Method and apparatus for performing optical imaging using frequency-domain interferometry

• US 9,377,290 B2
• Filed: 04/18/2014
• Issued: 06/28/2016
• Est. Priority Date: 10/27/2003
• Status: Active Grant

• Current Assignee: The General Hospital Corporation (Mass General Brigham, Inc.)
• Original Assignee: The General Hospital Corporation (Mass General Brigham, Inc.)
• Inventors: Yun, Seok-Hyun, Bouma, Brett Eugene, Tearney, Guillermo J., De Boer, Johannes Fitzgerald
• Primary Examiner(s): Lyons, Michael A
• Application Number:
  US14/256,361
• Publication Number:
  US 20150077755A1
• Time in Patent Office: 802 Days
• US Class Current: 1/1
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: A61B 5/7257 using Fourier transforms
• CPC Class Codes: G01B 2290/45 Multiple detectors for detecting interferometer signals
• CPC Class Codes: G01B 2290/70 Using polarization in the interferometer
• CPC Class Codes: G01B 9/02002 using two or more frequencies
• CPC Class Codes: G01B 9/02004 using frequency scans
• CPC Class Codes: G01B 9/02043 Imaging of the Fourier or pupil or back focal plane, i.e. angle resolved imaging
• CPC Class Codes: G01B 9/02075 of particular errors
• CPC Class Codes: G01B 9/02081 simultaneous quadrature detection, e.g. by spatial phase shifting
• CPC Class Codes: G01B 9/02083 characterised by particular signal processing and presentation
• CPC Class Codes: G01B 9/02084 Processing in the Fourier or frequency domain when not imaged in the frequency domain
• CPC Class Codes: G01B 9/0209 Low-coherence interferometers
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0208 using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/0218 using optical fibers
• CPC Class Codes: G01J 3/0264 Electrical interface; User interface
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: G01J 9/0215 : by shearing interferometric methods
• CPC Class Codes: G01N 21/4795 : spatially resolved investigating of object in scattering medium in vivo A61B
• CPC Class Codes: G02B 26/12 : using multifaceted mirrors
• CPC Class Codes: G02B 27/48 : Laser speckle optics
• CPC Class Codes: G02B 6/3604 : Rotary joints allowing relative rotational movement between opposing fibre or fibre bundle ends
• CPC Class Codes: G02F 1/093 : used as non-reciprocal devices, e.g. optical isolators, circulators G02F1/0955 takes precedence
• CPC Class Codes: G02F 1/11 : based on acousto-optical elements, e.g. using variable diffraction by sound or like mechanical waves acousto-optical deflection G02F1/33
• CPC Class Codes: H01S 3/0071 : Beam steering, e.g. whereby a mirror outside the cavity is present to change the beam direction
• CPC Class Codes: H01S 3/0078 : Frequency filtering
• CPC Class Codes: H01S 3/08009 : using a diffraction grating
• CPC Class Codes: H01S 3/08063 : Graded reflectivity, e.g. variable reflectivity mirror
• CPC Class Codes: H01S 3/105 : by controlling the mutual position or the reflecting properties of the reflectors of the cavity , e.g. by controlling the cavity lengthH01S3/10076, H01S3/13 take precedence
• CPC Class Codes: H01S 3/1068 : using an acousto-optical device
• CPC Class Codes: H01S 5/0071 : for beam steering, e.g. using a mirror outside the cavity to change the beam direction
• CPC Class Codes: H01S 5/0078 : for frequency filtering
• CPC Class Codes: H01S 5/1025 : Extended cavities
• CPC Class Codes: H01S 5/14 : External cavity lasers H01S5/18 takes precedence; mode locking H01S5/065
• CPC Class Codes: H01S 5/141 : using a wavelength selective device, e.g. a grating or etalon H01S5/146 takes precedence
• CPC Class Codes: H01S 5/146 : using a fiber as external cavity
• CPC Class Codes: H01S 5/5045 : the arrangement having a frequency filtering function

Abstract

An apparatus and method are provided. In particular, a radiation can be provided which includes at least one first electro-magnetic radiation directed to a sample and at least one second electro-magnetic radiation directed to a reference, whereas a frequency of the radiation varies over time. An interference between at least one third radiation associated with the first radiation(s) and at least one fourth radiation associated with the second radiation(s) can be detected to generate an electrical first signal. A second signal associated with at least one phase of at least one frequency component of the electrical first signal can be obtained. Further, comparison data can be generated by comparing the second signal to at least one particular information.

