Backscattering interferometric methods

• US 9,273,949 B2
• Filed: 05/13/2013
• Issued: 03/01/2016
• Est. Priority Date: 05/11/2012
• Status: Active Grant

• Current Assignee: Vanderbilt University
• Original Assignee: Vanderbilt University
• Inventors: Bornhop, Darryl J., Mousa, Mina, Kussrow, Amanda
• Primary Examiner(s): Chowdhury, Tarifur
• Assistant Examiner(s): Cook, Jonathon
• Application Number:
  US13/892,642
• Publication Number:
  US 20130301055A1
• Time in Patent Office: 1,023 Days
• Field of Search: 356/450
• US Class Current: 1/1
• CPC Class Codes: G01B 9/02041 characterised by particular imaging or detection techniques
• CPC Class Codes: G01N 2021/4709 Backscatter
• CPC Class Codes: G01N 21/00 Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light G01N3/00 - G01N19/00 take precedence
• CPC Class Codes: G01N 21/45 using interferometric methods; using Schlieren methods

Abstract

Disclosed are improved optical detection methods comprising multiplexed interferometric detection systems and methods for determining a characteristic property of a sample, together with various applications of the disclosed techniques.

Claims

1. A method for determining a characteristic property of a sample comprising the steps of:

(a) providing a substrate having a channel formed therein for reception of a sample to be analyzed;

(b) introducing a sample to be analyzed into the channel;

(c) directing a light beam from a light source onto the substrate such that the light beam is incident on at least a portion of the sample to generate scattered light through reflective and refractive interaction of the light beam with a substrate/channel interface, and the sample, wherein the scattered light comprising interference fringe patterns including a plurality of spaced light bands whose positions change in position or intensity in response to changes in the refractive index of the sample;

(d) detecting positional shifts and/or intensity changes in fringe patterns positioned on opposing sides of a centroid; and

(e) determining the characteristic property of the sample from the positional shifts of the fringe patterns.

2. The method of claim 1, wherein interrogating comprises detecting backscattered light on the photodetector, and wherein the scattered light comprises a plurality of interference fringe patterns.

3. The method of claim 1, wherein the light source comprises a HeNe laser or a diode laser.

4. The method of claim 1, wherein at least one of the channel, light beam, detector, or a combination thereof is aligned so as to produce sister fringes having at least one of a similar base width, similar intensity, similar shape, or a combination thereof.

5. The method of claim 1, wherein at least one of the channel, light beam, detector, or a combination thereof is aligned so as to produce sister fringes having a similar base width, similar intensity, and similar shape.

6. The method of claim 1, wherein the sample is non-aqueous.

7. An interferometric detection system comprising:

(a) a substrate;

(b) a channel formed in the substrate for reception of a sample to be analyzed;

(c) a light source for generating a light beam, the light source being positioned to direct the light beam onto the substrate such that the light beam is incident on at least a portion of the channel, to thereby generate scattered light through reflective and refractive interaction of the light beam with a substrate/channel interface and the sample, the scattered light comprising interference fringe patterns including a plurality of spaced light bands whose positions shift in response to changes in the refractive index of the sample;

(d) a first photodetector for receiving scattered light from a fringe pattern disposed on one side of a centroid, and generating a plurality of intensity signals;

(e) a second photodetector for receiving scattered light from a fringe pattern disposed on the opposing side of the centroid, and generating a plurality of intensity signals; and

(f) at least one signal analyzer for receiving the intensity signals and determining therefrom one or more characteristic properties of the sample at one or more of the discrete zones along the length of the channel.

8. The interferometric detection system of claim 7, wherein the scattered light comprises backscattered light.

9. The interferometric detection system of claim 7, wherein the substrate and channel together comprise a microfluidic device.

10. The interferometric detection system of claim 7, wherein the light source comprises a laser or a diode.

11. An apparatus adapted for light scattering interferometry, the apparatus comprising:

(a) a substrate;

(b) a channel formed in the substrate capable of receiving a sample to be analyzed;

(c) a light source for generating a light beam capable of being directed onto the substrate such that the light beam is incident on the channel and thereby generates scattered light comprising interference fringe patterns;

(d) a photodetector for receiving scattered light from two sister fringe patterns disposed on opposing sides of a centroid and generating a plurality of intensity signals;

(e) two mirrors and/or lenses adapted and positioned to direct the scattered light from two sister fringe patterns disposed on opposing sides of the centroid onto the photodetector; and

(f) at least one signal analyzer capable of receiving the intensity signals and determining therefrom one or more characteristic properties of the sample.

12. The apparatus of claim 11, further comprising an absorber positioned between the channel and the photodetector to block the centroid.

13. The apparatus of claim 11, wherein the light source comprises a HeNe laser or a diode laser.

14. A method for determining a characteristic property of a sample comprising the steps of:

(a) providing a substrate having a channel formed therein for reception of a sample to be analyzed;

(b) introducing a sample to be analyzed into the channel;

(c) directing a light beam from a light source onto the substrate such that the light beam is incident on at least a portion of the sample to generate scattered light through reflective and refractive interaction of the light beam with a substrate/channel interface, and the sample, wherein the scattered light comprising interference fringe patterns including a plurality of spaced light bands whose positions change in position or intensity in response to changes in the refractive index of the sample;

(d) detecting positional shifts and/or intensity changes in fringe patterns positioned on opposing sides of a centroid; and

(e) determining the characteristic property of the sample from the positional shifts of the fringe patterns, wherein determining comprises performing a calculation with two sister fringes positioned on opposing sides of the centroid.

15. The method of claim 14, wherein interrogating comprises detecting backscattered light on the photodetector, and wherein the scattered light comprises a plurality of interference fringe patterns.

16. The method of claim 14, wherein the light source comprises a HeNe laser or a diode laser.

17. The method of claim 14, wherein at least one of the channel, light beam, detector, or a combination thereof is aligned so as to produce sister fringes having at least one of a similar base width, similar intensity, similar shape, or a combination thereof.

18. The method of claim 14, wherein at least one of the channel, light beam, detector, or a combination thereof is aligned so as to produce sister fringes having a similar base width, similar intensity, and similar shape.

19. The method of claim 14, wherein the sample is non-aqueous.