Reduced power consumption method for sampling parameters within a TPMS

• US 9,399,375 B2
• Filed: 11/13/2012
• Issued: 07/26/2016
• Est. Priority Date: 11/15/2011
• Status: Active Grant

• Current Assignee: Schrader Electronics Limited (Sensata Technologies Holding Plc)
• Original Assignee: Schrader Electronics Limited (Sensata Technologies Holding Plc)
• Inventors: Strahan, Samuel, Smith, Gary
• Primary Examiner(s): MULLEN, THOMAS J
• Application Number:
  US14/357,521
• Publication Number:
  US 20140300460A1
• Time in Patent Office: 1,351 Days
• Field of Search: 340442-448, 731/462, 731/464, 731/465
• US Class Current: 1/1
• CPC Class Codes: B60C 23/04 mounted on the wheel or tyre
• CPC Class Codes: B60C 23/0474 Measurement control, e.g. setting measurement rate or calibrating of sensors; Further processing of measured values, e.g. filtering, compensating or slope monitoring
• CPC Class Codes: G01L 17/00 Devices or apparatus for measuring tyre pressure or the pressure in other inflated bodies

Abstract

An apparatus for measuring parameter values from an electrical input signal comprises a signal sampling device operable to sample the input signal and to produce a corresponding output comprising a measured parameter value; a signal level detector configured to detect changes in the level of the input signal by more than a threshold amount; and a controller co-operable with the signal sampling device and the signal level detector. The controller is configured to operate the signal sampling device to sample the input signal in response to the signal level detector detecting a change in the input signal level by more than the threshold amount.

Claims

1. An apparatus for measuring parameter values from an electrical input signal, the apparatus configured to obtain a respective parameter value for each of a plurality of sampling periods, and the apparatus comprising:

a signal sampling device operable to sample said input signal and to produce a corresponding output comprising a measured parameter value;

a signal level detector configured to detect changes in the level of said input signal by more than a threshold amount; and

a controller co-operable with said signal sampling device and said signal level detector and being configured to operate said signal sampling device to sample said input signal in response to said signal level detector detecting the changes in said input signal level by more than said threshold amount, wherein, for sampling periods in respect of which said signal level detector detects a change in said input signal level by more than said threshold amount, said controller is configured to obtain said respective parameter value by operating said signal sampling device to sample said input signal, and for sampling periods in respect of which said signal level detector does not detect a change in said input signal level by more than said threshold amount, said controller is configured to use a previously obtained parameter value as said respective parameter value.

2. The apparatus as claimed in claim 1, wherein said previously obtained parameter value comprises the respective parameter value obtained for the previous sampling period.

3. The apparatus as claimed in claim 1, wherein said signal level detector is configured to detect said changes in the level of said input signal with respect to a base level, and wherein after causing said signal sampling device to sample said input signal, said controller is configured to recalibrate said apparatus such that said base level is adjusted.

4. The apparatus as claimed in claim 3, wherein said recalibration involves adjusting said base level by an amount determined by the detected changes in the level of said input signal.

5. The apparatus as claimed in claim 4, wherein said recalibration involves adjusting said base level by an amount of substantially equal magnitude and opposite sense to the detected changes in the level of said input signal.

6. The apparatus as claimed in claim 3, wherein said controller is configured to cause a DC offset to be applied to said input signal level in order to adjust said base level.

7. The apparatus as claimed in claim 6, wherein the amount of said DC offset is determined by the detected changes in the level of said input signal.

8. The apparatus as claimed in claim 7, wherein the amount of said DC offset is of substantially equal magnitude and opposite sense to the detected changes in the level of said input signal.

9. The apparatus as claimed in claim 6, further including signal processing circuitry arranged to supply said input signal to said signal level detector and being configured to apply an adjustable DC offset to said input signal under the control of said controller.

10. The apparatus as claimed in claim 9, wherein said signal processing circuitry comprises at least one amplifier.

11. The apparatus as claimed in claim 10, wherein said signal processing circuitry comprises a plurality of amplifiers, wherein the amplifiers are arranged in series with one another, each being configurable to apply a respective portion of said DC offset to said input signal.

12. The apparatus as claimed in claim 6, wherein said controller is arranged to determine the amount of said DC offset by an iterative process in which said controller causes an initial DC offset to be applied and subsequently adjusted until said input signal level is above a lower threshold level and below an upper threshold level.

13. The apparatus as claimed in claim 12, wherein, after said iterative process, said controller is arranged to further adjust the amount of said DC offset until said signal level detector detects that said DC offset meets said lower threshold level or meets said upper threshold level, and to select the amount of said DC offset by averaging the subsequently adjusted DC offsets that cause said signal level detector to detect that said DC offset meets said upper threshold level or said lower threshold level.

14. The apparatus as claimed in claim 12, wherein said controller is configured to control said signal processing circuitry using at least one digital-to-analogue converter (DAC) by configuring input bits of said at least one DAC to produce an output signal indicative of the amount of said DC offset, said output signal being supplied in use to said signal processing circuitry.

15. The apparatus as claimed in claim 14, wherein said controller is configured to implement said iterative process by, starting with the most significant bit of said DAC, setting successive bits of said at least one DAC one at a time until a detected change in said input signal level is above said at least one threshold amount.

16. The apparatus as claimed in claim 15, wherein said controller is further configured to, when adjusting said DC offset in respect of one of said upper and lower threshold levels, reset the most recently set bit of said at least one DAC upon determining that said input signal level is below said lower threshold level or above said upper threshold level.

17. The apparatus as claimed in claim 6, wherein said controller is arranged to determine the amount of said DC offset from the value of said sampled input signal.

18. The apparatus as claimed in claim 3, wherein said controller is arranged to determine by how much to adjust said base level from the value of said sampled input signal.

19. The apparatus as claimed in claim 1, wherein said signal level detector is configured to detect when said input signal level is below a lower absolute threshold level or above an upper absolute threshold level.

20. The apparatus as claimed in claim 19, wherein said controller is configured to recalibrate said apparatus by adjusting said at least one absolute threshold level.

21. The apparatus as claimed in claim 1, wherein said signal level detector is configured to detect when said input signal level is below a lower relative threshold level or above an upper relative threshold level.

22. The apparatus as claimed in claim 1, wherein said signal level detector comprises a window comparator.

23. The apparatus as claimed in claim 1, wherein said signal sampling device comprises an analogue-to-digital converter (ADC).

24. A tire monitoring apparatus comprising an apparatus for measuring parameter values from an electrical input signal, the apparatus for measuring parameter values configured to obtain a respective parameter value for each of a plurality of sampling periods and, the apparatus for measuring parameter values from said electrical input signal comprising:

a signal sampling device operable to sample said input signal and to produce a corresponding output comprising a measured parameter value;

a signal level detector configured to detect changes in the level of said input signal by more than a threshold amount; and

a controller co-operable with said signal sampling device and said signal level detector and being configured to operate said signal sampling device to sample said input signal in response to said signal level detector detecting a change in said input signal level by more than said threshold amount, wherein, for sampling periods in respect of which said signal level detector detects a change in said input signal level by more than said threshold amount, said controller is configured to obtain said respective parameter value by operating said signal sampling device to sample said input signal, and for sampling periods in respect of which said signal level detector does not detect a change in said input signal level by more than said threshold amount, said controller is configured to use a previously obtained parameter value as said respective parameter value.

25. The tire monitoring apparatus as claimed in claim 24, wherein said electrical input signal is derived from at least one sensor for monitoring at least one characteristic of said tire, wherein the monitored at least one characteristic comprises the pressure and/or temperature of the tire.

26. A method of measuring parameter values from an electrical input signal, the method comprising:

detecting changes in the level of said input signal by more than a threshold amount;

operating a signal sampling device to sample said input signal in response to a signal level detector detecting a change in said input signal level by more than said threshold amount; and

obtaining a respective parameter value for each of a plurality of sampling periods,

wherein, for sampling periods in respect of which said signal level detector detects a change in said input signal level by more than said threshold amount, obtaining said respective parameter value by operating said signal sampling device to sample said input signal, and for sampling periods in respect of which said signal level detector does not detect a change in said input signal level by more than said threshold amount, using a previously obtained parameter value as said respective parameter value.