System and method for making concentration measurements within a sample material using orbital angular momentum
First Claim
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1. An apparatus that measures a concentration of a material within a sample, comprising:
- signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applying the first signal to the sample;
a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample.
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Abstract
Signal generation circuitry generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector for receives the first signal after it passes through the sample and determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample.
51 Citations
30 Claims
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1. An apparatus that measures a concentration of a material within a sample, comprising:
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signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applying the first signal to the sample; a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. An apparatus that measures a concentration of a material within a sample, comprising:
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an emitting source that emits a first light beam comprising a plurality of plane waves; orbital angular momentum generation circuitry that receives the first light beam and that applies at least one orbital angular momentum to the plurality of plane waves of the first light beam; amplifying circuitry that receives the first light beam after the first light beam passes through the sample and that amplifies a first portion of the first light beam having a predetermined value of the orbital angular momentum associated therewith; a detector that receives the first light beam after the first light beam passes through the sample and that determines the concentration of the material within the sample based on a detected value of orbital angular momentum within the amplified portion of the light beam having the predetermined value of the orbital angular momentum associated therewith. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A method for measuring a concentration of a material within a sample, comprising:
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generating a first signal having at least one orbital angular momentum applied thereto; applying the first signal to the sample; receiving the first signal after the first signal passes through the sample; detecting a value of the orbital angular momentum within the received first signal; and determining the concentration of the material within the sample based on the detected value of orbital angular momentum with the first signal received from the sample. - View Dependent Claims (26, 27, 28, 29, 30)
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Specification