Electrically conductive pins for microcircuit tester

• US 9,297,832 B2
• Filed: 05/27/2014
• Issued: 03/29/2016
• Est. Priority Date: 03/10/2010
• Status: Active Grant

• Current Assignee: Johnstech International Corporation
• Original Assignee: Johnstech International Corporation
• Inventors: Nelson, John E., Sherry, Jeffrey C., Warwick, Brian, Michalko, Gary W.
• Primary Examiner(s): NGUYEN, VINH P
• Application Number:
  US14/287,557
• Publication Number:
  US 20140266279A1
• Time in Patent Office: 672 Days
• US Class Current: 1/1
• CPC Class Codes: G01R 1/067 Measuring probes
• CPC Class Codes: G01R 1/06738 related to tip portion
• CPC Class Codes: G01R 1/06744 Microprobes, i.e. having dimensions as IC details
• CPC Class Codes: G01R 3/00 Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments , e.g. of probe tips
• CPC Class Codes: G01R 31/2887 involving moving the probe head or the IC under test; docking stations moving single probes G01R1/06705; moving individual probes in multiple probes G01R1/07392
• CPC Class Codes: G01R 31/2889 Interfaces, e.g. between probe and tester G01R31/31905 and G01R1/07364 take precedence
• CPC Class Codes: Y10T 29/49117 Conductor or circuit manufacturing

Abstract

The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.

Claims

1. In a contactor to be interposed between a contact load board and a device under test (DUT) having DUT contacts, the contactor including a plurality of having a plurality of contact pads, each contact pad being laterally arranged to correspond to one terminal, said terminals and said pads being generally in vertical axial alignment in pairs, comprising:

a longitudinally compressible membrane unit for forming a plurality of temporary mechanical and electrical connections between a device under test, the unit having;

a longitudinally resilient, electrically insulating interposer between the load board and device under test;

a plurality of longitudinally slideable, electrically conductive pin pairs extending through longitudinal holes in the interposer and in direct resilient contact with the interposer, each pin pair in the plurality being laterally arranged to correspond to one terminal on the device under test;

the plurality of pin pairs including a top and bottom contact, said pin pair contacts being in generally vertical axial alignment, the top contact having a top engagement surface which engages electrical connections to a device under test, said top engagement;

the bottom contact for engaging a contact on the load board, said top and bottom contacts being generally axially aligned;

said bottom contact which engages said load board includes a bottom surface, said bottom surface having a central contract point and pair of generally laterally extending flanges on side of said contact point, said contact point being arcuate and being in generally axial alignment with said top contact.

2. The contactor of claim 1 wherein said bottom surface includes a cylindrical ridge.

3. The contactor of claim 1 wherein said pin pairs are generally in vertical axial alignment with said top and bottom contacts and wherein said top and bottom contacts are electrically and physically joined in sliding engagement along mating surfaces, and wherein said flanges include generally planar upper contact surfaces, said upper surfaces configured to engage said resilient interposer, thereby helping to maintain said bottom contact in alignment with said top contact along said mating surfaces.

4. The contactor of claim 3 wherein said pin pairs are spaced from other by honeycomb structure of supporting cells such pins pairs in x and y directions, so that a plurality of pin pairs can be located in separate cells, under each DUT contacts without shorting to each other.

5. The contactor of claim 1 wherein said bottom surface includes a partial cylinder with its curved portion for contacting a load board.

6. The contactor of claim 1 wherein said bottom surface includes a sharp ridge.

7. The contactor of claim 1 wherein said unit including a resilient compressible honeycomb array of adjacent cells each having at least one planar vertical wall and wherein said pin pairs have planar interior mating surfaces therebetween which provide electrical and physical contact between the top and bottom pins and have an exterior wall of predetermined thickness, said exterior wall engaging said at least one planar vertical wall to prevent rotation of the pin pair and to maintain the interior mating surfaces in contact during compression of the unit.

8. The contactor of claim 1 wherein said bottom surface includes a plurality of parallel arcuate shapes.

9. The contactor of claim 1 wherein said bottom surface is non-planar.

10. A method of lowering the resistance between a terminal on an integrated circuit and the load board having

an electrically conductive pin having a central axis and a bottom surface engagable with the load board, the method comprising;

forming the bottom surface to include a generally planar portion having first and second ends and cylindrical arcuate ridge on the surface generally at the central axis generally midway between said first and second ends, whereby engagement of the ridge with the terminal will create a rockable contact line which will focus contact pressure over a small surface area and may further cause ablation of oxides on the terminal while said generally plan portions provides stability to said pin, and forming the pin into upper and lower pins each having a contact mating surface said mating surfaces being slideable against each other to make electrical and physical contact between said upper and lower pins, and locating said cylindrical ridge along a vertical axis which runs through the pins between the terminal and the load board, so that the mating surfaces tend to stay in intimate contact when said pins roll on said cylindrical ridge.

11. The method of claim 10 wherein the step of forming the bottom surface includes forming a foot with a peaked ridge having a longitudinal line of contact thereon.

12. A contactor to be interposed between a contact load board having terminals, and a device under test (DUT) having a plurality of DUT contacts, the contactor including a plurality of having a plurality of contact pads, each contact pad being laterally arranged to correspond to one terminal and one DUT contact, said terminals and DUT contact pairs being generally vertically axially aligned one atop the other, comprising:

a longitudinally compressible membrane unit for forming a plurality of temporary mechanical and electrical connections between a device under test, the unit having;

a longitudinally resilient, electrically insulating interposer between the load board and device under test, said unit including a resilient compressible honeycomb array of adjacent cells each having at least one planar vertical wall;

a plurality of longitudinally slideable, electrically conductive pin pairs extending through longitudinal holes in the interposer and in direct resilient contact with the interposer, each pin pair in the plurality being laterally arranged to correspond to one DUT contact, said pin pair having planar interior mating surfaces therebetween which provide electrical and physical contact between the pin pair and an exterior wall of predetermined thickness, said exterior wall engaging said at least one planar vertical wall to prevent rotation of the pin pair and to maintain the interior mating surfaces in contact during compression of the unit;

the plurality of pin pairs including a top and bottom contact, the top contact having a top engagement surface which engages electrical connections to a device under test, said top engagement;

the bottom contact for engaging a contact on the load board, said top and bottom contacts being generally vertically axially aligned;

said bottom contact which engages said load board includes a bottom surface, said bottom surface being cylindrical and being in generally vertical axial alignment with said top contact.