Optomechanical sensor for accelerometry and gyroscopy
First Claim
1. A micro-electromechanical system (MEMS) apparatus, comprising:
- a laser arrangement configured to generate a light beam having a resonant wavelength;
a waveguide configured to receive and output the light beam; and
an optical resonator comprising a deformable closed loop and optically coupled to the waveguide to receive a portion of the light beam, wherein the deformable closed loop defines a radial plane in which the deformable closed loop is disposed,wherein the deformable closed loop is to deform in response to an application of inertial force to the deformable closed loop, substantially parallel to the radial plane of the deformable closed loop, wherein a deformation of the deformable closed loop occurs in the radial plane of the deformable loop and results in a change of a length of the deformable closed loop and corresponding change of an optical path length of a portion of the light beam traveling through the deformable closed loop, to cause a change in the resonant wavelength of the light beam outputted by the waveguide.
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Accused Products
Abstract
Embodiments of the present disclosure are directed towards techniques and configurations for a MEMS device configured to determine inertial change applied to the device. In one instance, the device may comprise a laser arrangement configured to generate a light beam having a resonant wavelength, a waveguide configured to receive and output the light beam, and an optical resonator comprising a deformable closed loop and optically coupled to the waveguide to receive a portion of the light beam. A deformation of the optical resonator may result in a change of an optical path length of a portion of the light beam traveling through the optical resonator, causing a change in the resonant wavelength of the light beam outputted by the waveguide. Other embodiments may be described and/or claimed.
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Citations
17 Claims
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1. A micro-electromechanical system (MEMS) apparatus, comprising:
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a laser arrangement configured to generate a light beam having a resonant wavelength; a waveguide configured to receive and output the light beam; and an optical resonator comprising a deformable closed loop and optically coupled to the waveguide to receive a portion of the light beam, wherein the deformable closed loop defines a radial plane in which the deformable closed loop is disposed, wherein the deformable closed loop is to deform in response to an application of inertial force to the deformable closed loop, substantially parallel to the radial plane of the deformable closed loop, wherein a deformation of the deformable closed loop occurs in the radial plane of the deformable loop and results in a change of a length of the deformable closed loop and corresponding change of an optical path length of a portion of the light beam traveling through the deformable closed loop, to cause a change in the resonant wavelength of the light beam outputted by the waveguide. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method, comprising:
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detecting a change in light intensity of light outputted by a waveguide of a micro-electromechanical system (MEMS) apparatus that includes an optical resonator comprising a deformable closed loop and optically coupled to the waveguide, the deformable closed loop defining a radial plane in which the deformable closed loop is disposed, wherein the change in light intensity corresponds to a change of a resonant wavelength of the light outputted by the waveguide, wherein the change of a resonant wavelength is caused by a change of an optical path length of light traveling through the optical resonator in response to deforming the deformable closed loop in the radial plane of the deformable closed loop, as a result of applying inertial force to the deformable closed loop, substantially parallel to the radial plane of the deformable closed loop; and determining an inertial change associated with the MEMS apparatus based on the detected change in light intensity, wherein the inertial change corresponds to an external acceleration applied to the MEMS apparatus, wherein the external acceleration is caused by the inertial force. - View Dependent Claims (15, 16, 17)
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Specification