Switched capacitor circuits having level-shifting buffer amplifiers, and associated methods

• US 9,214,912 B2
• Filed: 04/10/2015
• Issued: 12/15/2015
• Est. Priority Date: 10/12/2012
• Status: Active Grant

• Current Assignee: Massachusetts Institute of Technology
• Original Assignee: Massachusetts Institute of Technology
• Inventors: Lee, Hae-Seung
• Primary Examiner(s): JEANGLAUDE, JEAN BRUNER
• Application Number:
  US14/684,023
• Publication Number:
  US 20150222238A1
• Time in Patent Office: 249 Days
• Field of Search: 341/155, 341/161, 341/172, 341/159
• US Class Current: 1/1
• CPC Class Codes: H03F 2200/129 there being a feedback over the complete amplifier
• CPC Class Codes: H03F 2203/45156 At least one capacitor being added at the input of a dif amp
• CPC Class Codes: H03F 3/005 using switched capacitors, e.g. dynamic amplifiers; using switched capacitors as resistors in differential amplifiers H03F3/45 takes precedence
• CPC Class Codes: H03F 3/45179 using MOSFET transistors as the active amplifying circuit H03F3/45278 takes precedence
• CPC Class Codes: H03G 3/008 Control by switched capacitors
• CPC Class Codes: H03M 1/124 Sampling or signal conditioning arrangements specially adapted for A/D converters
• CPC Class Codes: H03M 1/1245 Details of sampling arrangements or methods
• CPC Class Codes: H03M 1/362 the reference values being generated by a resistive voltage divider

Abstract

Switched capacitor circuits and charge transfer methods include a sampling phase and a transfer phase. Circuits and methods are implemented via a plurality of switches, a set of at least two capacitors, at least one buffer amplifier, and an operational amplifier. In one example, during the sampling phase at least one input voltage is sampled, and during the transfer phase at least a first reference voltage provided by the at least one buffer amplifier is subtracted from the at least one input voltage using the operational amplifier. The same set of at least two capacitors may be used in both the sampling phase and the transfer phase.

Claims

1. A switched capacitor circuit operable in a sampling phase and a transfer phase, the switched capacitor circuit comprising:

a plurality of switches;

at least one input capacitor;

an integration capacitor;

at least one buffer amplifier; and

an operational amplifier,

wherein;

during the sampling phase, the plurality of switches are configured to couple a first input voltage to the at least one input capacitor and a second input voltage to the integration capacitor; and

during the transfer phase, the plurality of switches are configured to couple the at least one input capacitor, the integration capacitor, and the at least one buffer amplifier to the operational amplifier to subtract at least a first reference voltage from a sum voltage based on the first input voltage and the second input voltage so as to provide an output voltage from the operational amplifier, wherein an input of the at least one buffer amplifier is electrically coupled to an input terminal of the operational amplifier during the transfer phase.

2. The circuit of claim 1, wherein at least one of respective absolute values and respective polarities of the first input voltage and the second input voltage are different.

3. The circuit of claim 1, wherein the first input voltage and the second input voltage have a substantially same absolute value and a same polarity.

4. The circuit of claim 1, wherein the second input voltage is one of a common mode voltage and ground.

5. The circuit of claim 1, wherein the sum voltage is based on a multiple n of at least the first input voltage, and the multiple n is based on a ratio of a first capacitance value C1 of the at least one input capacitor and a second capacitance value C2 of the integration capacitor.

6. The circuit of claim 1, wherein:

the at least one buffer amplifier includes a first buffer amplifier and a second buffer amplifier;

the first buffer amplifier provides a first offset voltage on which the first reference voltage is based;

the second buffer amplifier provides a second offset voltage on which a second reference voltage is based; and

during the transfer phase, the plurality of switches are configured to couple the at least one input capacitor, the integration capacitor, and one of the first buffer amplifier and the second buffer amplifier to the operational amplifier to subtract a corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier.

7. The circuit of claim 6, wherein the first reference voltage and the second reference voltage have opposite polarities.

8. The circuit of claim 7, wherein the first reference voltage and the second reference voltage have a substantially same absolute value.

9. The circuit of claim 6, further comprising an M-bit flash analog-to-digital converter (ADC) to control at least some of the plurality of switches during the transfer phase, based on the first input voltage, to select the one of the first buffer amplifier and the second buffer amplifier.

10. The circuit of claim 9, wherein:

during the sampling phase, the first input voltage is applied to an input of the N-bit flash ADC to provide an M-bit digital output code from the M-bit flash ADC based at least in part on the first input voltage; and

during the transfer phase, the M-bit digital output code controls the at least some of the plurality of switches to select the one of the first buffer amplifier and the second buffer amplifier.

11. The circuit of claim 10, wherein M=1 and the at least one input capacitor includes only a first input capacitor.

12. The circuit of claim 10, wherein:

M is an integer greater than 1;

the at least one input capacitor includes a plurality of input capacitors;

a number N of the plurality of input capacitors is equal to 2M−

1; and

during the transfer phase, the at least some of the plurality of switches are controlled by the M-bit digital output code of the flash ADC to couple at least one of the plurality of input capacitors, the integration capacitor, and the one of the first buffer amplifier and the second buffer amplifier to the operational amplifier to subtract a fraction of the corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier, wherein the fraction is based at least in part on a digital value of the M-bit digital output code.

