Terahertz spectrometer with phase modulation

• US 9,404,853 B1
• Filed: 04/25/2014
• Issued: 08/02/2016
• Est. Priority Date: 04/25/2014
• Status: Active Grant

• Current Assignee: Joseph R. Demers
• Original Assignee: Joseph R. Demers
• Inventors: Demers, Joseph R., Kasper, Bryon L.
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): Faye, Mamadou
• Application Number:
  US14/262,291
• Time in Patent Office: 830 Days
• US Class Current: 1/1
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01J 3/433 Modulation spectrometry; Derivative spectrometry
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 21/3586 by Terahertz time domain spectroscopy [THz-TDS]

Abstract

A highly advantageous terahertz spectrometer with phase modulation and associated method are disclosed which utilize a second harmonic for generating an error signal to control a phase modulator to at least reduce nulls of an interference pattern.

Claims

1. A terahertz frequency spectrometer for identifying a terahertz frequency spectral characteristic of a material in a sampling region, comprising:

a terahertz source for generating a first terahertz signal and transmitting a terahertz electromagnetic radiation beam, based on the first terahertz signal, to the sampling region such that a characterized terahertz radiation is produced by an interaction of the terahertz electromagnetic radiation beam with the material in the sampling region, the characterized terahertz radiation including the terahertz frequency spectral characteristic related to the material;

a terahertz detector for generating a second terahertz signal and for receiving the characterized terahertz electromagnetic radiation from the sampling region and producing a characterized terahertz signal responsive to the received radiation, the terahertz detector mixing the characterized terahertz signal and the second terahertz signal to produce a characterized detector signal;

a phase modulator for applying a phase modulation in a way that modulates the phase of at least one of the first terahertz signal and second terahertz signal in a periodic manner at a modulating frequency, wherein the phase modulator modulates the phase relative to a phase offset that is a difference between the phases of the characterized terahertz signal and the second terahertz signal, and wherein the characterized detector signal includes a characterized signal component related to the characteristic of the material, and a first harmonic signal component at a first harmonic of the modulating frequency resulting from the phase modulation, and a second harmonic signal component at a second harmonic of the modulating frequency resulting, at least in part, from the phase offset;

a characteristic detector for extracting the characterized signal component from the detector signal to identify the terahertz frequency spectral characteristic of the material in the sampling region, the extracted characterized signal component defining a characterized power curve that includes nulls which are reduced power levels at certain frequencies related to the second harmonic signal component of the detector signal; and

a phase offset controller for controlling the phase offset using the second harmonic signal component such that the nulls are, at least in part, removed from the characterized power curve.

2. The terahertz frequency spectrometer as defined in claim 1, further comprising:

a first laser for generating a first laser light; and

a second laser for generating a second laser light, and wherein the terahertz source is configured to receive the first and second laser lights and to generate the first terahertz signal based on the first and second laser lights, and the terahertz detector is configured to receive the first and second laser lights and to generate the second terahertz signal based on the first and second laser lights at the same frequency as the first terahertz signal, and wherein the phase modulator is an optical phase modulator that is configured to apply the phase modulation to modulate the phase difference between the first and second laser lights to modulate the phase of the terahertz signal.

3. The terahertz frequency spectrometer as defined in claim 2, further comprising:

a laser frequency controller for controlling the frequency of at least one of the first and second laser lights such that the frequency of the first and second terahertz signals changes over a time period.

4. The terahertz frequency spectrometer as defined in claim 3, wherein the laser frequency controller is configured to control the laser light frequency to sweep the frequency of the terahertz signal through a range of frequencies during the time period.

5. The terahertz frequency spectrometer as defined in claim 2, wherein the phase offset controller is an optical phase offset controller that is configured to control the phase of at least one of the first and second laser lights to control the phase offset between the characterized terahertz signal and the second terahertz signal.

6. The terahertz frequency spectrometer as defined in claim 1, further comprising:

a lock in amplifier for producing a phase offset control signal based on the second harmonic signal component of the detector signal, and wherein the phase offset controller is configured to receive the phase offset control signal from the lock in amplifier and to control the phase offset based on the phase offset control signal to remove the nulls from the characterized power curve.

7. The terahertz frequency spectrometer as defined in claim 6, wherein the characteristic detector is a first harmonic lock in amplifier that detects the first harmonic frequency for extracting the characterized signal component from the detector signal.

8. The terahertz frequency spectrometer as defined in claim 7, wherein the phase offset controller is configured to control the phase offset to reduce the second harmonic signal component to thereby reduce the nulls in the detector signal.

9. The terahertz frequency spectrometer as defined in claim 1, wherein the phase offset controller controls the phase offset to maintain the phase offset at approximately zero degrees.

10. The terahertz frequency spectrometer as defined in claim 1, wherein the phase modulator periodically modulates the phase of the terahertz signal 180 degrees.

11. The terahertz frequency spectrometer as defined in claim 10, wherein the phase modulator periodically modulates the phase of the terahertz signal between −

90 degrees and +90 degrees relative to the phase offset.

12. A terahertz frequency spectrometer for identifying a terahertz frequency spectral characteristic of a material in a sampling region, comprising:

a terahertz beam source for generating a terahertz beam that passes through the sampling region thereby producing a characterized terahertz radiation that is influenced by the material;

a local oscillator generator for generating a terahertz local oscillator signal at the same frequency as the terahertz beam;

a phase modulator for applying a phase modulation in a way that modulates the phase of at least one of the terahertz beam and terahertz local oscillator signal based on a modulation input;

a mixer for producing an output signal based on the characterized terahertz radiation and the terahertz local oscillator signal that can exhibit a pattern of nulls resulting from the phase modulation and which includes a first harmonic that characterizes the terahertz spectral characteristic of the sample; and

a lock in amplifier for detecting a second harmonic of the output signal to produce an error signal for driving the modulation input based on the error signal to at least reduce the nulls.