Systems and methods for implementing S/SSTDR measurements
First Claim
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1. A method for testing a device in its operating environment, the method comprising:
- forming, by a testing device, a spread spectrum time domain reflectometry (S/SSTDR) signal;
transmitting the formed signal to an electronic circuit in its operating environment which is communicatively connected to the testing device;
receiving one or more reflections of the S/SSTDR signal at the testing device; and
receiving one or more reflections from a choke or other known impedance within the electronic circuit; and
processing the received S/SSTDR signal utilizing the one or more reflections from said choke or other known impedance as a reference signal to determine an electrical property of at least one component residing in the electronic circuit, wherein the electrical property is at least one of resistance, inductance and capacitance.
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Abstract
Systems and methods which utilize spread spectrum sensing on live circuits to obtain information regarding a circuit under test are provided. In some embodiments S/SSTDR testing may be utilized to obtain R, L, C and Z measurements from circuit components. In yet further embodiments, these measurements may be utilized to monitor the output of sensors on a circuit.
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Citations
18 Claims
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1. A method for testing a device in its operating environment, the method comprising:
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forming, by a testing device, a spread spectrum time domain reflectometry (S/SSTDR) signal; transmitting the formed signal to an electronic circuit in its operating environment which is communicatively connected to the testing device; receiving one or more reflections of the S/SSTDR signal at the testing device; and receiving one or more reflections from a choke or other known impedance within the electronic circuit; and processing the received S/SSTDR signal utilizing the one or more reflections from said choke or other known impedance as a reference signal to determine an electrical property of at least one component residing in the electronic circuit, wherein the electrical property is at least one of resistance, inductance and capacitance. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An apparatus comprising:
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at least one processing device configured to; form a spread spectrum time domain reflectometry (S/SSTDR) signal; transmit the formed signal to an electronic circuit in its operating environment which is communicatively connected to the testing device; receive one or more reflections of the S/SSTDR signal at the at least one processing device; receive one or more reflections from a choke within the electronic circuit; and process the received S/SSTDR signal utilizing the one or more reflections from said choke as a reference signal to determine an electrical property of at least one component residing in the electronic circuit, wherein the electrical property is at least one of resistance, inductance, capacitance, impedance and location of the at least one component. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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Specification