Non-contact object inspection

• US 9,329,030 B2
• Filed: 09/06/2010
• Issued: 05/03/2016
• Est. Priority Date: 09/11/2009
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: Weston, Nicholas John, Huddart, Yvonne Ruth
• Primary Examiner(s): Carter, Aaron W
• Application Number:
  US13/392,710
• Publication Number:
  US 20120154576A1
• Time in Patent Office: 2,066 Days
• Field of Search: None
• US Class Current: 1/1
• CPC Class Codes: G01B 11/007 feeler heads therefor
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G01B 11/2513 with several lines being projected in more than one direction, e.g. grids, patterns

Abstract

A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object. The method includes taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected, and taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image. The method further includes determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image. Phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image.

Claims

1. A non-contact method of inspecting the topography of an area of an object via analysis of the phase of a pattern projected on the object, comprising:

i) taking a first image of the object, obtained from a first perspective, on which an optical pattern is projected;

ii) taking a second image of the object, obtained from a second perspective, on which an optical pattern is projected but in which the optical pattern, as it falls on the object, in the second image differs to that in the first image; and

iii) determining data describing the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image in which phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image,

wherein the region of the optical pattern as imaged in the first image and the corresponding region of the object as imaged in the second image each comprise a plurality of mutually adjacent pixels that define areas extending substantially in two dimensions.

2. A method as claimed in claim 1, in which at least one of the relative position and relative orientation of the object and projector of the optical pattern at step i) is different to that of the object and projector of the optical pattern at step ii).

3. A method as claimed in claim 1, in which the projector of the optical pattern imaged at step i) and the projector of the optical pattern imaged at step ii) are provided by a common optical pattern projector unit comprising at least one projector, and in which the method further comprises relatively moving the object and the optical pattern projector unit between steps i) and ii).

4. A method as claimed in claim 3, comprising moving the optical pattern projector unit relative to the object.

5. A method as claimed in claim 3, in which the projector of the optical pattern imaged at step ii) is the projector of the optical pattern imaged at step i).

6. A method as claimed in claim 1, in which the optical pattern projected onto the object in step i) and step ii) is the same.

7. A method as claimed in claim 1, in which the first image and the at least second image are obtained by a common imager device comprising at least one image sensor, and in which the method comprises moving the imager device from the first perspective to the second perspective.

8. A method as claimed in claim 3, in which the optical pattern projector unit and the imager device are in a fixed spatial relationship relative to each other.

9. A method as claimed in claim 8, in which the optical pattern projector unit and the imager device are mounted on a coordinate positioning apparatus.

10. A method as claimed in claim 8, in which the optical pattern projector unit and the imager device unit are provided as a single probe.

11. A method as claimed in claim 1, comprising comparing data from the first image for the region to data derived from the second image for at least one region, to identify correlating regional data so as to resolve any ambiguity in the phase or topography data.

12. A method as claimed in claim 11, in which the method comprises iteratively comparing data derived from the first and second images to resolve any ambiguity in the phase or topography data by deduction.

13. A method as claimed in claim 1, in which step iii) comprises determining a plurality of different data sets relating to different possible topographies of at least a region of the object.

14. A method as claimed in claim 13, in which step iii) comprises identifying which data set most accurately represents the object based on data obtained from the second image so as to resolve any ambiguity in the phase or topography data.

15. A method as claimed in claim 13, comprising selecting a data set to use based on data obtained from the second image.

16. A method as claimed in claim 13, in which step iii) comprises determining which of the plurality of different data sets is most consistent with data obtained from the second image.

17. A method as claimed in claim 16, in which step iii) comprises determining which of the plurality of different data sets is most consistent with data relating to the region of the object obtained from the second image.

18. A method as claimed in claim 13, in which step iii) comprises based on the knowledge of the first and second perspectives, determining for at least some of the different data sets the part of the second image that corresponds to the region of the object for which the data sets have been obtained.

19. A method as claimed in claim 13, in which step iii) comprises determining which of the plurality of different data sets is most consistent with the form of the data obtained from the second image.

20. A method as claimed in claim 13, comprising:

for at least some of the different data sets extrapolating therefrom data relating to the region of the object as it should be when obtained from the second perspective; and

comparing the extrapolated data with data relating to the region of the object actually obtained from the second image.

21. A method as claimed in claim 20, in which the extrapolated data relates to the expected optical pattern as obtained from the second image.

22. A method as claimed in claim 20, in which the extrapolated and actual data relate to the distortion of the optical pattern.

23. A method as claimed in claim 20, in which the extrapolated and actual data relate to the phase of the optical pattern.

24. A method as claimed in claim 1, in which step iii) comprises:

a) calculating at least one phase map from the first image; and

b) from the at least one phase map calculating a plurality of different data sets relating to possible topographies for the at least the region of the object.

25. A method as claimed in claim 24, in which step i) comprises taking a plurality of first images obtained substantially from the same first perspective, and in which step a) comprises calculating the at least one phase map from the plurality of images.

26. A method as claimed in claim 24, in which step iii) further comprises:

x) calculating a phase map from the second image;

y) for at least some of the plurality of different data sets determined in step b) extrapolate therefrom corresponding phase map data for the second perspective; and

z) identifying which calculated phase map data is most consistent with the form of a corresponding region of the second image'"'"'s phase map.

27. A method as claimed in claim 26, in which step ii) comprises taking a plurality of second images obtained substantially from the same second perspective, and in which step x) comprises calculating the at least one phase map from the plurality of images.

28. An apparatus for non-contact inspection of an object, comprising:

at least one projector configured to project an optical pattern onto the object to be inspected;

at least one imager device configured to obtain a first and at least a second image of the object, from first and at least second perspectives, on which the optical pattern is projected; and

an analyser configured to determine the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image in which phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image, and in which the optical pattern, as it falls on the object, in the second image differs to that in the first image,

wherein the region of the optical pattern as imaged in the first image and the corresponding region of the object as imaged in the second image each comprise a plurality of mutually adjacent pixels that define areas extending substantially in two dimensions.

29. An apparatus for non-contact inspection of an object, comprising:

means for projecting an optical pattern onto the object to be inspected;

means for obtaining a first and at least a second image of the object, from first and at least second perspectives, on which the optical pattern is projected; and

means for determining the topography of at least a region of the object based on phase data relating to the phase of at least a region of the optical pattern as imaged in the first image in which phase data obtained from a corresponding region of the object as imaged in the second image is used to resolve any ambiguity in the phase or topography data obtained from the first image, and in which the optical pattern, as it falls on the object, in the second image differs to that in the first image,

wherein the region of the optical pattern as imaged in the first image and the corresponding region of the object as imaged in the second image each comprise a plurality of mutually adjacent pixels that define areas extending substantially in two dimensions.