Semiconductor memory device
First Claim
1. A semiconductor device comprising:
- a first transistor comprising;
an oxide semiconductor film;
a gate electrode;
a source electrode and a drain electrode in contact with the oxide semiconductor film; and
a gate insulating film between the oxide semiconductor film and the gate electrode; and
a capacitor comprising;
a conductive film facing a side surface of one of the source electrode and the drain electrode of the first transistor; and
the gate insulating film between the conductive film and the one of the source electrode and the drain electrode of the first transistor,wherein the oxide semiconductor film comprises a channel formation region.
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Accused Products
Abstract
In the semiconductor memory device, one of a source and a drain of a first transistor is connected to one of a source and a drain of a second transistor, a gate of the first transistor is connected to one of a source and a drain of a third transistor and one of a pair of capacitor electrodes included in a capacitor, the other of the source and the drain of the first transistor and the other of the source and the drain of the third transistor are connected to a bit line, the other of the pair of capacitor electrodes included in the capacitor is connected to a common wiring, and the common wiring is grounded (GND). The common wiring has a net shape when seen from the above, and the third transistor is provided in a mesh formed by the common wiring.
134 Citations
20 Claims
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1. A semiconductor device comprising:
a first transistor comprising; an oxide semiconductor film; a gate electrode; a source electrode and a drain electrode in contact with the oxide semiconductor film; and a gate insulating film between the oxide semiconductor film and the gate electrode; and a capacitor comprising; a conductive film facing a side surface of one of the source electrode and the drain electrode of the first transistor; and the gate insulating film between the conductive film and the one of the source electrode and the drain electrode of the first transistor, wherein the oxide semiconductor film comprises a channel formation region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A semiconductor device comprising:
a first transistor comprising; an oxide semiconductor film; a gate electrode; a source electrode and a drain electrode in contact with the oxide semiconductor film; and a gate insulating film between the oxide semiconductor film and the gate electrode; and a capacitor comprising; a conductive film facing side surfaces of one of the source electrode and the drain electrode of the first transistor; and the gate insulating film between the conductive film and the one of the source electrode and the drain electrode of the first transistor, wherein the oxide semiconductor film comprises a channel formation region. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
Specification