Systems and methods for configuring a semiconductor device
First Claim
1. A system for configuring a semiconductor device to generate an output signal, the system comprising:
- a temperature sensor configured to sense a plurality of operating temperatures of the semiconductor device, the plurality of operating temperatures including at least (i) a first operating temperature, and (ii) a second operating temperature;
a controller configured to determine a plurality of operating frequencies of the output signal at respective operating temperatures of the plurality of operating temperatures, the plurality of operating frequencies including (i) a first operating frequency of the output signal when the semiconductor device is at the first operating temperature, and (ii) a second operating frequency of the output signal when the semiconductor device is at the second operating temperature; and
memory configured to store calibration information, wherein the calibration information associates each of the plurality of operating temperatures of the semiconductor device with respective operating frequencies of the plurality of operating frequencies.
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Accused Products
Abstract
A system for configuring a semiconductor device to generate an output signal. The system includes a temperature sensor configured to sense a plurality of operating temperatures of the semiconductor device, the plurality of operating temperatures including at least a first operating temperature and a second operating temperature. A controller is configured to determine a plurality of operating frequencies of the output signal at respective operating temperatures of the plurality of operating temperatures. The plurality of operating frequencies include a first operating frequency of the output signal when the semiconductor device is at the first operating temperature and a second operating frequency of the output signal when the semiconductor device is at the second operating temperature. Memory is configured to store calibration information that associates each of the plurality of operating temperatures of the semiconductor device with respective operating frequencies of the plurality of operating frequencies.
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Citations
20 Claims
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1. A system for configuring a semiconductor device to generate an output signal, the system comprising:
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a temperature sensor configured to sense a plurality of operating temperatures of the semiconductor device, the plurality of operating temperatures including at least (i) a first operating temperature, and (ii) a second operating temperature; a controller configured to determine a plurality of operating frequencies of the output signal at respective operating temperatures of the plurality of operating temperatures, the plurality of operating frequencies including (i) a first operating frequency of the output signal when the semiconductor device is at the first operating temperature, and (ii) a second operating frequency of the output signal when the semiconductor device is at the second operating temperature; and memory configured to store calibration information, wherein the calibration information associates each of the plurality of operating temperatures of the semiconductor device with respective operating frequencies of the plurality of operating frequencies. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for configuring a semiconductor device to generate an output signal, the method comprising:
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sensing a plurality of operating temperatures of the semiconductor device, the plurality of operating temperatures including at least (i) a first operating temperature, and (ii) a second operating temperature; determining a plurality of operating frequencies of the output signal at respective operating temperatures of the plurality of operating temperatures, the plurality of operating frequencies including (i) a first operating frequency of the output signal when the semiconductor device is at the first operating temperature, and (ii) a second operating frequency of the output signal when the semiconductor device is at the second operating temperature; and storing, in a memory, calibration information, wherein the calibration information associates each of the plurality of operating temperatures of the semiconductor device with respective operating frequencies of the plurality of operating frequencies. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification