Pressure activated high density switch array

• US 9,182,440 B1
• Filed: 01/23/2013
• Issued: 11/10/2015
• Est. Priority Date: 01/30/2012
• Status: Expired due to Fees

• Current Assignee: Marvell Asia Pte Limited (Marvell Technology Group Limited)
• Original Assignee: Marvell International Limited (Marvell Technology Group Limited)
• Inventors: Leung, Yat Fai
• Primary Examiner(s): Assouad, Patrick
• Assistant Examiner(s): Curtis, Sean
• Application Number:
  US13/747,800
• Time in Patent Office: 1,021 Days
• Field of Search: 324/415, 324/418, 324/422, 324/750.24, 324/750.3, 324/754.07, 324/754.08, 324/754.11, 324/754.12, 324/754.14, 324/755.05, 324/756.07, 324/750.01, 324/750.16, 324/754.01
• US Class Current: 1/1
• CPC Class Codes: G01R 1/06716 Elastic
• CPC Class Codes: G01R 1/07314 the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support on an elastic support, e.g. a film, G01R1/0735
• CPC Class Codes: G01R 1/07385 using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
• CPC Class Codes: G01R 3/00 Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments , e.g. of probe tips
• CPC Class Codes: G01R 31/2889 Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence
• CPC Class Codes: G01R 31/66 Testing of connections, e.g. of plugs or non-disconnectable joints testing for incorrect line connections G01R31/55

Abstract

Some of the embodiments of the present disclosure provide a method for operating a testing system to test a device, wherein the testing system comprises a pressing module, the method comprising attaching the device to the pressing module of the testing system; while the testing system operates in a first mode of testing, pressing the pressing module to a first position such that (i) the device is electrically coupled to a first component via a first pin, and (ii) the device is electrically isolated from a second component via a second pin; and while the testing system operates in a second mode of testing, pressing the pressing module to a second position such that (i) the device is electrically isolated from first component via the first pin, and (ii) the device is electrically coupled to the second component via the second pin.

Claims

1. A method for operating a testing system to test a device, wherein the testing system comprises a pressing module, the method comprising:

attaching the device to the pressing module of the testing system;

while the testing system operates in a first mode of testing, pressing the pressing module to a first position such that (i) the device is electrically coupled to a first component via a first pin, and (ii) the device is electrically isolated from a second component via a second pin; and

while the testing system operates in a second mode of testing, pressing the pressing module to a second position such that (i) the device is electrically isolated from first component via the first pin, and (ii) the device is electrically coupled to the second component via the second pin.

2. The method of claim 1, wherein:

the first pin is attached to a load board;

the second pin is attached to the load board;

pressing the pressing module to the first position further comprises

pressing the pressing module to the first position such that the pressing module is at a first distance from the load board;

pressing the pressing module to the second position further comprises

pressing the pressing module to the second position such that the pressing module is at a second distance from the load board; and

the second distance is less than the first distance.

3. The method of claim 1, wherein while the testing system operates in the first mode of testing:

the pressing module does not exert any pressure on each of (i) the first pin and (ii) a third pin; and

based on the pressing module not exerting any pressure on each of (i) the first pin and (ii) the third pin, each of (i) the first pin and (ii) the third pin is electrically coupled to a first trace disposed on a first printed circuit board.

4. The method of claim 3, wherein while the testing system operates in the first mode of testing:

the first pin is electrically coupled to the device via a second trace disposed on a second printed circuit board;

the third pin is electrically coupled to the first component via a third trace disposed on the second printed circuit board; and

based on each of (i) the first pin and (ii) the third pin being electrically coupled to the first trace disposed on the first printed circuit board, the device is electrically coupled to the first component via the second trace, the first pin, the first trace, the third pin, and the third trace.

5. The method of claim 3, wherein while the testing system operates in the second mode of testing:

the pressing module exerts pressure on each of (i) the first pin and (ii) the third pin; and

based on the pressing module exerting pressure on each of (i) the first pin and (ii) the third pin, each of (i) the first pin and (ii) the third pin is electrically isolated from the first trace disposed on the first printed circuit board.

6. The method of claim 5, wherein while the testing system operates in the second mode of testing:

based on each of (i) the first pin and (ii) the third pin being electrically isolated from the first trace disposed on the first printed circuit board, the device is electrically isolated from first component.

7. The method of claim 3, wherein while the testing system operates in the first mode of testing:

based on pressing the pressing module to the first position, each of (i) the second pin and (ii) a fourth pin is electrically isolated from a second trace disposed on a second printed circuit board; and

based on each of (i) the second pin and (ii) the fourth pin being electrically isolated from the second trace disposed on the second printed circuit board, the device is electrically isolated from the second component.

