×

Automated defect diagnosis from machine diagnostic data

  • US 9,274,874 B1
  • Filed: 09/30/2013
  • Issued: 03/01/2016
  • Est. Priority Date: 09/30/2013
  • Status: Active Grant
First Claim
Patent Images

1. A method of defect diagnosis, comprising:

  • performing, by a processor, a defect signature-based query against system diagnostic data stored in one or more structured records;

    determining that a defect signature stored in memory is associated with a system based at least in part on the query;

    determining whether the defect signature association results in a false positive; and

    in response to the determined false positive, modifying the defect signature by adding additional qualifiers and storing the modified defect signature.

View all claims
  • 9 Assignments
Timeline View
Assignment View
    ×
    ×