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Detecting and managing bad columns

  • US 9,348,694 B1
  • Filed: 10/09/2013
  • Issued: 05/24/2016
  • Est. Priority Date: 10/09/2013
  • Status: Active Grant
First Claim
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1. A method for managing bad columns of a NAND flash memory array of a NAND flash memory unit, the method comprises:

  • receiving or generating bad columns information indicative of the bad columns of the NAND flash memory array on a column to column basis;

    receiving an input data unit to be written to the NAND flash memory array;

    wherein the input data unit comprises bad column mapped data bits that are mapped to flash memory cells that belong to the bad columns of the NAND flash memory array;

    sending the input data unit to the NAND flash memory unit and instructing the NAND flash memory unit to write the input data unit to a first portion of the NAND flash memory array to provide a programmed data unit;

    sending the bad column mapped data bits to the NAND flash memory unit; and

    instructing the NAND flash memory unit to write the bad column mapped data bits to a second portion of the NAND flash memory array to provide programmed bad column mapped data bits; and

    wherein the first and second portions of the NAND flash memory array belong to a same physical page of the NAND flash memory array.

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