Capacitive voltage divider touch sensor
First Claim
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1. A system for measuring capacitance, comprising:
- a microcontroller comprising a measurement circuit and a plurality of external pins;
a reference capacitor coupled to a first pin and to a second pin of the microcontroller;
the first pin connected to a first switching unit of the microcontroller configured to apply or remove a reference voltage or ground to said first pin;
the second pin connected to a second switching unit of the microcontroller configured to apply or remove a reference voltage or ground to said second pin;
a pad connected to the first pin wherein the second pin is connected to the reference capacitor; and
an analog to digital converter in said microcontroller operable to measure a voltage between the first pin and second pin,wherein the microcontroller is configured to control the first and second switching units to apply in a first state the reference voltage simultaneously to said first and said second pin from which state the reference voltage is removed from the first pin, and the second pin is switched from the reference voltage to ground and after a predetermined settling time, said analog to digital converter is controlled to measure a first voltage between the first pin and the second pin, and thereafter to control the first and second switching units to apply in a second state the reference voltage simultaneously to said first and said second pin from which state said reference voltage is removed from said second pin and first pin is switched from the reference voltage to ground and after a predetermined settling time, said analog to digital converter is controlled to measure a second voltage between the first pin and the second pin.
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Abstract
A system for measuring capacitance has a measurement circuit with a first reference capacitor connected to a first node and to a second node. Each of the nodes is connected to a unit operable to apply a reference voltage or ground to one of the nodes. Each node has a first pad connected to the first node and a unit operable to measure voltage between the first node and second node.
17 Citations
18 Claims
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1. A system for measuring capacitance, comprising:
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a microcontroller comprising a measurement circuit and a plurality of external pins; a reference capacitor coupled to a first pin and to a second pin of the microcontroller; the first pin connected to a first switching unit of the microcontroller configured to apply or remove a reference voltage or ground to said first pin; the second pin connected to a second switching unit of the microcontroller configured to apply or remove a reference voltage or ground to said second pin; a pad connected to the first pin wherein the second pin is connected to the reference capacitor; and an analog to digital converter in said microcontroller operable to measure a voltage between the first pin and second pin, wherein the microcontroller is configured to control the first and second switching units to apply in a first state the reference voltage simultaneously to said first and said second pin from which state the reference voltage is removed from the first pin, and the second pin is switched from the reference voltage to ground and after a predetermined settling time, said analog to digital converter is controlled to measure a first voltage between the first pin and the second pin, and thereafter to control the first and second switching units to apply in a second state the reference voltage simultaneously to said first and said second pin from which state said reference voltage is removed from said second pin and first pin is switched from the reference voltage to ground and after a predetermined settling time, said analog to digital converter is controlled to measure a second voltage between the first pin and the second pin. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of measuring capacitance of a pad comprising:
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coupling the pad and a first terminal of a reference capacitor to a first I/O port of a microcontroller; coupling a second I/O port of the microcontroller to a second terminal of the reference capacitor; simultaneously applying a voltage to the pad and to both terminals of the reference capacitor and thereafter removing the voltage from the first terminal and the pad and switching the second terminal of the reference capacitor from the voltage to ground, after a predetermined settling time, measuring a resulting first voltage across the reference capacitor, thereafter simultaneously applying the voltage to the pad and to both terminals of the reference capacitor and thereafter removing the voltage from the second terminal and switching the first terminal of the reference capacitor and the pad from the voltage to ground, after a predetermined settling time, measuring a resulting second voltage across the reference capacitor, and determining a capacitance value of said pad from the measured first and measured second voltages. - View Dependent Claims (10, 11, 12, 13, 14)
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15. A method of calculating the capacitance of two pads connected across a reference capacitor, comprising:
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coupling a first pad and a first terminal of a reference capacitor to a first I/O port of a microcontroller; coupling a second pad and a second terminal of the reference capacitor to a second I/O port of the microcontroller; performing steps in the following order; applying a reference voltage to the first I/O port and the second I/O port in a first state; directly from said first state, grounding one terminal of said reference capacitor not connected to the first pad while removing the reference voltage from the respective other terminal to create a circuit comprising said reference capacitor coupled in series with said first pad; and measuring a first resulting voltage across said reference capacitor, said first resulting voltage corresponding to the capacitance value of said first pad; and thereafter the method further comprises steps in the following order; applying the reference voltage to the first I/O port and the second I/O port; grounding one terminal of said reference capacitor not connected to the second pad while removing the reference voltage from the respective other terminal to create a circuit comprising said reference capacitor coupled in series with said second pad; and measuring a second resulting voltage across said reference capacitor, said second resulting voltage corresponding to the capacitance value of said second pad.
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16. A system for measuring capacitance, comprising:
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a reference capacitor connected to a first node and to a second node, wherein first and second nodes are external I/O pins of a microcontroller; each said node connected to a first and second switching unit of the microcontroller operable to apply or remove a reference voltage or ground to one of said nodes; a first pad connected to the first node; a second pad connected to the second node; and an analog to digital converter of the microcontroller operable to measure a voltage between the first node and second node, wherein for measuring a capacitance of the first and second pad, the first and second switching units are controlled to apply the reference voltage simultaneously to said first and said second node in a first state and directly from said first state to remove the reference voltage from said first node and to apply ground to said second node and after a predetermined settling time, to control said analog to digital converter to measure a first voltage at the first node, and thereafter said first and second switching units are controlled to apply the reference voltage to said first and said second node and subsequently to remove the reference voltage from said second node and to apply ground to said first node and after a predetermined settling time, to control said analog to digital converter to measure a second voltage at the second node, wherein the microcontroller determines the capacitance of the first pad from said first voltage and the capacitance of the second pad form said second voltage. - View Dependent Claims (17, 18)
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Specification