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Amperage/voltage loop calibrator with loop diagnostics

  • US 9,244,111 B2
  • Filed: 07/23/2007
  • Issued: 01/26/2016
  • Est. Priority Date: 10/17/2003
  • Status: Active Grant
First Claim
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1. A testing device for providing diagnostics of a device under test, comprising:

  • a processing unit;

    said processing unit including a processor, a digital-to-analog converter, and an analog-to digital converter;

    a plurality of ports to provide an electrical communication interface for said processing unit;

    said plurality of ports including,a first port to provide an electrical communication interface for said processing unit,a second port to provide an electrical communication interface for said processing unit,a third port to provide an electrical communication interface for said processing unit, anda fourth port to provide an electrical communication interface for said processing unit;

    a set of wires, each wire being connected to a port of said plurality of ports and to the device under test; and

    port control circuitry operatively connected to said plurality of ports, said processor, said digital-to-analog converter, and said analog-to-digital converter;

    said processor outputting digital test signals to said digital-to-analog converter and configuration control signals to said port control circuitry;

    said port control circuitry, in response to the received configuration control signals, configuring a connection scheme between said processing unit and said plurality of ports to provide test paths for test signals to be transmitted from said digital-to-analog converter to the device under test;

    said port control circuitry, in response to the received configuration control signals, configuring the connection scheme between said processing unit and said plurality of ports to provide return paths for return signals from the device under test to said analog-to-digital converter, said return signals corresponding to the test signals transmitted from said digital-to-analog converter to the device under test, said return paths enabling said processing unit to measure the return signals, corresponding to the test signals transmitted from said digital-to-analog converter to the device under test;

    said processing unit measuring said return signals;

    said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if two wires are connected to said plurality of ports;

    said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if three wires are connected to said plurality of ports;

    said processing unit, based upon the connection scheme of said port control circuitry and the measured return signals, determining if four wires are connected to said plurality of ports.

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