Testing holders for chip unit and die package
First Claim
Patent Images
1. A testing holder for a chip unit, comprising:
- a holder body containing the chip unit; and
a pressure releasing device formed on the holder body to release an insertion pressure when the chip unit is inserted in the holder body,wherein the holder body comprises a bottom plate, andthe chip unit includes a bottom surface facing the bottom plate and an opposing top surface on which a test contactor is disposed.
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Abstract
A testing holder for a chip unit, a multi site holding frame for plural chip units and a method for testing a die thereof are provided. The proposed multi site holding frame for testing plural chip units simultaneously includes a first holder frame having a plurality of testing holders. Each of the plurality of testing holders includes a holder body containing a specific one of the plural chip units, and a pressure releasing device formed on the holder body to release an insertion pressure when the specific one of the plural chip units is inserted in the holder body.
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Citations
20 Claims
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1. A testing holder for a chip unit, comprising:
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a holder body containing the chip unit; and a pressure releasing device formed on the holder body to release an insertion pressure when the chip unit is inserted in the holder body, wherein the holder body comprises a bottom plate, and the chip unit includes a bottom surface facing the bottom plate and an opposing top surface on which a test contactor is disposed. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A multi site holding frame for plural chip units, comprising:
- a first holder frame having a plurality of testing holders, each of the plurality of testing holders including;
a holder body containing a specific one of the plural chip units; and
a pressure releasing device formed on the holder body to release an insertion pressure when the specific one of the plural chip units is inserted in the holder body,wherein the holder body comprises a bottom plate, and the specific one of the plural chip units includes a bottom surface facing the bottom plate and an opposing top surface on which a test contactor is disposed. - View Dependent Claims (12, 13, 14, 15)
- a first holder frame having a plurality of testing holders, each of the plurality of testing holders including;
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16. A method for testing a die, comprising:
- providing a testing holder;
inserting the die into the testing holder; and
testing the die via the testing holder to determine whether the die is a defective unit,wherein the testing holder comprises a bottom plate, and the die includes a bottom surface facing the bottom plate and an opposing top surface on which a test contactor is disposed. - View Dependent Claims (17, 18, 19, 20)
- providing a testing holder;
Specification