Laser projection system using variable part alignment

• US 9,245,062 B2
• Filed: 12/19/2012
• Issued: 01/26/2016
• Est. Priority Date: 03/22/2012
• Status: Active Grant

• Current Assignee: AGV Technology Canada, ULC
• Original Assignee: Virtek Vision International Inc. (Lectra SA)
• Inventors: Rueb, Kurt D.
• Primary Examiner(s): Bahta, Kidest
• Application Number:
  US13/719,382
• Publication Number:
  US 20130253682A1
• Time in Patent Office: 1,133 Days
• Field of Search: 700/98, 356/614, 250/4
• US Class Current: 1/1
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01B 11/2545 with one projection direction and several detection directions, e.g. stereo
• CPC Class Codes: G01B 5/004 for measuring coordinates of points
• CPC Class Codes: G01C 11/00 Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
• CPC Class Codes: G01C 15/002 Active optical surveying means optical plumbing G01C15/105
• CPC Class Codes: G06F 30/00 Computer-aided design [CAD]

Abstract

A method of projecting a template on a workpiece provides a measurement system for determining a location of a workpiece and a laser projector for projecting a laser template. A feature on the workpiece having geometric significance is identified. A physical location of the feature in a three dimensional coordinate system is determined and compared to a theoretical location of the feature on computer model of the workpiece. A template correlated to the feature is selected. The projection of the template onto the workpiece relative to the feature is optimized by correlating alignment of the physical location of the feature with the computer model of the feature. The template is projected onto the workpiece based upon the optimized projection for directing work to be performed on the workpiece.

Claims

1. A method of projecting a template on a workpiece;

comprising the steps of;

providing a measurement device for determining a location of a workpiece in a three dimensional coordinate system and a laser projector for projecting a laser beam for generating a laser template on the workpiece;

identifying a feature on the workpiece having geometric significance for accurate manufacturing of the workpiece;

using said measurement device for determining a physical location of the feature in a three dimensional coordinate system and measuring an offset between the physical location of the feature in the three dimensional coordinate system from a theoretical location of the feature of a computer model of the workpiece;

using a computer for aligning the physical location of the feature as identified by said measurement device with the theoretical location of the feature from the computer model and determining an optimized location for projection of the laser template onto the workpiece by said laser projector by tracing the path of the laser beam through pattern coordinates transformed by the measured offset; and

projecting the template onto the workpiece based upon the optimized location for directing work to be performed on the workpiece.

2. The method set forth in claim 1, wherein said step of optimizing the projection of the template onto the workpiece is further defined by identifying a physical location of a surface of the workpiece onto which the template is projected and optimizing projection of the template onto the physical location of the surface.

3. The method set forth in claim 1, wherein said step of providing a measurement device is further defined by providing a photogrammetry system.

4. The method set forth in claim 3, wherein step of providing a photogrammetry systems is further defined by providing at least one camera capable of detecting light conveyed from the workpiece.

5. The method set forth in claim 1, wherein said step of optimizing the projection of the template onto the workpiece is further defined by correlating the computer model to a second feature on the workpiece and optimizing the projection by aligning the feature and the second feature to the computer model.

6. The method set forth in claim 5, wherein said step of optimizing the projection by aligning the feature and the second feature to the computer model is further defined by assigning a hierarchy of importance to the feature and the second feature and optimizing the projection relative to the hierarchy.

7. The method set forth in claim 5, wherein said step of optimizing the projection by aligning the feature and the second feature to the computer model is further defined by assigning weighted values to the feature and the second feature corresponding to the template being projected by the laser projector.

8. The method set forth in claim 1, further including the step of correlating the measurement device and the laser projector in a common three dimensional coordinate system.

9. The method set forth in claim 1, wherein said step of determining a physical location of the feature in a three dimensional coordinate system is further defined by associating a reflective element to the feature for reflecting light to the measurement device.

10. The method set forth in claim 9, wherein the reflective element is further defined as being associated with a locating probe and the locating probe is distinguishable by an orientation of a plurality of the reflective elements on the locating probe.

11. The method set forth in claim 9, further including the step of projecting an image onto the workpiece at the physical location of the feature defined by associating the reflective element with feature.

12. The method set forth in claim 2, wherein said step of identifying a physical location of a surface of the workpiece onto which the template is projected is further defined by associating a reflective element to the feature for reflecting light to the measurement device.

13. The method set forth in claim 1, wherein said step of identifying a feature on the workpiece having geometric significance is further defined by identifying an edge or inside surface of an aperture defined by the workpiece.

14. The method set forth in claim 1, wherein said step of identifying a feature on the workpiece having geometric significance is further defined by identifying a transition between adjacent surfaces.

15. The method set forth in claim 1, wherein said step of identifying a feature on the workpiece having geometric significance is further defined by identifying the feature on the workpiece by projecting a laser image onto the feature.

16. The method set forth in claim 1, further including the step of the measurement device monitoring the location of the workpiece for drift from an original location of the workpiece and correcting the projecting of the laser template based upon the monitored location of the workpiece.

17. The method set forth in claim 1, further including the step of projecting a laser image onto the workpiece correlating the theoretic location of the feature defined by the computer model to the physical location of the feature on the workpiece.

18. The method set forth in claim 1, further including the step of projecting real time laser images onto the workpiece associated with the feature being measured.

19. The method set forth in claim 1, further including the step of projecting a laser image identifying previously obtained measurements.

20. The method as set forth in claim 1, further including the step of the measurement device scanning laser projections for correcting prior measurements of the feature.

21. The method set forth in claim 1, further including the step of selecting a second laser template and identifying an alternative feature on the workpiece having geometric significance to the second laser template for locating and projecting the second laser template.

22. The method set forth in claim 1, further including the steps of selecting a plurality of features on the workpiece having geometric significance, assigning a weight to constraints associated with degrees of freedom of each feature, and evaluating an optimal location for the template based upon the measured position of the features and the assigned weights of the associated constraints.