Claims

1. An apparatus, comprising:

at least one first arrangement including a light source that is configured to provide a radiation which includes at least one first electro-magnetic radiation directed to a sample and at least one second electro-magnetic radiation directed to a reference, wherein the light source causes a frequency of the radiation provided by the at least one first arrangement to vary over time;

at least one second arrangement including a detector that is configured to detect an interference between at least one third radiation associated with the at least one first radiation and at least one fourth radiation associated with the at least one second radiation to generate an electrical first signal, wherein the at least one second arrangement is configured to obtain a second signal associated with at least one phase of at least one frequency component of the electrical first signal; and

a computer which generates comparison data by comparing the second signal to at least one particular information.

2. The apparatus according to claim 1, wherein the at least one second arrangement is configured to determine a third signal associated with at least one further phase of at least one further frequency component of the electrical first signal, and wherein the at least one particular information is the third signal.

3. The apparatus according to claim 1,

wherein the at least one second arrangement is configured to determine a third signal associated with at least one further phase of at least one further frequency component of a further electrical signal, the further electrical signal being different from the electrical first signal, and

wherein the at least one particular information is the third signal.

4. The apparatus according to claim 3, wherein the electrical first signal and the further electrical signal are obtained at different times.

5. The apparatus according to claim 3, wherein the electrical first signal and the further electrical signal are obtained at different locations of the sample.

6. The apparatus according to claim 1, further comprising

at least one structural third arrangement including an interferometer that is configured to generate a third signal associated with the radiation, wherein the at least one second arrangement is configured to provide the at least one particular information based on the third signal.

7. The apparatus according to claim 1, further comprising at least one structural third arrangement including an interferometer that is configured to receive at least one portion of the radiation, and provide a further radiation so as to generate a third signal, wherein at least one of the second signal or the at least one particular information is associated with the further radiation.

8. The apparatus according to claim 1, wherein the at least one second arrangement is configured to detect a third signal corresponding to the electrical first signal between the at least one third and fourth radiations, and wherein the second signal is associated with at least one phase of at least one frequency component of an additional electrical signal associated with the third signal.

9. A method comprising:

providing a radiation which includes at least one first electro-magnetic radiation directed to a sample and at least one second electro-magnetic radiation directed to a reference, wherein a frequency of the radiation varies over time;

detecting an interference between at least one third radiation associated with the at least one first radiation and at least one fourth radiation associated with the at least one second radiation to generate an electrical first signal;

obtaining a second signal associated with at least one phase of at least one frequency component of the electrical first signal; and

generating comparison data by comparing the second signal to at least one particular information.

10. The method according to claim 9, further comprising determining a third signal associated with at least one further phase of at least one further frequency component of the electrical first signal, and wherein the at least one particular information is the third signal.

11. The method according to claim 9, further comprising:

determining a third signal associated with at least one further phase of at least one further frequency component of a further electrical signal, the further electrical signal being different from the electrical first signal,

wherein the at least one particular information is the third signal.

12. The method according to claim 11, wherein the electrical first signal and the further electrical signal are obtained at different times.

13. The method according to claim 11, wherein the electrical first signal and the further electrical signal are obtained at different locations of the sample.

14. The method according to claim 9, further comprising detecting a third signal corresponding to the electrical first signal between the third and fourth radiations, wherein the third signal is associated with at least one phase of at least one frequency component of an additional electrical signal associated with the third signal.

15. A system comprising:

at least one arrangement including (i) a detector that is configured to detect an interference between at least one first radiation associated with a first split portion of a radiation received from a sample and a second split portion of the radiation received from a reference and (ii) a computer configured to cause a generation of an electrical first signal associated with the interference, wherein a frequency of the radiation varies over time, and wherein the at least one arrangement including an interferometer that is configured to obtain a second signal associated with at least one phase of at least one frequency component of the electrical first signal, and wherein the computer generates comparison data by comparing the second signal to at least one particular information.

16. The apparatus according to claim 15, wherein the detector is configured to detect a third signal corresponding to the electrical first signal between the first and second split portions of the radiation, and wherein the second signal is associated with at least one phase of at least one frequency component of an additional electrical signal associated with the third signal.