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Quality of service support using stacked memory device with logic die

  • US 9,201,777 B2
  • Filed: 12/23/2012
  • Issued: 12/01/2015
  • Est. Priority Date: 12/23/2012
  • Status: Active Grant
First Claim
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1. An integrated circuit (IC) device comprising:

  • a set of one or more stacked memory dies implementing memory cell circuitry; and

    a set of one or more logic dies electrically coupled to the memory cell circuitry, the set of one or more logic dies comprising a quality-of-service (QoS) manager and a memory controller, the memory controller coupled to the QoS manager and coupleable to a set of one or more devices sharing access to the set of one or more stacked memory dies, and the QoS manager to perform operations for a specified QoS objective.

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