Quasi iso-gain supply voltage function for envelope tracking systems
First Claim
1. A method of defining a quasi iso-gain supply voltage function for an envelope tracking system comprising:
- capturing into a memory array iso-gain supply voltage values versus output power values and input power values over a predetermined input power range for a device under test (DUT);
locating a minimum iso-gain supply voltage value within the memory array;
replacing the iso-gain supply voltage values within the memory array with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value;
generating a look-up table (LUT) of iso-gain supply voltage values as a function of input power values from the iso-gain supply voltage values and input power values captured in the memory array; and
writing the LUT to a tangible computer-readable medium.
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Abstract
A method of defining a quasi iso-gain supply voltage function for an envelope tracking system is disclosed. The method includes a step of capturing iso-gain supply voltage values versus power values for a device under test (DUT). Other steps involve locating a minimum iso-gain supply voltage value, and then replacing the iso-gain supply voltage values with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value. The method further includes a step of generating a look-up table (LUT) of iso-gain supply voltage values as a function of input power for the DUT after the step of replacing the iso-gain supply voltage values with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value.
378 Citations
19 Claims
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1. A method of defining a quasi iso-gain supply voltage function for an envelope tracking system comprising:
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capturing into a memory array iso-gain supply voltage values versus output power values and input power values over a predetermined input power range for a device under test (DUT); locating a minimum iso-gain supply voltage value within the memory array; replacing the iso-gain supply voltage values within the memory array with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value; generating a look-up table (LUT) of iso-gain supply voltage values as a function of input power values from the iso-gain supply voltage values and input power values captured in the memory array; and writing the LUT to a tangible computer-readable medium. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An automated test system (ATS) of defining a quasi iso-gain supply voltage function for an envelope tracking system comprising:
a system controller programmed to execute steps comprising; capturing into a memory array iso-gain supply voltage values versus output power values and input power values over a predetermined input power range for a device under test (DUT); locating a minimum iso-gain supply voltage value within the memory array; replacing the iso-gain supply voltage values within the memory array with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value; generating a look-up table (LUT) of iso-gain supply voltage values as a function of input power values from the iso-gain supply voltage values and input power values captured in the memory array; and writing the LUT to a tangible computer-readable medium. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A tangible computer-readable medium having computer instructions stored thereon, wherein the computer instructions are readable by a computing device of an automated test system (ATS) to perform operations for defining a quasi iso-gain supply voltage function for an envelope tracking system, the operations comprising:
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capturing into a memory array iso-gain supply voltage values versus output power values and input power values over a predetermined input power range for a device under test (DUT); locating a minimum iso-gain supply voltage value within the memory array within the predetermined input power range; replacing the iso-gain supply voltage values within the memory array with the minimum iso-gain supply voltage value for corresponding output power values that are less than an output power value corresponding to the minimum iso-gain supply voltage value; generating a look-up table (LUT) of iso-gain supply voltage values as a function of input power values from the iso-gain supply voltage values and input power values captured in the memory array; and writing the LUT to a tangible computer-readable medium. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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Specification