Methods and systems for non-destructive inspection

• US 9,404,904 B2
• Filed: 02/12/2014
• Issued: 08/02/2016
• Est. Priority Date: 11/05/2013
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Puckett, Edward L., Savol, Andrej M.
• Primary Examiner(s): CAPUTO, LISA M
• Assistant Examiner(s): Woodward, Nathaniel T
• Application Number:
  US14/179,461
• Publication Number:
  US 20150122055A1
• Time in Patent Office: 902 Days
• Field of Search: 738/65, 736/01, 738/658, 345/8
• US Class Current: 1/1
• CPC Class Codes: A61B 5/065 Determining position of the probe employing exclusively positioning means located on or in the probe, e.g. using position sensors arranged on the probe
• CPC Class Codes: G01N 27/90 using eddy currents
• CPC Class Codes: G01N 29/04 Analysing solids using acoustic emission techniques G01N29/14
• CPC Class Codes: G01N 29/0654 Imaging
• CPC Class Codes: G01N 29/225 Supports, positioning or alignment in moving situation
• CPC Class Codes: G01N 29/265 by moving the sensor relative to a stationary material
• CPC Class Codes: G01N 33/00 Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00

Abstract

Disclosed non-destructive inspection methods comprise non-contact determination of the location of a non-destructive inspection probe and identification of the location on a test structure where test data is acquired by the probe. Determination may include capturing the positions of the probe and the test structure with one or more electronic cameras. Identification may include associating the acquired test data with the location of the probe relative to the test structure. Further, methods may comprise visualization of the test data relative to the identified location. Disclosed non-destructive inspection systems comprise a probe, one or more electronic cameras, a computer, and a display, together configured to determine the location of the probe, to acquire test data with the probe, to identify a location on a test structure associated with the test data, and to visualize the test data in relation to the test structure.

Claims

1. A method of non-destructive inspection of a test structure that is an aerospace component, the method comprising:

determining a location of a hand-held probe relative to the test structure, wherein the determining includes non-contact capturing, with a head-mounted electronic camera, a position of the hand-held probe and a position of the test structure, wherein the hand-held probe includes at least one of an electrical current sensor, an electrical voltage sensor, an eddy current sensor, a sonic transducer, and an ultrasonic transducer;

acquiring, with the hand-held probe, test data relating to the test structure, wherein the test data relating to the test structure includes at least one of electrical conductivity, magnetic permeability, physical continuity, thickness, and a physical characteristic, and wherein the test data relating to the test structure relates to a presence of an anomaly;

identifying a location on the test structure where the test data is acquired by correlating the test data and the location of the hand-held probe relative to the test structure; and

visualizing, on a head-mounted display, the test data in relation to the test structure;

wherein a location of the head-mounted electronic camera varies with respect to the hand-held probe and the test structure while determining the location of the hand-held probe, and wherein the determining includes compensating for variations in the location of the electronic camera.

2. A method of non-destructive inspection of a test structure that is an aerospace component, the method comprising:

determining a location of a hand-held probe relative to the test structure, wherein the determining includes non-contact capturing of a position of the hand-held probe and non-contact capturing of a position of the test structure, wherein the hand-held probe includes at least one of an electrical current sensor, an electrical voltage sensor, an eddy current sensor, a sonic transducer, and an ultrasonic transducer;

acquiring, with the hand-held probe, test data relating to the test structure, wherein the test data relating to the test structure includes at least one of electrical conductivity, magnetic permeability, physical continuity, thickness, and a physical characteristic, and wherein the test data relating to the test structure relates to a presence of an anomaly; and

identifying a location on the test structure where the test data is acquired by associating the test data and the location of the hand-held probe relative to the test structure.

3. The method of claim 2, wherein the capturing the position of the probe and the capturing the position of the test structure are performed at least partially concurrently.

4. The method of claim 2, wherein the determining the location of the probe and the acquiring test data are performed at least partially concurrently.

