Inspection of hidden structure

• US 9,329,305 B2
• Filed: 04/04/2014
• Issued: 05/03/2016
• Est. Priority Date: 04/06/2010
• Status: Active Grant

• Current Assignee: Jeffrey M Sieracki
• Original Assignee: Jeffrey M Sieracki
• Inventors: Sieracki, Jeffrey M.
• Primary Examiner(s): Cunningham, Gregory F
• Application Number:
  US14/245,027
• Publication Number:
  US 20140222371A1
• Time in Patent Office: 760 Days
• Field of Search: 382/291, 702/150
• US Class Current: 1/1
• CPC Class Codes: G01V 11/00 Prospecting or detecting by methods combining techniques covered by two or more of main groups G01V1/00 - G01V9/00
• CPC Class Codes: G01V 11/002 Details, e.g. power supply systems for logging instruments, transmitting or recording data, specially adapted for well logging, also if the prospecting method is irrelevant means for transmitting well survey signals E21B47/12; signal transmission systems in general G08C; transmission in general H04B
• CPC Class Codes: G01V 3/15 specially adapted for use during transport, e.g. by a person, vehicle or boat

Abstract

An inspection apparatus determines information indicative of structure that may be hidden behind an obscuring boundary, such as a wall. A processor collects measurements of properties characterizing the hidden structure and measurements of location of the apparatus. The collected data are mapped to produce an image of intensity in the characteristic measurements. Each intensity value in the image reflects a measure of density, of material type, or of some other specific information by which hidden structure can be discerned. The intensity changes indicating the hidden structure are displayed to a user via color-coded pixels or the like.

Claims

1. An apparatus to inspect a region of interest for physical structure through a surface therein, the apparatus comprising:

at least one sensor configured to generate a characteristic signal as the sensor is moved across the surface in the region of interest, the sensor defining a contact area on the surface over which at least one physical characteristic at each measurement location on the surface to which the sensor is moved is characterized by an attribute of the characteristic signal;

a memory comprising storage locations logically-arranged in accordance with a coordinate system to represent map locations of a data map;

a processor configured to;

determine the map locations representing the contact area in the coordinate system of the data map for each measurement location;

estimate values of a structural characteristic of the physical structure from the quantified attribute of the characteristic signal for the map locations representing the contact area at the measurement location at which the characteristic signal was generated; and

store the computed values at the respective map locations of the data map; and

a display to generate a two-dimensional visual image from the data map.

9. The apparatus of claim 1, wherein the processor is further configured to:

compute the values of the structural characteristic for each of the map locations in accordance with a sampling function defined over the contact area; and

update, with the computed values of the structural characteristic, the estimated values of the structural characteristic stored at the memory locations corresponding to the contact area at other measurement locations at which the sensor was previously moved.

10. The apparatus of claim 9, wherein the processor is further configured to:

weight, in accordance with the sampling function, the attribute of the characteristic signal generated at the measurement location across the memory locations representing the contact area in the data map.

11. The apparatus of claim 10, wherein the processor is further configured to:

convolve the weighted characteristic signal in the memory locations representing the contact area with the estimated values of the structural characteristic stored at the memory locations corresponding to the contact area at the other measurement locations.

12. The apparatus of claim 1, wherein the at least one sensor comprises:

an inspection sensor configured to generate the characteristic signal; and

a positioning sensor configured to generate a positioning signal by which the measurement location is determined relative to other measurement locations as the positioning sensor is moved across the surface.

13. The apparatus of claim 12, wherein the positioning sensor is includes encoders that generate the positioning signal as relative displacement in a Cartesian coordinate system.

14. The apparatus of claim 1, wherein further comprising:

a housing in which the inspection sensor, the positioning sensor, the processor and the display are commonly housed.

