutual capacitance of the sense element; and
switching the sense element to be coupled and decoupled to a capacitor of the modulation circuit using a first plurality of switches, wherein the first plurality of switches are controlled by a clock;
converting the mutual capacitance measured on the sense element to a first digital value;
measuring a self-capacitance on at least one of the plurality of drive lines;
switching the at least one of the plurality of drive lines to be coupled and decoupled to the capacitor using a second plurality of switches, wherein the second plurality of switches are controlled by the clock; and
converting the self-capacitance measured on the at least one of the plurality of drive lines to a second digital value.
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Accused Products
Abstract
An apparatus and method of converting a capacitance measured on a sensor element to a digital value. The apparatus may include a matrix-scanning device including drive lines and sense lines. A sense element is located at an intersection of one of the drive lines and one of the sense lines. The apparatus also includes a modulation circuit coupled to the drive lines and the sense lines, and a switching circuit having first switches controlled by a clock. The modulation circuit is configured to measure a mutual capacitance on the sense element and to convert the measured mutual capacitance to a first digital value. The modulation circuit is configured to measure a self-capacitance on at least one of the drive lines and to convert the measured self-capacitance to a second digital value.
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Citations
22 Claims
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1. A method comprising:
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measuring a mutual capacitance on a sense element of a matrix-scanning device using a modulation circuit, wherein the matrix-scanning device comprises a plurality of drive lines and a plurality of sense lines and the sense element is located at an intersection of one of the plurality of drive lines and one of the plurality of sense lines, wherein the measuring the mutual capacitance comprises; applying a drive signal to the one of the plurality of drive lines using an excitation source; and sensing, by the modulation circuit, the drive signal on the one of the plurality of sense lines to measure the mutual capacitance of the sense element; and switching the sense element to be coupled and decoupled to a capacitor of the modulation circuit using a first plurality of switches, wherein the first plurality of switches are controlled by a clock; converting the mutual capacitance measured on the sense element to a first digital value; measuring a self-capacitance on at least one of the plurality of drive lines; switching the at least one of the plurality of drive lines to be coupled and decoupled to the capacitor using a second plurality of switches, wherein the second plurality of switches are controlled by the clock; and converting the self-capacitance measured on the at least one of the plurality of drive lines to a second digital value. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus comprising:
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a matrix-scanning device comprising a plurality of drive lines and a plurality of sense lines and a sense element is located at an intersection of one of the plurality of drive lines and one of the plurality of sense lines; an excitation signal source to provide a drive signal; a modulation circuit to be selectively coupled to the plurality of drive lines and the plurality of sense lines; and a switching circuit having a first plurality of switches and a second plurality of switches controlled in response to a clock, wherein the modulation circuit is to measure a mutual capacitance on the sense element using the first plurality of switches, wherein the modulation circuit is to convert the measured mutual capacitance to a first digital value, wherein the modulation circuit is to measure the mutual capacitance of the sense element by applying the drive signal to the one of the plurality of drive lines and sensing the drive signal on the one of the plurality of sense lines, wherein the modulation circuit is to measure a self-capacitance on at least one of the plurality of drive lines using the second plurality of switches, and wherein the modulation circuit is to convert the self-capacitance to a second digital value. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A system comprising:
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a matrix-scanning device comprising a plurality of sense elements, wherein the plurality of sense elements are intersections between a plurality of drive lines and a plurality of sense lines of the matrix-scanning device; and a processing device coupled to the matrix-scanning device, the processing device comprising; an excitation signal source to provide a drive signal; a switching circuit having a first plurality of switches and a second plurality of switches, wherein the processing device is to control the first and the second plurality of switches using a clock; and a modulation circuit to be coupled to the plurality of drive lines and the plurality of sense lines, wherein the modulation circuit is to measure mutual capacitances on the plurality of sense elements using the first plurality of switches, wherein the modulation circuit is to measure the mutual capacitances by applying the drive signal to each of the plurality of drive lines and sensing the drive signal on respective ones of the plurality of sense lines to measure the mutual capacitances of the intersections, wherein the modulation circuit is to convert one measured mutual capacitance of the measured mutual capacitances to a first digital value, wherein the modulation circuit is to measure a self-capacitance on at least one of the plurality of drive lines using the second plurality of switches, and wherein the modulation circuit is to convert the measured self-capacitance to a second digital value. - View Dependent Claims (20, 21, 22)
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Specification