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Extracting comprehensive design guidance for in-line process control tools and methods

  • US 9,400,865 B2
  • Filed: 06/10/2015
  • Issued: 07/26/2016
  • Est. Priority Date: 06/13/2014
  • Status: Active Grant
First Claim
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1. A computer-implemented method for generating information for setting up process control for a wafer, comprising:

  • automatically identifying potential marginalities in a design for a device to be formed on a wafer; and

    automatically generating information for the potential marginalities, wherein the automatically generated information is used to set up process control for the wafer, and wherein said automatically identifying and said automatically generating are performed by one or more computer systems.

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