System and method for adjusting trip points within a storage device

• US 9,263,156 B2
• Filed: 12/19/2013
• Issued: 02/16/2016
• Est. Priority Date: 11/07/2013
• Status: Active Grant

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: SanDisk Enterprise IP LLC (Western Digital Corporation)
• Inventors: Delpapa, Kenneth B., Lucas, Gregg S., Ellis, Robert W.
• Primary Examiner(s): Rizk, Sam
• Application Number:
  US14/135,433
• Publication Number:
  US 20150127999A1
• Time in Patent Office: 789 Days
• US Class Current: 1/1
• CPC Class Codes: G06F 1/28 Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
• CPC Class Codes: G11C 2029/5004 Voltage
• CPC Class Codes: G11C 29/50004 of threshold voltage
• CPC Class Codes: G11C 5/143 Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels G11C5/148 takes precedence; Switching between alternative supplies G11C5/141 takes precedence

Abstract

The embodiments described herein include a method and device for adjusting trip points within a storage device. The method includes: obtaining one or more configuration parameters; and based on the one or more configuration parameters, determining a trip voltage. The method also includes comparing the trip voltage with an input voltage. The method further includes triggering a power fail condition in accordance with a determination that the input voltage is less than the trip voltage.

Claims

1. A method of triggering a power fail condition in a storage device operatively coupled with a host system, comprising:

within the storage device;

obtaining one or more configuration parameters, the one or more configuration parameters including an indication of a default input voltage;

accessing a table of predefined trip voltages;

based on the one or more configuration parameters and the table of predefined trip voltages, determining a first trip voltage;

comparing the first trip voltage with an input voltage; and

in accordance with a determination that the input voltage is less than the first trip voltage, triggering the power fail condition.

2. The method of claim 1, wherein the input voltage is a supply voltage provided by the host system, the method further comprising:

comparing a second trip voltage to a serial presence detect (SPD) voltage provided by the host system, wherein the SPD voltage is distinct from the supply voltage provided by the host system; and

in accordance with a determination that the SPD voltage is less than the second trip voltage, triggering the power fail condition.

3. The method of claim 2, wherein comparing the second trip voltage to the SPD voltage provided by the host system includes comparing a voltage-supply independent voltage with a voltage derived from the SPD voltage.

4. The method of claim 1, wherein the one or more configuration parameters include configuration information of the storage device.

5. The method of claim 1, wherein information identifying the default input voltage is obtained from the host system.

6. The method of claim 1, further comprising:

sampling the input voltage to determine the default input voltage.

7. The method of claim 1, further comprising:

based on the one or more configuration parameters, modifying one or more timing parameters associated with a communication bus that operatively couples the storage device and the host system.

8. The method of claim 1, wherein determining the first trip voltage includes:

selecting one of a plurality of predefined trip voltages from the table of predefined trip voltage as the first trip voltage based on the one or more configuration parameters.

9. The method of claim 1, further comprising:

in response to a modification command from the host system, modifying a predefined trip voltage within the table of predefined trip voltages.

10. The method of claim 1, further comprising:

prior to the comparing, conditioning the first trip voltage including;

buffering the first trip voltage; and

after the buffering, level shifting and scaling the first trip voltage.

11. The method of claim 1, further comprising:

prior to the comparing, conditioning the input voltage including;

scaling the input voltage; and

filtering the input voltage.

12. The method of claim 1, further comprising:

providing hysteresis with respect to subsequent comparisons using feedback of the comparison of the first trip voltage with the input voltage.

13. The method of claim 1, further comprising:

latching the power fail condition.

14. The method of claim 13, further comprising:

after latching the power fail condition and completion of a power fail process, clearing the latched power fail condition.

15. The method of claim 1, further comprising:

triggering the power fail condition in accordance with a condition determined by execution of one or more procedures by a controller within the storage device.

16. A storage device, comprising:

an interface for operatively coupling the storage device with a host system;

a supervisory controller with one or more processors and memory;

a power fail module for detecting a power fail condition; and

a plurality of controllers for managing one or more non-volatile memory devices, the storage device configured to;

obtain one or more configuration parameters, the one or more configuration parameters including an indication of a default input voltage;

access a table of predefined trip voltages;

based on the one or more configuration parameters and the table of predefined trip voltages, determine a first trip voltage;

compare the first trip voltage with an input voltage; and

in accordance with a determination that the input voltage is less than the first trip voltage, trigger the power fail condition.

17. The storage device of claim 16, wherein the input voltage is a supply voltage provided by the host system, and the storage device is further configured to:

compare a second trip voltage to a serial presence detect (SPD) voltage provided by the host system, wherein the SPD voltage is distinct from the supply voltage provided by the host system

in accordance with a determination that the SPD voltage is less than the second trip voltage, trigger the power fail condition.

18. The storage device of claim 17, wherein comparing the second trip voltage to the SPD voltage provided by the host system includes comparing a voltage-supply independent voltage with a voltage derived from the SPD voltage.

19. The storage device of claim 16, wherein the one or more configuration parameters include configuration information of the storage device.

20. A non-transitory computer readable storage medium, storing one or more programs for execution by one or more processors of a storage device, the one or more programs including instructions that when executed by the one or more processors cause the storage device to:

obtain one or more configuration parameters, the one or more configuration parameters including an indication of a default input voltage;

access a table of predefined trip voltages;

based on the one or more configuration parameters and the table of predefined trip voltages, determine a first trip voltage;

compare the first trip voltage with an input voltage; and

in accordance with a determination that the input voltage is less than the first trip voltage, trigger the power fail condition.

21. The non-transitory computer readable storage medium of claim 20, wherein the input voltage is a supply voltage provided by the host system, and the one or more programs further include instructions, that when executed by the one or more processors cause the storage device to:

compare a second trip voltage to a serial presence detect (SPD) voltage provided by the host system, wherein the SPD voltage is distinct from the supply voltage provided by the host system; and

in accordance with a determination that the SPD voltage is less than the second trip voltage, trigger the power fail condition.

22. The non-transitory computer readable storage medium of claim 21, wherein comparing the second trip voltage to the SPD voltage provided by the host system includes comparing a voltage-supply independent voltage with a voltage derived from the SPD voltage.

23. The non-transitory computer readable storage medium of claim 20, wherein the one or more configuration parameters include configuration information of the storage device.