Microscope control device and optical distortion correction method

• US 9,176,311 B2
• Filed: 07/28/2011
• Issued: 11/03/2015
• Est. Priority Date: 08/18/2010
• Status: Active Grant

• Current Assignee: Sony Corporation (Sony Group Corp.)
• Original Assignee: Sony Corporation (Sony Group Corp.)
• Inventors: Yamamoto, Takashi
• Primary Examiner(s): Torrente, Richard
• Assistant Examiner(s): SUH, JOSEPH JINWOO
• Application Number:
  US13/192,803
• Publication Number:
  US 20120044340A1
• Time in Patent Office: 1,559 Days
• Field of Search: 348/79, 250/201.2, 250/201.9, 396/234, 359/383, 356/417
• US Class Current: 1/1
• CPC Class Codes: G02B 21/14 affording illumination for phase-contrast observation

Abstract

A microscope control device includes an offset processing unit that corrects phase contrast information regarding a phase contrast between corresponding phase contrast images, which is generated based on a set of the phase contrast images of a sample which are captured by a microscope, based on offset information of phase contrasts caused by optical distortions unique to the microscope, and a defocus amount calculation unit that calculates a defocus amount of the sample on the basis of the phase contrast information after offset correction.

Claims

1. A camera control device comprising:

an imaging processing unit configured to output phase contrast images recorded by a camera, the phase contrast images being derived from an image of a same perspective of a sample;

an offset processing unit configured to correct phase contrast information regarding a phase contrast between the corresponding phase contrast images by;

determining a phase contrast between the phase contrast images,

selecting an offset pattern of a plurality of offset patterns, each offset pattern corresponding to a defocus amount, and

determining a phase contrast difference as a difference between i) a phase contrast of the selected offset pattern and ii) the phase contrast of the phase contrast images;

a defocus amount calculation unit configured to calculate a defocus amount of the sample based on the phase contrast difference determined by the offset processing unit;

a pattern selection unit configured to;

determine whether the calculated defocus amount fits with the selected offset pattern, and

responsive to the calculated defocus amount not fitting with the selected offset pattern, select another different offset pattern closer to the calculated defocus amount and cause the offset processing unit to correct the phase contrast information using the other offset pattern; and

a distortion correction unit configured to output the calculated defocus amount to a driving control unit responsive to the pattern selection unit determining the calculated defocus amount fits with the selected offset pattern,

wherein the offset processing unit is configured to determine the phase contrast information based on a parallax between the corresponding phase contrast images derived from the image of the same perspective.

2. The camera control device according to claim 1,

wherein an offset process by the offset processing unit is a process for subtracting the offset information from the phase contrast information.

3. The camera control device according to claim 1, wherein the offset patterns include reference offset information used as a reference in an offset process and a plurality of pieces of offset information set for respective defocus amounts of the sample,

wherein the offset processing unit performs the offset process for the phase contrast information on the basis of the reference offset information,

wherein the defocus amount calculation unit calculates the defocus amount on the basis of the phase contrast information after offset correction based on the reference offset information, and

wherein the offset processing unit performs the offset process for the phase contrast information again by using offset information corresponding to the calculated defocus amount.

4. The camera control device according to claim 1, further comprising a defocus amount correction unit that calculates the thickness of a cover glass covering the sample and corrects the defocus amount on the basis of the calculated thickness of the corresponding cover glass.

5. The camera control device according to claim 1, wherein the offset processing unit is configured to:

use one of the phase contrast images as a reference image and another one of phase contrast images as a comparative image, the reference image and the comparative image being recorded at substantially the same time;

partition the reference image into sub-regions;

search the comparative image for image sub-regions matching with each sub-region of the reference image; and

determine the phase contrast information between the phase contrast images as parallax between the comparative image and the reference image for each matching pair of sub-regions.

6. The camera control device according to claim 5, wherein the offset processing unit is configured to:

determine a reference offset pattern in a focus state among the offset patterns stored in a database; and

determine the corrected phase contrast information as a difference between the phase contrast information and the reference offset pattern.

7. The camera control device according to claim 1, further comprising a control unit configured to determine convex and concave properties of the sample based on the phase contrast information.

