Data storage device detecting media defects by writing opposite polarity test pattern
First Claim
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1. A data storage device comprising:
- a disk comprising a plurality of tracks;
a head actuated over the disk; and
control circuitry configured to;
write a first test pattern having a first polarity to a target track;
read the first test pattern to generate a first read signal;
overwrite the first test pattern with a second test pattern having a second polarity opposite the first polarity;
read the second test pattern to generate a second read signal; and
detect a defect in the target track based on the first read signal and the second read signal.
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Abstract
A data storage device is disclosed comprising a disk comprising a plurality of tracks, and a head actuated over the disk. A first test pattern having a first polarity is written to a target track, and the first test pattern is read to generate a first read signal. The first test pattern is overwritten with a second test pattern having a second polarity opposite the first polarity, and the second test pattern is read to generate a second read signal. A defect in the target track is detected based on the first read signal and the second read signal.
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Citations
18 Claims
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1. A data storage device comprising:
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a disk comprising a plurality of tracks; a head actuated over the disk; and control circuitry configured to; write a first test pattern having a first polarity to a target track; read the first test pattern to generate a first read signal; overwrite the first test pattern with a second test pattern having a second polarity opposite the first polarity; read the second test pattern to generate a second read signal; and detect a defect in the target track based on the first read signal and the second read signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of operating a data storage device, the method comprising:
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writing a first test pattern having a first polarity to a target track on a disk; reading the first test pattern to generate a first read signal; overwriting the first test pattern with a second test pattern having a second polarity opposite the first polarity; reading the second test pattern to generate a second read signal; and detecting a defect in the target track based on the first read signal and the second read signal. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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Specification