Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus
First Claim
1. A charged particle beam device comprising:
- a charged particle beam column comprising;
a charged particle beam generation-focusing portion configured to generate and focus a charged particle beam; and
a deflector configured to perform scanning with the charged particle beam in a two-dimensional direction;
a charged particle beam control unit, which is configured to control the charged particle beam generation-focusing portion and the deflector, and which comprises a digital/analog converter for converting an input digital signal into an analog signal that is to be input to the deflector; and
a field-of-view setting unit configured to set a value of a field of view of the charged particle beam where the scanning by the deflector is performed on the basis of a set value of a slice amount, the field-of-view setting unit being configured to set a value of one-nth of the slice amount, where n is a first natural number, as an input digital value “
1”
of the digital/analog converter and to set a value obtained by multiplying said value set as the input digital value “
1”
by a second natural number as a value of the field of view.
1 Assignment
0 Petitions
Accused Products
Abstract
A cross-section processing observation apparatus includes an ion beam control unit which controls a charged particle beam generation-focusing portion and a deflector, and a DAC which converts an input digital signal into an analog signal which is to be input to the deflector. A field-of-view setting portion sets a value of a field of view of a charged particle beam where the scanning performed by the deflector is performed on the basis of a set value of a slice amount, and the field-of-view setting portion is configured to set a value of one-nth of the slice amount, where n is a first natural number, as an input digital value “1” of the digital/analog converter and to set a value obtained by multiplying said value set as the input digital value “1” by a second natural number as a value of the field of view.
4 Citations
5 Claims
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1. A charged particle beam device comprising:
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a charged particle beam column comprising; a charged particle beam generation-focusing portion configured to generate and focus a charged particle beam; and a deflector configured to perform scanning with the charged particle beam in a two-dimensional direction; a charged particle beam control unit, which is configured to control the charged particle beam generation-focusing portion and the deflector, and which comprises a digital/analog converter for converting an input digital signal into an analog signal that is to be input to the deflector; and a field-of-view setting unit configured to set a value of a field of view of the charged particle beam where the scanning by the deflector is performed on the basis of a set value of a slice amount, the field-of-view setting unit being configured to set a value of one-nth of the slice amount, where n is a first natural number, as an input digital value “
1”
of the digital/analog converter and to set a value obtained by multiplying said value set as the input digital value “
1”
by a second natural number as a value of the field of view. - View Dependent Claims (2, 3, 4)
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5. A control method for a charged particle beam device that comprises a charged particle beam column comprising a charged particle beam generation-focusing portion configured to generate and focus a charged particle beam and a deflector configured to perform scanning with the charged particle beam in a two-dimensional direction;
- a charged particle beam control unit that controls the charged particle beam generation-focusing portion and the deflector that and includes a digital/analog converter for converting an input digital signal into an analog signal that is to be input to the deflector; and
a field-of-view setting unit, the method comprising;using the charged particle beam control unit to control the field-of-view setting unit to set a value of a field of view of a charged particle beam where the scanning by the deflector is performed on the basis of a set value of a slice amount; and using the field-of-view setting unit to set a value of one-nth of the slice amount, where n is a first natural number, as an input digital value “
1”
of the digital/analog converter and to set a value obtained by multiplying said value set as the input digital value “
1”
by a second natural number as a value of the field of view.
- a charged particle beam control unit that controls the charged particle beam generation-focusing portion and the deflector that and includes a digital/analog converter for converting an input digital signal into an analog signal that is to be input to the deflector; and
Specification