8. The method of claim 7, wherein while the testing system operates in the second mode of testing:

based on pressing the pressing module to the second position, the pressing module exerts pressure on each of (i) the second pin and (ii) the fourth pin;

based on the pressing module exerting pressure on each of (i) the second pin and (ii) the fourth pin, each of (i) the second pin and (ii) the fourth pin is electrically connected to the second trace disposed on the second printed circuit board; and

based on each of (i) the second pin and (ii) the fourth pin being electrically connected to the second trace disposed on the second printed circuit board, the device is electrically coupled to the second component.

9. The method of claim 7, wherein:

the second pin is electrically coupled to the device via a third trace disposed on a third printed circuit board; and

the fourth pin is electrically coupled to the second component via a fourth trace disposed on the third printed circuit board.

10. The method of claim 1, wherein:

attaching the device to the pressing module further comprises

attaching the device to the pressing module via a compressible pusher;

pressing the pressing module to the first position further comprises

pressing the pressing module to the first position such that the compressible pusher is compressed to a first width; and

pressing the pressing module to the second position further comprises

pressing the pressing module to the second position such that the compressible pusher is compressed to a second width that is less than the first width.

11. A testing system configured to test a device, the testing system comprising:

a pressing module, wherein the device is attached to the pressing module while the device is being tested;

a first pin; and

a second pin,

wherein while the testing system operates in a first mode of testing, the pressing module is configured to be pressed to a first position such that (i) the device is electrically coupled to a first component via the first pin, and (ii) the device is electrically isolated from a second component via the second pin, and

wherein while the testing system operates in a second mode of testing, the pressing module is configured to be pressed to a second position such that (i) the device is electrically isolated from first component via the first pin, and (ii) the device is electrically coupled to the second component via the second pin.

12. The testing system of claim 11, wherein:

the testing system further comprises a load board;

the first pin is attached to the load board;

the second pin is attached to the load board;

while the pressing module is pressed to the first position, the pressing module is at a first distance from the load board; and

while the pressing module is pressed to the second position, the pressing module is at a second distance from the load board, such that the second distance is less than the first distance.

13. The testing system of claim 11, wherein while the testing system operates in the first mode of testing:

the pressing module does not exert any pressure on each of (i) the first pin and (ii) a third pin of the testing system; and

based on the pressing module not exerting any pressure on each of (i) the first pin and (ii) the third pin, each of (i) the first pin and (ii) the third pin is electrically coupled to a first trace disposed on a first printed circuit board of the testing system.

14. The testing system of claim 13, wherein while the testing system operates in the first mode of testing:

the first pin is electrically coupled to the device via a second trace disposed on a second printed circuit board of the testing system;

the third pin is electrically coupled to the first component via a third trace disposed on the second printed circuit board; and

based on each of (i) the first pin and (ii) the third pin being electrically coupled to the first trace disposed on the first printed circuit board, the device is electrically coupled to the first component via the second trace, the first pin, the first trace, the third pin, and the third trace.

15. The testing system of claim 13, wherein while the testing system operates in the second mode of testing:

the pressing module exerts pressure on each of (i) the first pin and (ii) the third pin; and

based on the pressing module exerting pressure on each of (i) the first pin and (ii) the third pin, each of (i) the first pin and (ii) the third pin is electrically isolated from the first trace disposed on the first printed circuit board.

16. The testing system of claim 15, wherein while the testing system operates in the second mode of testing:

based on each of (i) the first pin and (ii) the third pin being electrically isolated from the first trace disposed on the first printed circuit board, the device is electrically isolated from first component via the first pin.

17. The testing system of claim 13, wherein while the testing system operates in the first mode of testing:

based on pressing the pressing module to the first position, each of (i) the second pin and (ii) a fourth pin of the testing system is electrically isolated from a second trace disposed on a second printed circuit board of the testing system; and

based on each of (i) the second pin and (ii) the fourth pin being electrically isolated from the second trace disposed on the second printed circuit board, the device is electrically isolated from the second component.

18. The testing system of claim 17, wherein while the testing system operates in the second mode of testing:

based on pressing the pressing module to the second position, the pressing module exerts pressure on each of (i) the second pin and (ii) the fourth pin;

based on the pressing module exerting pressure on each of (i) the second pin and (ii) the fourth pin, each of (i) the second pin and (ii) the fourth pin is electrically connected to the second trace disposed on the second printed circuit board; and

based on each of (i) the second pin and (ii) the fourth pin being electrically connected to the second trace disposed on the second printed circuit board, the device is electrically coupled to the second component.

19. The testing system of claim 17, wherein:

the second pin is electrically coupled to the device via a third trace disposed on a third printed circuit board of the testing system; and

the fourth pin is electrically coupled to the second component via a fourth trace disposed on the third printed circuit board.

20. The testing system of claim 11, further comprising:

a compressible pusher, wherein the device is attached to the pressing module via the compressible pusher,

wherein while the pressing module is pressed to the first position, the compressible pusher is compressed to a first width, and

while the pressing module is pressed to the second position, the compressible pusher is compressed to a second width that is less than the first width.