5. The method of claim 2, wherein the determining includes using an electronic camera to determine the relative location of the probe and the test structure.

6. The method of claim 5, wherein a location of the electronic camera varies with respect to the probe and the test structure while determining the location of the probe, and wherein the determining includes compensating for variations in the location of the electronic camera.

7. The method of claim 5, wherein the using the electronic camera includes using a plurality of electronic cameras.

8. The method of claim 5, wherein the using the electronic camera includes wearing the electronic camera.

9. The method of claim 2, wherein the determining the location includes identifying a reference indicator of at least one of the probe and the test structure.

10. The method of claim 9, wherein the reference indicator is at least one of a fiducial feature and a marker.

11. The method of claim 9, wherein the probe includes a reference indicator configured to aid tracking of the probe.

12. The method of claim 9, wherein the test structure includes a reference indicator configured to aid tracking of the test structure.

13. The method of claim 2, further comprising:

adding one or more markers to the probe to aid tracking of the probe.

14. The method of claim 2, further comprising:

adding one or more markers to the test structure to aid tracking of the test structure.

15. The method of claim 2, wherein the test structure is an aerospace component forming at least part of an aerospace vehicle.

16. The method of claim 2, wherein the acquiring test data includes non-destructively measuring a property of the test structure with the probe.

17. The method of claim 2, further comprising:

visualizing the test data in relation to the test structure.

18. The method of claim 17, wherein the visualizing is performed at least partially concurrently with the acquiring test data.

19. The method of claim 2, wherein the associating includes correlating a data stream including the test data and a data stream including the location of the probe.

20. The method of claim 2, wherein the probe is a first probe, and further comprising:

determining a location of a second probe relative to the test structure, wherein the determining includes non-contact capturing of a position of the second probe and non-contact capturing of the position of the test structure;

acquiring test data relating to the test structure with the second probe;

identifying a location on the test structure where the test data is acquired with the second probe by associating the test data acquired with the second probe and the location of the second probe relative to the test structure; and

associating the test data acquired with the first probe with the test data acquired with the second probe at substantially the same location on the test structure.

21. A non-transitory computer readable medium, comprising computer-executable instructions that, when executed, direct a computer to perform the method of claim 2.

22. The method of claim 2, further comprising:

repeating the determining the location of the hand-held probe for a plurality of probe locations and recording a determination time for each probe location;

repeating the acquiring the test data for a plurality of test data points and recording an acquisition time for each test data point of the plurality of test data points; and

wherein the associating includes associating test data points and locations recorded at substantially the same time.

23. A system for non-destructive inspection of a test structure, the system comprising:

a hand-held probe configured to acquire test data relating to the test structure, wherein the test structure is an aerospace component, wherein the hand-held probe includes at least one of an electrical current sensor, an electrical voltage sensor, an eddy current sensor, a sonic transducer, and an ultrasonic transducer, wherein the test data relating to the test structure includes at least one of electrical conductivity, magnetic permeability, physical continuity, thickness, and a physical characteristic, and wherein the test data relating to the test structure relates to a presence of an anomaly;

one or more electronic cameras configured to capture the position of the hand-held probe and the position of the test structure;

a computer configured to determine a location of the hand-held probe relative to the test structure based upon the captured position of the hand-held probe and the captured position of the test structure, to acquire the test data from the hand-held probe, and to identify a location on the test structure where the test data is acquired by associating the acquired test data and the location of the hand-held probe relative to the test structure; and

a display configured to visualize the test data.

24. The system of claim 23, wherein the display is configured to view, in conjunction with the visualized test data, at least a portion of the test structure associated with the location of the probe when the test data is acquired.

25. The system of claim 23, wherein the display is configured to visualize, in conjunction with the visualized test data, at least a portion of the test structure associated with the location of the probe when the test data is acquired.

26. The system of claim 23, wherein one electronic camera is configured to capture the position of the probe and the position of the test structure.