Multi-use package substrate

• US 9,204,542 B1
• Filed: 01/07/2013
• Issued: 12/01/2015
• Est. Priority Date: 01/07/2013
• Status: Active Grant

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Camarota, Rafael C., Lee, Tien-Yu
• Primary Examiner(s): Sawyer, Steven T
• Application Number:
  US13/735,338
• Time in Patent Office: 1,058 Days
• US Class Current: 1/1
• CPC Class Codes: G06F 2113/18 Chip packaging
• CPC Class Codes: G06F 30/34 for reconfigurable circuits, e.g. field programmable gate arrays [FPGA] or programmable logic devices [PLD]
• CPC Class Codes: G06F 30/347 Physical level, e.g. placement or routing
• CPC Class Codes: G06F 30/39 Circuit design at the physical level physical level design for reconfigurable circuits G06F30/347
• CPC Class Codes: G06F 30/398 Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] optical proximity correction [OPC] design processes G03F1/36
• CPC Class Codes: H01L 2224/16227 the bump connector connecting to a bond pad of the item
• CPC Class Codes: H01L 25/0655 the devices being arranged next to each other
• CPC Class Codes: H01L 2924/15311 being a ball array, e.g. BGA
• CPC Class Codes: H05K 1/111 Pads for surface mounting, e.g. lay-out

Abstract

An apparatus includes a package substrate for a first SSIT product with a first top die configuration, wherein the package substrate is compatible with a second SSIT product with a second top die configuration, and wherein the first top die configuration is different from the second top die configuration.

Claims

1. An apparatus, comprising:

a package substrate having a top surface and a bottom surface, the bottom surface configured to receive a ball grid array, the package substrate for a first stacked silicon interconnect technology (SSIT) product that comprises one or more top dies mounted on an interposer, the first SSIT product having a first top die configuration, wherein the package substrate includes a plurality of exposed pads disposed on the top surface and uncovered by the interposer, the plurality of exposed pads disposed in an arrangement suitable to receive at least one additional die, the exposed pads not soldered to another structure;

wherein the package substrate is compatible with a second SSIT product with a second top die configuration; and

wherein the first top die configuration is different from the second top die configuration;

wherein the first SSIT product is smaller in size than the second SSIT product; and

the first SSIT product has bumps along a side of the first SSIT product that are a same type as that of bumps at corresponding locations on the second SSIT product, the corresponding locations being away from a side of the second SSIT product.

2. The apparatus of claim 1, wherein the first top die configuration of the first SSIT product is compatible with the second top die configuration of the second SSIT product.

3. The apparatus of claim 1, wherein the first SSIT product has an interposer pattern that is compatible with an interposer pattern of the second SSIT product.

4. The apparatus of claim 1, further comprising the first SSIT product having a C4 bump pattern that is different from that of the second SSIT product.

5. The apparatus of claim 1, wherein the bumps along the side of the first SSIT product disposed between the interposer and the package substrate in an area of an edge the interposer uncovered by the one or more top dies comprise power bumps or ground bumps.

6. The apparatus of claim 1, wherein the first and second SSIT products use common package footprints.

7. The apparatus of claim 1, wherein the package substrate comprises a package lid contact zone, the package lid contact zone disposed on a first side of the package substrate that is larger than a package lid contact zone disposed on a second side of the package substrate.

8. The apparatus of claim 1, wherein the interposer is mounted off center relative to the package substrate.

9. The apparatus of claim 2, wherein the first top die configuration of the first SSIT products matches a subset of the second top die configuration of the second SSIT product.

10. The apparatus of claim 3, wherein the first top die of the first SSIT product has a μ

bump configuration that is a same as that of the second top die of the second SSIT product.

11. The apparatus of claim 3, wherein the interposer pattern of the first SSIT product has a same C4 bump configuration as that of the interposer pattern of the second SSIT product.

12. The apparatus of claim 3, wherein the interposer pattern of the first SSIT product has a C4 bump pattern that is a subset of a C4 bump pattern of the second SSIT.

13. The apparatus of claim 4, wherein:

the first SSIT product comprises dummy bumps along four sides of the first SSIT product.

14. The apparatus of claim 6, wherein the first and second SSIT products have a same type of ball grid array (BGA).

15. The apparatus of claim 6, wherein the first and second SSIT products have compatible I/O and GT channel layouts.

16. An apparatus, comprising:

a package substrate having a top surface and a bottom surface, the bottom surface configured to receive a ball grid array;

at least one die; and

an interposer mounted off center on the top surface of the package substrate and electrically coupling the package substrate to the at least one die, wherein the package substrate includes a plurality of exposed pads uncovered by the interposer, the plurality of exposed pads not soldered to another structure, the plurality of exposed pads disposed in an arrangement suitable to electrically support an alternative interposer and support electrical function of the one die and at least one additional die both mounted on the alternative interposer, the exposed pads arranged to electrically support a ball grid array connection with the at least one additional die when mounted to the alternative interposer.

17. The apparatus of claim 16 further comprising:

a cover mounted to the package substrate, the cover enclosing the at least one die, interposer and exposed pads.

18. The apparatus of claim 16, wherein the package substrate comprises:

a package lid contact zone disposed on a first side of the package substrate that is larger than a package lid contact zone disposed on a second side of the package substrate.

19. The apparatus of claim 16 further comprising:

a C4 bump disposed between the interposer and the package substrate in an area of an edge the interposer uncovered by the at least one die, the C4 bump comprising a power bump or a ground bump.

20. The apparatus of claim 16, wherein the interposer mounted off center relative to the package substrate.