Real-time rule engine for adaptive testing of integrated circuits

• US 9,336,109 B2
• Filed: 02/26/2013
• Issued: 05/10/2016
• Est. Priority Date: 08/22/2012
• Status: Active Grant

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Atkinson, David E., Grady, Matthew S., LaCroix, Donald L., Lutton, David B. II, Pepper, Bradley D., Steel, Randolph P.
• Primary Examiner(s): PATEL, KAMINI B
• Application Number:
  US13/776,986
• Publication Number:
  US 20140059386A1
• Time in Patent Office: 1,169 Days
• Field of Search: 714/33
• US Class Current: 1/1
• CPC Class Codes: G01R 31/31903 tester configuration
• CPC Class Codes: G01R 31/31905 Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
• CPC Class Codes: G01R 31/31908 Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
• CPC Class Codes: G06F 11/263 Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Abstract

A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.

Claims

1. A system for testing a device under test (DUT), comprising:

a circuit tester;

a handler to provide a connection between the circuit tester and the DUT;

a device test program included in the circuit tester and configured to administer a plurality of tests to the DUT;

a data file for storing results of the plurality of tests administered to the DUT;

a tool control application included in the circuit tester and configured to provide a user interface and to coordinate an operation of the handler and the device test program;

a real-time rule engine configured to send an adaptation command to the tool control application, wherein the tool control application implements the adaptation command and separately supervises the operation of the circuit tester; and

a data sniffer coupled to the data file and the real-time rule engine to intercept test results data as they are generated by the device test program and forward the test results to the real-time rule engine.

2. The system of claim 1, wherein the tool control application is further configured to control operation of the device test program to test the DUT.

3. The system of claim 2, wherein the tool control application is configured to send the adaptation command to the device test program and the device test program is configured to use the adaptation command to perform at least one of:

initiating a test;

discontinuing a test;

pausing a test; and

restarting a test.

4. The system of claim 1, wherein the tool control application is further configured to use the adaptation command to alter a parameter related to a behavior of the circuit tester.

5. The system of claim 4, wherein the tool control application is further configured to use the adaptation command to perform at least one of:

selecting the DUT;

coupling a probe to the DUT;

cleaning a probe;

compiling data;

storing data;

communicating data to the user interface; and

obtaining instructions from a user at the user interface.

6. The system of claim 1, wherein the rule-time rule engine is further configured to connect to a DUT-specific database of one or more rules and dynamically load the one or more rules into the real-time rule engine when a corresponding device is selected for testing.

7. The system of claim 1, wherein the DUT further comprises a wafer selected from a plurality of wafers, and the tool control application is further configured to determine a testing order of the plurality of wafers.

8. The system of claim 1, wherein the tool control application is further configured to store the adaptation command with test data obtained using the adaptation command.

9. The system of claim 1, wherein the tool control application further comprises:

a first interface configured to provide a signal that controls an operation of the system; and

a second interface configured to receive the adaptation command from the real-time rule engine based on an evaluation of data obtained by the device test program, wherein the tool control application is configured to control the operation of the system using the received adaptation command.

10. The system of claim 9, wherein the adaptation command is directed to control an operation of the device test program and the tool control application is further configured to send the adaptation command to the device test program.

11. The system of claim 9, wherein the adaptation command is related to a behavior of the circuit tester that includes the device test program and the tool control application is further configured to use the adaptation command to control the behavior.

12. The system of claim 9, wherein the first interface is configured to receive the adaptation command from the real-time rule engine.