2. A method of characterizing physical structure through a surface in a region of interest, the method comprising:

establishing a data map in a memory having map locations logically arranged in accordance with a predetermined coordinate system;

generating a characteristic signal by at least one sensor as the sensor is moved over the surface, the characteristic signal having an attribute quantifying a physical characteristic over a contact area defined by the sensor on the surface at each measurement location at which the sensor is moved;

determining, by a processor, the map locations representing the contact area in the coordinate system of the data map for each measurement location;

estimating, by the processor, values of a structural characteristic of the physical structure from the quantified attribute of the characteristic signal for the map locations representing the contact area in the data map for the measurement location at which the characteristic signal was generated;

storing the estimated values of the structural characteristic at the respective map locations of the data map; and

displaying, on a display, a two-dimensional image of pixels arranged per the predetermined coordinate system and assigned pixel values corresponding to the estimated structural characteristic values in the data map.

3. The method of claim 2, wherein estimating the values of the structural characteristic comprises:

computing, by the processor, the values of the structural characteristic for each of the map locations in accordance with a sampling function defined over the contact area; and

updating, by the processor with the computed values of the structural characteristic, the estimated values of the structural characteristic stored at memory locations corresponding to the contact area at other measurement locations at which the sensor was previously moved.

4. The method of claim 3, wherein computing the values of the structural characteristic comprises:

weighting, by the processor in accordance with the sampling function, the attribute of the characteristic signal generated at the measurement location across the memory locations representing the contact area in the data map.

5. The method of claim 4, wherein updating the estimated values comprises:

convolving, by the processor, the weighted characteristic signal in the memory locations representing the contact area with the estimated values of the structural characteristic stored at the memory locations corresponding to the contact area at the other measurement locations.

6. The method of claim 2, wherein the estimated structural characteristic is density.

7. The method of claim 2, further comprising:

generating a positioning signal by the at least one sensor; and

determining, by the processor, the measurement location relative to the other measurement locations from the positioning signal.

8. The method of claim 2, further comprising:

moving the at least one sensor, the memory and the display on a free-form trajectory in a common housing held in one hand of a user.

15. An apparatus to inspect a region of interest for physical structure through a surface therein, the apparatus comprising:

a position sensor configured to generate a positioning signal by which a measurement location is determined relative to other measurement locations in a predetermined coordinate system;

an inspection sensor configured to generate a characteristic signal at each measurement location on the surface to which the sensor is moved, the characteristic signal quantifying a physical characteristic of the physical structure by an attribute thereof;

a memory comprising storage locations logically-arranged in accordance with the coordinate system to represent map locations of a data map;

a processor configured to store values of a structural characteristic of the physical structure estimated from the quantified attribute of the characteristic signal for the map locations representing the measurement location determined from the positioning signal.

16. The apparatus of claim 15, further comprising a display configured to generate a two-dimensional visual image from the data map.

17. The apparatus of claim 15, wherein the inspection sensor defines a contact area on the surface at the measurement location over which the physical characteristic is quantified by the attribute of characteristic signal.

18. The apparatus of claim 17, wherein the processor is further configured to:

determine the map locations representing the contact area in the coordinate system for each measurement location;

compute the values of the structural characteristic for each of the map locations in accordance with a sampling function defined over the contact area; and

update, with the computed values of the structural characteristic, the estimated values of the structural characteristic stored at the memory locations corresponding to the contact area at other measurement locations at which the inspection sensor was previously moved.

19. The apparatus of claim 18, wherein the processor is further configured to:

weight, in accordance with the sampling function, the attribute of the characteristic signal generated at the measurement location across the memory locations representing the contact area in the data map.

20. The apparatus of claim 19, wherein the processor is further configured to:

convolve the weighted characteristic signal in the memory locations representing the contact area with the estimated values of the structural characteristic stored at the memory locations corresponding to the contact area at the other measurement locations.

21. The apparatus of claim 15, further comprising:

a housing in which the inspection sensor, the positioning sensor and the processor are commonly housed.

22. The apparatus of claim 15, wherein the housing is movable across the surface in one hand of a user.