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Apparatuses, integrated circuits, and methods for measuring leakage current

  • US 9,183,948 B2
  • Filed: 10/14/2014
  • Issued: 11/10/2015
  • Est. Priority Date: 10/26/2011
  • Status: Active Grant
First Claim
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1. An apparatus, comprising:

  • a word line leakage measurement system coupled to word lines of a memory, the word line leakage measurement system configured to determine whether a level of leakage on a word line exceeds a threshold after compensating for noise encountered on a measurement node.

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