×

Non-contact test system for determining whether electronic device structures contain manufacturing faults

  • US 9,372,228 B2
  • Filed: 09/29/2014
  • Issued: 06/21/2016
  • Est. Priority Date: 04/22/2011
  • Status: Active Grant
First Claim
Patent Images

1. A method for testing electronic device housing structures under test using a tester that has a test unit and an associated antenna probe, comprising:

  • generating radio-frequency test signals with the test unit;

    wirelessly transmitting the radio-frequency test signals to the device housing structures under test using the antenna probe;

    receiving corresponding radio-frequency test signals from the device housing structures under test using the antenna probe;

    providing the received radio-frequency test signals to the test unit from the antenna probe; and

    determining from at least the received radio-frequency test signals whether the device housing structures under test contain a fault.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×