13. The circuit of claim 1, further comprising:

at least one second input capacitor;

a second integration capacitor; and

at least one second buffer amplifier,

wherein;

the plurality of switches are operated to configure the operational amplifier in a differential mode;

during the sampling phase, the plurality of switches are further configured to couple an opposite polarity copy of the first input voltage to the at least one second input capacitor; and

during the transfer phase, the plurality of switches are further configured to couple the at least one second input capacitor, the second integration capacitor, and the at least one second buffer amplifier to the operational amplifier to subtract at least the first reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier.

14. The circuit of claim 1, wherein the first reference voltage is based at least in part on a first offset voltage of the at least one buffer amplifier.

15. The circuit of claim 14, wherein the at least one buffer amplifier includes a source follower circuit configuration.

16. The circuit of claim 15, wherein the source follower circuit configuration includes at least one MOS transistor, and wherein the first offset voltage is based at least in part on a gate-source voltage of the at least one MOS transistor.

17. The circuit of claim 16, wherein:

the source follower circuit configuration further includes at least one level-shifting capacitor and at least one level-shifting switch;

during the sampling phase, the at least one level-shifting switch is configured to couple the at least one level-shifting capacitor to a level-shift voltage;

during the transfer phase, the at least one level-shifting switch is configured to couple the at least one level-shifting capacitor to a gate of the at least one MOS transistor; and

the first offset voltage is based at least in part on the gate-source voltage of the at least one MOS transistor and the level shift voltage.

18. The circuit of claim 16, wherein the at least one MOS transistor includes a matched-pair of MOS transistors.

19. The circuit of claim 16, wherein:

the at least one buffer amplifier includes;

a first level-shifting buffer amplifier including a first MOS transistor to provide the first offset voltage on which the first reference voltage is based; and

a second level-shifting buffer amplifier including a second MOS transistor to provide a second offset voltage on which a second reference voltage is based;

during the transfer phase, the plurality of switches are configured to couple the at least one input capacitor, the integration capacitor, and one of the first MOS transistor the second MOS transistor to the operational amplifier to subtract a corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier; and

one of the first MOS transistor and the second MOS transistor is an NMOS transistor and another of the first MOS transistor and the second MOS transistor is a PMOS transistor, such that the first reference voltage and the second reference voltage have opposite polarities.

20. The circuit of claim 19, wherein:

the NMOS transistor is fabricated in a p-type well;

the PMOS transistor is fabricated in an n-type well separate from the p-type well;

a source of the PMOS transistor is electrically coupled to the n-type well; and

a source of the NMOS transistor is electrically coupled to the p-type well.

21. A charge transfer method, comprising:

A) sampling at least one input voltage during a sampling phase; and

B) subtracting, using an operational amplifier, at least a first reference voltage from the at least one input voltage during a transfer phase, the first reference voltage being provided by at least one buffer amplifier,

wherein A) and B) are performed using a same set of at least two capacitors for both the sampling phase and the transfer phase,

wherein the at least one input voltage comprises a first input voltage and a second input voltage, the at least two capacitors include at least one input capacitor and an integration capacitor, and wherein;

A) comprises coupling the first input voltage to the at least one input capacitor and the second input voltage to the integration capacitor; and

B) comprises coupling the at least one input capacitor, the integration capacitor, and the at least one buffer amplifier to the operational amplifier to subtract at least the first reference voltage from a sum voltage based on the first input voltage and the second input voltage so as to provide an output voltage from the operational amplifier.

22. The method of claim 21, wherein at least one of respective absolute values and respective polarities of the first input voltage and the second input voltage are different.

23. The method of claim 21, wherein the first input voltage and the second input voltage have a substantially same absolute value and a same polarity.

24. The method of claim 21, wherein the second input voltage is one of a common mode voltage and ground.

25. The method of claim 21, wherein the sum voltage is based on a multiple n of at least the first input voltage, and the multiple n is based on a ratio of a first capacitance value C1 of the at least one input capacitor and a second capacitance value C2 of the integration capacitor.

26. The method of claim 21, wherein:

the at least one buffer amplifier includes a first buffer amplifier and a second buffer amplifier;

the first buffer amplifier provides a first offset voltage on which the first reference voltage is based;

the second buffer amplifier provides a second offset voltage on which a second reference voltage is based; and

B) comprises coupling the at least one input capacitor, the integration capacitor, and one of the first buffer amplifier and the second buffer amplifier to the operational amplifier to subtract a corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier.

27. The method of claim 26, wherein the first reference voltage and the second reference voltage have opposite polarities.

28. The method of claim 27, wherein the first reference voltage and the second reference voltage have a substantially same absolute value.

29. The method of claim 26, wherein:

A) further comprises coupling the first input voltage to an M-bit flash analog-to-digital converter (ADC) to provide an M-bit digital output code from the M-bit flash ADC based at least in part on the first input voltage; and

B) further comprises select the one of the first buffer amplifier and the second buffer amplifier based at least in part on the M-bit digital output code.

