Systems and methods for correcting fabrication error in magnetic recording heads using magnetic write width measurements
First Claim
1. A method of correcting for fabrication error in magnetic recording heads, the method comprising:
- separating a wafer into a plurality of sections, each section containing a plurality of row bars, each row bar comprising a plurality of magnetic recording heads;
selecting a first row bar from a plurality of row bars of a first section of the plurality of sections;
lapping the first row bar to form a plurality of sliders;
performing a test of a magnetic write width (MWW) on each of the plurality of sliders;
calculating a first error profile for the first row bar based on results of the magnetic write width tests;
generating a second error profile for a stripe height of a component of the plurality of sliders based on the first error profile, wherein the component is selected from the group consisting of a magnetic read head and a magnetic write head; and
lapping a second row bar from the plurality of row bars of the first section using the second error profile.
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Abstract
Systems and methods for correcting fabrication error in magnetic recording heads using magnetic write width (MWW) measurements are provided. One such method includes separating a wafer into sections containing row bars, each row bar including magnetic recording heads, selecting a first row bar from a first section of the sections, lapping the first row bar to form sliders, performing a test of a magnetic write width (MWW) on each of the sliders, calculating a first error profile for the first row bar based on results of the magnetic write width tests, generating a second error profile for a stripe height of a component of the sliders based on the first error profile, where the component is selected from a magnetic read head and a magnetic write head, and lapping a second row bar from the row bars of the first section using the second error profile.
220 Citations
17 Claims
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1. A method of correcting for fabrication error in magnetic recording heads, the method comprising:
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separating a wafer into a plurality of sections, each section containing a plurality of row bars, each row bar comprising a plurality of magnetic recording heads; selecting a first row bar from a plurality of row bars of a first section of the plurality of sections; lapping the first row bar to form a plurality of sliders; performing a test of a magnetic write width (MWW) on each of the plurality of sliders; calculating a first error profile for the first row bar based on results of the magnetic write width tests; generating a second error profile for a stripe height of a component of the plurality of sliders based on the first error profile, wherein the component is selected from the group consisting of a magnetic read head and a magnetic write head; and lapping a second row bar from the plurality of row bars of the first section using the second error profile. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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Specification