Systems and methods for reducing copper contamination due to substrate processing chambers with components made of alloys including copper
First Claim
1. A method for reducing copper contamination in a substrate processing system, comprising:
- performing a plasma process on a substrate in a processing chamber of a substrate processing system,wherein a component located in the processing chamber is made of an alloy including copper,wherein the plasma process uses a process gas mixture including molecular hydrogen; and
prior to performing the plasma process on the substrate and before the substrate is arranged in the processing chamber, conditioning the component in the processing chamber using a conditioning plasma process that includes a process gas mixture including molecular oxygen and forming gas.
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Abstract
Systems and methods for reducing copper contamination in a substrate processing system include performing a plasma process on a substrate in a processing chamber of a substrate processing system. A component is located in the processing chamber and is made of an alloy including copper. The plasma process uses a process gas mixture including molecular hydrogen. Prior to performing the plasma process on the substrate and before the substrate is arranged in the processing chamber, the component is conditioned in the processing chamber using a conditioning plasma process that includes a process gas mixture including molecular oxygen and forming gas.
7 Citations
20 Claims
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1. A method for reducing copper contamination in a substrate processing system, comprising:
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performing a plasma process on a substrate in a processing chamber of a substrate processing system, wherein a component located in the processing chamber is made of an alloy including copper, wherein the plasma process uses a process gas mixture including molecular hydrogen; and prior to performing the plasma process on the substrate and before the substrate is arranged in the processing chamber, conditioning the component in the processing chamber using a conditioning plasma process that includes a process gas mixture including molecular oxygen and forming gas. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A substrate processing system, comprising:
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a processing chamber; a component located in the processing chamber that is made of an alloy including copper; a plasma generator configured to generate plasma in the processing chamber; a gas delivery system configured to selectively deliver forming gas, molecular oxygen and/or molecular hydrogen to the processing chamber; and a controller that communicates with the gas delivery system and the plasma generator, and that is configured to; prior to performing a plasma process on a substrate in the processing chamber using a process gas mixture including molecular hydrogen and before the substrate is arranged in the processing chamber, condition the component in the processing chamber using a conditioning plasma process that includes a process gas mixture including the molecular oxygen and the forming gas; and perform the plasma process on the substrate. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification