Touch panel and method for fabricating the same
First Claim
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1. A touch panel, comprising:
- a glass substrate having a first surface serving as a touched surface and a second surface opposite to the first surface, strengthened through a chemical method, and comprising 60 wt % to 80 wt % silicon oxide, 1 wt % to 15 wt % aluminum oxide, and 0.1 wt % to 15 wt % alkali oxide, wherein the glass substrate has a compressive stress greater than 8 GPa measured by a 4 point-bending test; and
an indium tin oxide (ITO) layer formed on the second surface of the glass substrate, wherein a sensing circuit, a driving circuit, and an interconnection circuit therebetween are formed in the ITO layer.
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Abstract
A touch panel and a method for fabricating the same are presented. The method includes the following steps. A glass substrate is strengthened through a chemical method. The glass substrate includes alkali oxide. An indium tin oxide (ITO) layer is formed below the glass substrate. A sensing circuit, a driving circuit, and an interconnection circuit therebetween are formed in the ITO layer.
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Citations
18 Claims
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1. A touch panel, comprising:
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a glass substrate having a first surface serving as a touched surface and a second surface opposite to the first surface, strengthened through a chemical method, and comprising 60 wt % to 80 wt % silicon oxide, 1 wt % to 15 wt % aluminum oxide, and 0.1 wt % to 15 wt % alkali oxide, wherein the glass substrate has a compressive stress greater than 8 GPa measured by a 4 point-bending test; and an indium tin oxide (ITO) layer formed on the second surface of the glass substrate, wherein a sensing circuit, a driving circuit, and an interconnection circuit therebetween are formed in the ITO layer. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for fabricating a touch panel, comprising:
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strengthening a glass substrate through a chemical method, wherein the glass substrate has a first surface serving as a touched surface and a second surface opposite to the first surface and wherein the glass substrate comprises 60 wt % to 80 wt % silicon oxide, 1 wt % to 15 wt % aluminum oxide, and 0.1 wt % to 15 wt % alkali oxide, and wherein the glass substrate has a compressive stress greater than 8 GPa measured by a 4 point-bending test; forming an indium tin oxide (ITO) layer below the glass substrate; and forming a sensing circuit, a driving circuit, and an interconnection circuit therebetween in the ITO layer. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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Specification