Data storage device executing retry operation by buffering signal samples at different radial offsets

• US 9,318,137 B1
• Filed: 07/14/2015
• Issued: 04/19/2016
• Est. Priority Date: 03/13/2015
• Status: Active Grant

• Current Assignee: JP Morgan Chase Bank, N.A. (JP Morgan Chase & Co)
• Original Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Inventors: Chan, Tom S., Banh, Thao Hieu, Burton, Derrick E.
• Primary Examiner(s): Hindi, Nabil
• Application Number:
  US14/799,536
• Time in Patent Office: 280 Days
• Field of Search: 360/31, 360/39, 360/48, 360/65, 360/46, 360/68
• US Class Current: 1/1
• CPC Class Codes: G11B 19/044 by using a data buffer
• CPC Class Codes: G11B 20/10009 Improvement or modification of read or write signals
• CPC Class Codes: G11B 20/10268 bit detection or demodulation methods
• CPC Class Codes: G11B 20/10305 signal quality assessment

Abstract

A data storage device is disclosed comprising a head actuated over a disk. The head is positioned at a first radial location over the disk and at least part of a codeword on the disk is read to generate first signal samples. A first quality metric is generated for the first signal samples. The head is positioned at a second radial location over the disk different from the first radial location and at least part of the codeword is read to generate second signal samples. A second quality metric is generated for the second signal samples. A first subset of the first signal samples is combined with a second subset of the second signal samples based on the first and second quality metrics to generate a combined set of signal samples. An attempt is made to decode the codeword based on the combined set of signal samples.

Claims

1. A data storage device comprising:

a disk;

a head actuated over the disk; and

control circuitry configured to;

position the head at a first radial location over the disk and read at least part of a codeword on the disk to generate first signal samples;

generate a first quality metric for the first signal samples;

position the head at a second radial location over the disk different from the first radial location and read at least part of the codeword to generate second signal samples;

generate a second quality metric for the second signal samples;

combine a first subset of the first signal samples with a second subset of the second signal samples based on the first and second quality metrics to generate a combined set of signal samples; and

first attempt to decode the codeword based on the combined set of signal samples.

2. The data storage device as recited in claim 1, wherein when the second quality metric indicates a better quality than the first quality metric, the control circuitry is further configured to generate the combined set of signal samples using at least part of the second signal samples corresponding to the second quality metric.

3. The data storage device as recited in claim 1, wherein the control circuitry is further configured to:

position the head at a third radial location over the disk different from the first and second radial locations and read at least part of the codeword to generate third signal samples;

generate a third quality metric for the third signal samples;

modify the combined set of signal samples using the third signal samples based on the third quality metric; and

second attempt to decode the codeword based on the modified combined set of signal samples.

4. The data storage device as recited in claim 3, wherein when the third quality metric indicates a better quality than the first and second quality metrics, the control circuitry is further configured to modify the combined set of signal samples using at least part of the third signal samples corresponding to the third quality metric.

5. The data storage device as recited in claim 1, wherein the control circuitry is further configured to:

generate the first quality metric over a first plurality of the first signal samples; and

generate the second quality metric over a second plurality of the second signal samples.

6. The data storage device as recited in claim 5, wherein the control circuitry is further configured to:

generate the first quality metric based on a first difference between one of the first signal samples and an expected signal sample; and

generate the second quality metric based on a second difference between one of the second signal samples and an expected signal sample.

7. The data storage device as recited in claim 6, wherein the first difference corresponds to a branch metric of a trellis type sequence detector.

8. The data storage device as recited in claim 7, wherein the control circuitry is further configured to generate the first quality metric based on a plurality of branch metrics generated by the trellis type sequence detector over a plurality of the first signal samples.

9. The data storage device as recited in claim 1, wherein the control circuitry is further configured to:

generate the first quality metric based on a first difference between one of the first signal samples and an expected signal sample; and

generate the second quality metric based on a second difference between one of the second signal samples and an expected signal sample.

10. The data storage device as recited in claim 9, wherein the first difference corresponds to a branch metric of a trellis type sequence detector.

11. A method of operating a data storage device, the method comprising;

positioning a head at a first radial location over a disk and reading at least part of a codeword on the disk to generate first signal samples;

generating a first quality metric for the first signal samples;

positioning the head at a second radial location over the disk different from the first radial location and reading at least part of the codeword to generate second signal samples;

generating a second quality metric for the second signal samples;

combining a first subset of the first signal samples with a second subset of the second signal samples based on the first and second quality metrics to generate a combined set of signal samples; and

first attempting to decode the codeword based on the combined set of signal samples.

12. The method as recited in claim 11, wherein when the second quality metric indicates a better quality than the first quality metric, further comprising generating the combined set of signal samples using at least part of the second signal samples corresponding to the second quality metric.

13. The method as recited in claim 11, further comprising:

positioning the head at a third radial location over the disk different from the first and second radial locations and reading at least part of the codeword to generate third signal samples;

generating a third quality metric for the third signal samples;

modifying the combined set of signal samples using the third signal samples based on the third quality metric; and

second attempting to decode the codeword based on the modified combined set of signal samples.

14. The method as recited in claim 13, wherein when the third quality metric indicates a better quality than the first and second quality metrics, further comprising modifying the combined set of signal samples using at least part of the third signal samples corresponding to the third quality metric.

15. The method as recited in claim 11, further comprising:

generating the first quality metric over a first plurality of the first signal samples; and

generating the second quality metric over a second plurality of the second signal samples.

16. The method as recited in claim 15, further comprising:

generating the first quality metric based on a first difference between one of the first signal samples and an expected signal sample; and

generating the second quality metric based on a second difference between one of the second signal samples and an expected signal sample.

17. The method as recited in claim 16, wherein the first difference corresponds to a branch metric of a trellis type sequence detector.

18. The method as recited in claim 17, further comprising generating the first quality metric based on a plurality of branch metrics generated by the trellis type sequence detector over a plurality of the first signal samples.

19. The method as recited in claim 11, further comprising:

generating the first quality metric based on a first difference between one of the first signal samples and an expected signal sample; and

generating the second quality metric based on a second difference between one of the second signal samples and an expected signal sample.

20. The method as recited in claim 19, wherein the first difference corresponds to a branch metric of a trellis type sequence detector.