8. The camera control device according to claim 1, further comprising a storage unit configured to store the plurality of offset patterns.

9. The camera control device according to claim 1, wherein the driving control unit is configured to adjust a focusing mechanism based on the calculated defocus amount.

10. An optical distortion correction method comprising:

outputting phase contrast images recorded by a camera, the phase contrast images being derived from an image of a same perspective of a sample;

correcting phase contrast information regarding a phase contrast between the corresponding phase contrast images by;

determining a phase contrast between the phase contrast images,

selecting an offset pattern of a plurality of offset patterns, each offset pattern corresponding to a defocus amount, and

determining a phase contrast difference as a difference between i) a phase contrast of the selected offset pattern and ii) the phase contrast of the phase contrast images; and

calculating a defocus amount of the sample based on the phase contrast information difference;

determining whether the calculated defocus amount fits with the selected offset pattern;

responsive to the calculated defocus amount not fitting with the selected offset pattern, selecting another different offset pattern closer to the calculated defocus amount and cause the offset processing unit to correct the phase contrast information using the other offset pattern; and

outputting the calculated defocus amount to a driving control unit responsive to determining the calculated defocus amount fits with the selected offset pattern,

wherein the phase contrast information is determined based on a parallax between the corresponding phase contrast images derived from the same perspective.

11. A camera controlling apparatus comprising:

a processor; and

a memory device configured to store instructions, which when executed by the processor, cause the processor to;

output phase contrast images recorded by a camera, the phase contrast images being derived from an image of a same perspective of a sample,

correct phase contrast information regarding a phase contrast between the corresponding phase contrast images by;

determining a phase contrast between the phase contrast images,

selecting an offset pattern of a plurality of offset patterns, each offset pattern corresponding to a defocus amount, and

determining a phase contrast difference as a difference between i) a phase contrast of the selected offset pattern and ii) the phase contrast of the phase contrast images;

calculate a defocus amount of the sample based on the phase contrast difference;

determine whether the calculated defocus amount fits with the selected offset pattern;

responsive to the calculated defocus amount not fitting with the selected offset pattern, select another different offset pattern closer to the calculated defocus amount and correct the phase contrast information using the other offset pattern; and

output the calculated defocus amount to a driving control unit responsive to determining the calculated defocus amount fits with the selected offset pattern,

wherein the phase contrast information is determined based on a parallax between the corresponding phase contrast images derived from the image of the same perspective.

12. The camera controlling apparatus according to claim 11, further comprising a storage device configured to store the plurality of offset patterns.

13. A microscope system comprising:

a first camera configured to record an enlarged image of a sample;

a second camera configured to record phase contrast images corresponding to the enlarged image, the phase contrast images being derived from an image of a same perspective of the sample; and

a camera control device comprising;

a processor; and

a memory device configured to store instructions, which when executed by the processor, cause the processor to;

correct phase contrast information regarding a phase contrast between the corresponding phase contrast images by;

determining a phase contrast between the phase contrast images,

selecting an offset pattern of a plurality of offset patterns, each offset pattern corresponding to a defocus amount, and

determining a phase contrast difference as a difference between i) a phase contrast of the selected offset pattern and ii) the phase contrast of the phase contrast images;

calculate a defocus amount of the sample based on the phase contrast difference;

determine whether the calculated defocus amount fits with the selected offset pattern;

responsive to the calculated defocus amount not fitting with the selected offset pattern, select another different offset pattern closer to the calculated defocus amount and correct the phase contrast information using the other offset pattern; and

output the calculated defocus amount to a driving control unit responsive to determining the calculated defocus amount fits with the selected offset pattern,

wherein the phase contrast information is determined based on a parallax between the corresponding phase contrast images derived from the image of the same perspective.

14. The microscope system according to claim 13, further comprising a storage device configured to store the plurality of offset patterns.

15. The microscope system according to claim 13, wherein the instructions further cause the processor to calculate the thickness of a cover glass covering the sample and correct the defocus amount on the basis of the calculated thickness of the corresponding cover glass.

16. The microscope system according to claim 13, further comprising a stage for the sample, wherein the instructions further cause the processor to drive the stage in accordance with the calculated defocus amount.