Non-contact test system for determining whether electronic device structures contain manufacturing faults
First Claim
1. A method for testing electronic device housing structures under test using a tester that has a test unit and an associated antenna probe, comprising:
- generating radio-frequency test signals with the test unit;
wirelessly transmitting the radio-frequency test signals to the device housing structures under test using the antenna probe;
receiving corresponding radio-frequency test signals from the device housing structures under test using the antenna probe;
providing the received radio-frequency test signals to the test unit from the antenna probe; and
determining from at least the received radio-frequency test signals whether the device housing structures under test contain a fault.
0 Assignments
0 Petitions
Accused Products
Abstract
Electronic device structures such as structures containing antennas, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a non-contact test system. The test system may include a vector network analyzer or other test unit that generates radio-frequency tests signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using an antenna probe that has one or more test antennas. The antenna probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
163 Citations
20 Claims
-
1. A method for testing electronic device housing structures under test using a tester that has a test unit and an associated antenna probe, comprising:
-
generating radio-frequency test signals with the test unit; wirelessly transmitting the radio-frequency test signals to the device housing structures under test using the antenna probe; receiving corresponding radio-frequency test signals from the device housing structures under test using the antenna probe; providing the received radio-frequency test signals to the test unit from the antenna probe; and determining from at least the received radio-frequency test signals whether the device housing structures under test contain a fault. - View Dependent Claims (2, 3, 4, 5, 6)
-
-
7. A method for testing electronic device housing structures under test using test equipment that includes at least one test antenna, comprising:
-
with the test equipment, transmitting radio-frequency test signals to the device housing structures under test using the test antenna; receiving corresponding radio-frequency test signals reflected from the device housing structures under test using the test antenna; and with the test equipment, determining from at least the received radio-frequency signals whether the device housing structures under test contain a fault. - View Dependent Claims (8, 9, 10, 11, 12)
-
-
13. A test system for performing non-contact testing on electronic device housing structures under test, comprising:
-
a test unit that generates radio-frequency test signals; and an antenna with which the radio-frequency test signals are transmitted to the electronic device housing structures under test and with which reflected signals corresponding to the transmitted radio-frequency test signals that are reflected off of the electronic device housing structures under test are received, wherein the test unit is configured to determine whether the electronic device housing structures under test include a fault based on the reflected signals. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
-
Specification