30. The method of claim 29, wherein M=1 and the at least one input capacitor includes only a first input capacitor.

31. The method of claim 29, wherein:

M is an integer greater than 1;

the at least one input capacitor includes a plurality of input capacitors;

a number N of the plurality of input capacitors is equal to 2M−

1; and

B) further comprises coupling, based at least in part on the M-bit digital output code, at least one of the plurality of input capacitors, the integration capacitor, and the one of the first buffer amplifier and the second buffer amplifier to the operational amplifier to subtract a fraction of the corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier, wherein the fraction is based at least in part on a digital value of the M-bit digital output code.

32. The method of claim 21, wherein:

A) further comprises coupling an opposite polarity copy of the first input voltage to at least one second input capacitor; and

B) further comprises coupling the at least one second input capacitor, a second integration capacitor, and at least one second buffer amplifier to the operational amplifier to subtract at least the first reference voltage from the sum voltage based on the first input voltage and the second input voltage so as to provide the output voltage from the operational amplifier.

33. The method of claim 21, wherein the first reference voltage is based at least in part on a first offset voltage of the at least one buffer amplifier.

34. The method of claim 33, wherein the at least one buffer amplifier includes a source follower circuit configuration.

35. The method of claim 34, wherein the source follower circuit configuration includes at least one MOS transistor, and wherein the first offset voltage is based at least in part on a gate-source voltage of the at least one MOS transistor.

36. The method of claim 35, wherein:

the source follower circuit configuration further includes at least one level-shifting capacitor;

A) further comprises coupling the at least one level-shifting capacitor to a level-shift voltage;

B) further comprises coupling the at least one level-shifting capacitor to a gate of the at least one MOS transistor; and

the first offset voltage is based at least in part on the gate-source voltage of the at least one MOS transistor and the level shift voltage.

37. The method of claim 35, wherein the at least one MOS transistor includes a matched-pair of MOS transistors.

38. The method of claim 35, wherein:

the at least one buffer amplifier includes;

a first level-shifting buffer amplifier including a first MOS transistor to provide the first offset voltage on which the first reference voltage is based; and

a second level-shifting buffer amplifier including a second MOS transistor to provide a second offset voltage on which a second reference voltage is based;

B) comprises coupling the at least one input capacitor, the integration capacitor, and one of the first MOS transistor the second MOS transistor to the operational amplifier to subtract a corresponding one of the first reference voltage and the second reference voltage from the sum voltage so as to provide the output voltage from the operational amplifier; and

one of the first MOS transistor and the second MOS transistor is an NMOS transistor and another of the first MOS transistor and the second MOS transistor is a PMOS transistor, such that the first reference voltage and the second reference voltage have opposite polarities.

39. The method of claim 38, wherein:

the NMOS transistor is fabricated in a p-type well;

the PMOS transistor is fabricated in an n-type well separate from the p-type well;

a source of the PMOS transistor is electrically coupled to the n-type well; and

a source of the NMOS transistor is electrically coupled to the p-type well.

40. A stage of a pipeline or algorithmic analog-to-digital converter, the stage comprising:

a plurality of switches;

at least one input capacitor;

an integration capacitor;

a first buffer amplifier to provide a first offset voltage on which a first reference voltage is based;

a second buffer amplifier to provide a second offset voltage on which a second reference voltage is based;

an M-bit flash analog-to-digital converter to control at least some of the plurality of switches during the transfer phase; and

an operational amplifier,

wherein;

a number N of the at least one input capacitor is equal to 2M−

1;

during the sampling phase;

1) the plurality of switches are configured to couple a first input voltage to the at least one input capacitor and a second input voltage to the integration capacitor; and

2) the first input voltage is applied to an input of the M-bit flash ADC to provide an M-bit digital output code from the M-bit flash ADC based at least in part on the first input voltage; and

during the transfer phase;

1) the plurality of switches are configured to couple at least one of the at least one input capacitor, and to couple the integration capacitor and one of the first buffer amplifier and the second buffer amplifier, to the operational amplifier to subtract a fraction of a corresponding one of the first reference voltage and the second reference voltage from a sum voltage based on the first input voltage and the second input voltage so as to provide an output voltage from the operational amplifier, wherein the fraction is based at least in part on a digital value of the M-bit digital output code; and

2) the M-bit digital output code from the M-bit flash ADC controls at least some of the plurality of switches to select the one of the first buffer amplifier and the second buffer amplifier.

41. The stage of claim 40, wherein at least one of respective absolute values and respective polarities of the first input voltage and the second input voltage are different.

42. The stage of claim 40, wherein the first input voltage and the second input voltage have a substantially same absolute value and a same polarity.

43. The stage of claim 40, wherein the second input voltage is one of a common mode voltage and ground.

44. The stage of claim 40, wherein the sum voltage is based on a multiple n of at least the first input voltage, and the multiple n is based on a ratio of a first capacitance value C1 of the at least one input capacitor and a second capacitance value C2 of the integration capacitor.