Force measurement system

• US 9,316,488 B1
• Filed: 03/25/2015
• Issued: 04/19/2016
• Est. Priority Date: 04/04/2014
• Status: Active Grant

• Current Assignee: Softronics, Ltd.
• Original Assignee: Softronics, Ltd.
• Inventors: Sternowski, Robert H.
• Primary Examiner(s): Lyons, Michael A
• Assistant Examiner(s): Smith, Maurice
• Application Number:
  US14/668,368
• Time in Patent Office: 391 Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/16 for measuring the deformation in a solid, e.g. optical strain gauge
• CPC Class Codes: G01D 5/30 the beams of light being detected by photocells
• CPC Class Codes: G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
• CPC Class Codes: G01M 5/0025 of elongated objects, e.g. pipes, masts, towers or railways G01M5/0058 takes precedence
• CPC Class Codes: G01M 5/0041 by determining deflection or stress
• CPC Class Codes: G01M 5/0091 by using electromagnetic excitation or detection

Abstract

A system includes an emitter of electromagnetic radiation combined to the object and aligned with a detector for detecting the electromagnetic radiation from the emitter. A processor in communication with the detector is calibrated to recognize a change in alignment between the electromagnetic radiation from the emitter and the detector. The processor translates the change in alignment to the amount of force applied to the object.

Claims

1. A force measurement system for measuring an amount of force applied to an object, the system comprising:

a light source combined to the object for emitting electromagnetic radiation;

a detector combined to the object and aligned with the light source for detecting the electromagnetic radiation from the light source; and

a processor in communication with the detector calibrated for recognizing a change in alignment of the detector and the light source and translating the change in alignment to the amount of force applied to the object.

2. The system of claim 1, and further comprising a support member attached to the object, wherein the light source and the detector are attached to the support member to maintain the alignment between the light source and the detector.

3. The system of claim 2, wherein the support member is a circuit board, and wherein the circuit board is fixed to the object.

4. The system of claim 1, wherein the light source is a light emitting diode (LED) for emitting light and the detector is directly aligned with the LED.

5. The system of claim 4, wherein the detector is an array of photodiodes and the processor translates a movement of light on the array of photodiodes to the amount of force applied to the object.

6. The system of claim 1, wherein the detector is an image sensor with a plurality of pixels, and the processor translates movement of the electromagnetic radiation across the plurality of pixels and a calibration factor to the amount of force applied to the object.

7. The system of claim 6, wherein the electromagnetic radiation moves across the image sensor.

8. The system of claim 1, and further comprising a digital transmitter to convert an analog signal from the processor to a digital signal and an antenna to transmit information from the digital transmitter.

9. The system of claim 1, wherein the processor further comprises a data-logger to capture each pulse created by a load passing over the object.

10. The system of claim 1, and further comprising at least one chosen from an accelerometer and a temperature sensor, in communication with the processor.

11. A force measurement system for measuring an amount of force applied to an object, the system comprising:

a light emitting diode combined to the object for emitting light;

an image sensor combined to the object and aligned with the light emitting diode for detecting the light from the light emitting diode;

a processor in communication with the image sensor calibrated for recognizing a change in alignment between light emitting diode and the image sensor and translating the change in alignment to the amount of force applied to the object.

12. The system of claim 11, and further comprising a circuit board attached to the object and the light emitting diode and the image sensor are attached to the circuit board.

13. The system of claim 11, wherein the processor further comprises a data-logger to capture each pulse created by a load passing over the object.

14. The system of claim 11, and further comprising at least one chosen from an accelerometer and a temperature sensor, in communication with the processor.

15. The system of claim 11, and further comprising a digital transmitter to convert an analog signal from the processor to a digital signal and an antenna to transmit information from the digital transmitter.

16. A force measurement system for measuring an amount of force applied to an object, the system comprising:

a light source combined to the object for emitting light;

a detector with a plurality of pixels combined to the object and directly aligned with the light source for detecting the light from the light source;

a processor in communication with the image sensor calibrated for recognizing a change in alignment between the light source and the detector and translating a movement of the light across the plurality of pixels to the amount of force applied to the object; and

a circuit board attached to the object and the light source and the detector are attached to the circuit board and positioned such that the light source is aligned with the detector for emitting light directly to the detector.

17. The system of claim 16, wherein a calculation of the force is determined upon a number of pixels across which the light moves multiplied by a calibration factor, wherein the detector and the light source are directly aligned.