Systems and methods for sub-zero threshold characterization in a memory cell
First Claim
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1. A memory system, the system comprising:
- a memory cell characterization circuit operable to;
program a first cell of a solid state memory device to a negative voltage;
program a second cell of the solid state memory device to a positive voltage, wherein the second cell is adjacent to the first cell;
calculate a voltage shift on the negative voltage programmed to the first cell, the voltage shift occurring based on inter-cell interference on the programmed first cell when the second cell is being programmed;
characterize a shifted voltage level on the first cell as an interim voltage; and
subtract the voltage shift from the interim voltage to yield an actual voltage on the first cell.
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Abstract
Systems and methods relating generally to data processing, and more particularly to systems and methods for characterizing a solid state memory. In one embodiment, the systems and methods may include programming a first cell of a solid state memory device to a negative voltage, programming a second cell of the solid state memory device to a positive voltage, wherein the second cell is adjacent to the first cell, calculating a voltage shift on the negative voltage programmed to the first cell, characterizing a shifted voltage level on the first cell as an interim voltage, and subtracting the voltage shift from the interim voltage to yield an actual voltage on the first cell.
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Citations
20 Claims
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1. A memory system, the system comprising:
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a memory cell characterization circuit operable to; program a first cell of a solid state memory device to a negative voltage; program a second cell of the solid state memory device to a positive voltage, wherein the second cell is adjacent to the first cell; calculate a voltage shift on the negative voltage programmed to the first cell, the voltage shift occurring based on inter-cell interference on the programmed first cell when the second cell is being programmed; characterize a shifted voltage level on the first cell as an interim voltage; and subtract the voltage shift from the interim voltage to yield an actual voltage on the first cell. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method for characterizing a solid state memory device, the method comprising:
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programming a negative voltage to a first cell of a solid state memory device; programming a positive voltage to a second cell of the solid state memory device, wherein the second cell is adjacent to the first cell; calculating a voltage shift on the negative voltage programmed to the first cell, the voltage shift occurring based on inter-cell interference on the programmed first cell when the second cell is being programmed; characterizing a shifted voltage level on the first cell as an interim voltage; and subtracting the voltage shift from the interim voltage to yield an actual voltage on the first cell. - View Dependent Claims (15, 16, 17, 18)
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19. An electronic device, the electronic device including:
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a solid state memory device; and a memory cell characterization circuit operable to; program a first cell of a solid state memory device to a negative voltage; program a second cell of the solid state memory device to a positive voltage, wherein the second cell is adjacent to the first cell; calculate a voltage shift on the negative voltage programmed to the first cell, the voltage shift occurring based on inter-cell interference on the programmed first cell when the second cell is being programmed; characterize a shifted voltage level on the first cell as an interim voltage; and subtract the voltage shift from the interim voltage to yield an actual voltage on the first cell. - View Dependent Claims (20)
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Specification