Terahertz scanning reflectometer

• US 9,239,290 B2
• Filed: 12/30/2013
• Issued: 01/19/2016
• Est. Priority Date: 10/15/2003
• Status: Expired due to Fees

• Current Assignee: Applied Research And Photonics, Inc.
• Original Assignee: Applied Research And Photonics, Inc.
• Inventors: Rahman, Anis, Rahman, Aunik K.
• Primary Examiner(s): PEACE, RHONDA S
• Application Number:
  US14/144,155
• Publication Number:
  US 20140103215A1
• Time in Patent Office: 750 Days
• US Class Current: 1/1
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3586 by Terahertz time domain spectroscopy [THz-TDS]
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G02F 1/353 Frequency conversion, i.e. wherein a light beam is generated with frequency components different from those of the incident light beams
• CPC Class Codes: G02F 1/3558 Poled materials, e.g. with periodic poling; Fabrication of domain inverted structures, e.g. for quasi-phase-matching [QPM]
• CPC Class Codes: G02F 1/361 Organic materials
• CPC Class Codes: G02F 1/365 in an optical waveguide structure G02F1/377, G02F1/395 take precedence
• CPC Class Codes: G02F 2203/13 involving THZ radiation

Abstract

A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.

Claims

1. A terahertz scanning reflectometer for diagnosing a disease condition of a sample, comprising:

a continuous wave terahertz system configured to focus terahertz radiation at a surface of the sample; and

a motion controller configured to move a platform holding the sample,

wherein on a condition that the motion controller adjusts a location of a focal point inside the sample, a reflectance measurement is performed across a thickness of the sample using a detector configured to receive sample reflected beam, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.

2. The terahertz scanning reflectometer of claim 1, wherein the spectrum is used to generate a sample image at the focal point.

3. The terahertz scanning reflectometer of claim 1, wherein the focal point is moved in multiple dimensions to generate at least one of surface or internal sample images.

4. A method for diagnosing a disease condition of a sample using terahertz scanning reflectometer, comprising:

directing a continuous wave terahertz radiation at a surface of the sample;

moving a platform holding the sample;

adjusting a location of a focal point inside the sample; and

making a reflectance measurement across a thickness of the sample using a detector configured to receive a sample reflected beam, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.

5. The method of claim 4, further comprising:

generating a sample image at the focal point using the spectrum.

6. The method of claim 4, further comprising:

moving the focal point in multiple dimensions to generate at least one of surface or internal sample images.