Surface measurement instrument and calibration thereof

• US 9,322,631 B2
• Filed: 03/01/2011
• Issued: 04/26/2016
• Est. Priority Date: 03/02/2010
• Status: Active Grant

• Current Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Original Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Inventors: Scott, Paul J.
• Primary Examiner(s): Le, John H
• Application Number:
  US13/581,900
• Publication Number:
  US 20130054194A1
• Time in Patent Office: 1,883 Days
• Field of Search: 702/95, 702/150, 702/151, 702/167, 702/168, 702/169, 335/03, 335/04, 335/05, 335/54, 335/89, 335/64, 250/231.14, 700/279, 731/04
• US Class Current: 1/1
• CPC Class Codes: G01B 5/252 for measuring eccentricity, i.e. lateral shift between two parallel axes
• CPC Class Codes: G01B 7/312 for measuring eccentricity, i.e. lateral shift between two parallel axes

Abstract

A method of calibrating a surface measurement instrument includes rotating a work piece having an undulating surface on a turntable of a metrological apparatus; measuring the surface of the work piece at a plurality of rotational positions; analyzing the results of the measurement to determine parameters describing an error causing characteristic of the metrological apparatus; and using the determined parameters to correct measurement data for the error causing characteristic of the metrological apparatus.

Claims

1. A method of characterising an eccentricity of a rotary encoder of a surface measurement instrument, the method comprising:

effecting relative rotation of a work piece support and a measurement probe, wherein the rotation is effected about a rotation axis and the work piece support supports an artefact having an undulating profile;

using a rotary encoder to log, about a measurement axis of the rotary encoder, the rotation,

wherein the measurement axis of the rotary encoder has an eccentricity with respect to the rotation axis;

measuring, using the measurement probe, the undulating profile of the artefact at a plurality of rotational positions of the work piece support with respect to the measurement probe to produce profile measurement data; and

extracting, by a processing unit, from the profile measurement data parameters describing the eccentricity of the measurement axis of the rotary encoder with respect to the rotation axis.

2. The method of claim 1 wherein the rotary encoder comprises a first portion coupled to the work piece support, and a second portion rotatable with respect to the first portion, wherein at least one of the first and second portions includes a detecting device and method further comprises using the detecting device to detect relative rotation of the first portion of the rotary encoder with respect to the second portion of the rotary encoder about the measurement axis of the rotary encoder.

3. The method of claim 1, wherein the extracting step comprises performing a beat frequency analysis by the processing unit, wherein the beat frequency analysis comprises extracting, by the processing unit, from the profile measurement data at least one component due to the eccentricity of the measurement axis of the rotary encoder with respect to the rotation axis.

4. The method of claim 3, wherein the undulating profile of the artefact comprises a component that undulates at a frequency β

.

5. The method of claim 4, wherein the extracting step comprises at least one of:

multiplying, by the processing unit, the profile measurement data by sin(β

) to produce first multiplied data; and

filtering the first multiplied data to produce first filtered data; and

(ii) multiplying, by the processing unit, the profile measurement data by cos(β

) to produce second multiplied data; and

filtering the second multiplied data to produce second filtered data.

6. The method of claim 4, wherein the extracting step comprises:

multiplying, by the processing unit, the profile measurement data by sin(β

) to produce first multiplied data; and

filtering, by the processing unit, the first multiplied data to produce first filtered data;

multiplying, by the processing unit, the profile measurement data by cos(β

) to produce second multiplied data;

filtering, by the processing unit, the second multiplied data to produce second filtered data;

dividing, by the processing unit, the second filtered data by the first filtered data;

performing, by the processing unit, an arctan operation on the results of the division; and

determining, by the processing unit, the parameters from the results of the arctan operation.

7. The method of claim 6, wherein the determining the parameters from the results of the arctan operation step comprises fitting a sine wave to the results of the arctan operation step and determining the amplitude and the phase of the fitted sine wave.

8. The method of claim 1, further comprising determining, by the processing unit, for an angle α

measured about the measurement axis of the rotary encoder, a corresponding angle θ

measured about the rotation axis.

9. The method of claim 8, wherein the determining θ

step comprises solving the equation α

=θ

−

sin(θ

−

ψ

), where k and ψ

are the produced parameters.

10. The method of claim 8, comprising determining, by the processing unit, a plurality of angles θ

for a corresponding plurality of angles α

.

11. The method of claim 10, further comprising interpolating, by the processing unit, between two or more of the angles θ

to produce at least one intermediate angle θ

.

12. The method of claim 1, wherein the undulating profile of the artefact undulates sinusoidally.

13. The method of claim 1, wherein the undulating profile of the artefact comprises undulations at a plurality of frequencies.

14. The method of claim 1, wherein the extracting step comprises producing the parameters by determining intermediate parameters for each of the rotational frequencies before combining the intermediate parameters.

15. The method of claim 1, wherein the extracted parameters form a first set of parameters, and further comprising:

effecting relative rotation of the work piece support and the measurement probe, wherein the rotation is effected about the rotation axis and the work piece support supports the artefact having an undulating profile;

using the rotary encoder to log, about the measurement axis of the rotary encoder, the rotation;

measuring, using the measurement probe, the undulating profile of the artefact at a further plurality of rotational positions of the work piece support with respect to the measurement probe to produce further profile measurement data;

extracting, by the processing unit, from the profile measurement data a further parameter set describing the eccentricity of the measurement axis of the rotary encoder with respect to the rotation axis; and

averaging, by the processing unit, each parameter across the first and further parameter set to produce an improved set of parameters.

17. A tangible non-transitory storage medium carrying program instructions for programming transforming means to carry out a method in accordance with claim 1.

18. The method of claim 8 wherein the determining θ

step is based on fitting a sinusoid to the undulating profile to extract the parameters.

16. A method of characterising an eccentricity of a rotary encoder of a surface measurement instrument, the method comprising:

measuring, using a measurement probe, an undulating profile of an artefact carried on a work piece support at a plurality of rotational positions determined by logging, about a measurement axis of a rotary encoder, relative rotation about a rotation axis, of the work piece support with respect to the measurement probe, wherein the measurement axis of the rotary encoder has an eccentricity with respect to the rotation axis;

receiving the profile measurement data by a processing unit; and

extracting, by the processing unit, from the profile measurement data parameters describing the eccentricity of the measurement axis of the rotary encoder with respect to the rotation axis.