Methods and systems for chemical composition measurement and monitoring using a rotating filter spectrometer
First Claim
1. A spectroscopic system for detecting electromagnetic radiation that has passed through or is reflected from a sample, the system comprising:
- an electromagnetic radiation source;
a rotatable filter assembly configured to filter a beam of electromagnetic radiation produced by the electromagnetic radiation source;
a position detector configured to detect a position of the rotatable filter assembly; and
an electromagnetic radiation detector configured to detect electromagnetic radiation that has passed through or is reflected from a sample, wherein the rotatable filter assembly is configured to rotate about an axis non-perpendicular to a path of the beam of electromagnetic radiation, where an angle between the axis of rotation of the rotatable filter assembly and the path of the beam of electromagnetic radiation is in a range from 60 degrees to 89.99 degrees.
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Abstract
The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e.g., a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.
28 Citations
28 Claims
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1. A spectroscopic system for detecting electromagnetic radiation that has passed through or is reflected from a sample, the system comprising:
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an electromagnetic radiation source; a rotatable filter assembly configured to filter a beam of electromagnetic radiation produced by the electromagnetic radiation source; a position detector configured to detect a position of the rotatable filter assembly; and an electromagnetic radiation detector configured to detect electromagnetic radiation that has passed through or is reflected from a sample, wherein the rotatable filter assembly is configured to rotate about an axis non-perpendicular to a path of the beam of electromagnetic radiation, where an angle between the axis of rotation of the rotatable filter assembly and the path of the beam of electromagnetic radiation is in a range from 60 degrees to 89.99 degrees. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A spectroscopic method for detecting electromagnetic radiation that has passed through or is reflected from a sample, the method comprising:
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filtering a beam of electromagnetic radiation produced by an electromagnetic radiation source with a rotatable filter assembly; detecting an angular position of the rotatable filter assembly with a position detector having at least one component rigidly coupled to the rotatable filter assembly; intercepting the beam of electromagnetic radiation with a sample; detecting the beam of electromagnetic radiation with an electromagnetic radiation detector; and processing a spectral data signal from the electromagnetic radiation detector to produce chemical information about the sample, wherein the rotatable filter assembly is configured to rotate about an axis non-perpendicular to a path of the beam of electromagnetic radiation, where an angle between the axis of rotation of the rotatable filter assembly and the path of the beam of electromagnetic radiation is in a range from 60 degrees to 89.99 degrees. - View Dependent Claims (26, 27, 28)
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Specification