Low noise and low power passive sampling network for a switched-capacitor ADC with a slow reference generator

• US 9,411,987 B2
• Filed: 08/14/2015
• Issued: 08/09/2016
• Est. Priority Date: 08/18/2014
• Status: Active Grant

• Current Assignee: Qualcomm, Inc.
• Original Assignee: Qualcomm, Inc.
• Inventors: Alladi, Dinesh Jagannath, Guo, Yuhua
• Primary Examiner(s): JEAN PIERRE, PEGUY
• Application Number:
  US14/826,928
• Publication Number:
  US 20160048707A1
• Time in Patent Office: 361 Days
• Field of Search: 341/143, 341/144, 341/155, 341/122, 341/163, 341/172
• US Class Current: 1/1
• CPC Class Codes: G06G 7/186 using an operational amplifier comprising a capacitor or a resistor in the feedback loop
• CPC Class Codes: G06G 7/1865 with initial condition setting
• CPC Class Codes: H03M 3/32 with special provisions or arrangements for power saving, e.g. by allowing a sleep mode, using lower supply voltage for downstream stages, using multiple clock domains, by selectively turning on stages when needed
• CPC Class Codes: H03M 3/342 by double sampling, e.g. correlated double sampling
• CPC Class Codes: H03M 3/344 by filtering other than the noise-shaping inherent to delta-sigma modulators, e.g. anti-aliasing
• CPC Class Codes: H03M 3/496 Details of sampling arrangements or methods
• CPC Class Codes: H03M 3/50 Digital/analogue converters using delta-sigma modulation as an intermediate step digital delta-sigma modulators per se H03M7/3004

Abstract

Certain aspects of the present disclosure provide various sampling networks for switched-capacitor integrators, which may be used in switched-capacitor analog-to-digital converters (ADCs). Rather than having both an input sampling capacitor and a reference sampling capacitor, certain aspects of the present disclosure use a shared sampling capacitor for the reference voltage and the input voltage, thereby reducing ADC input-referred noise, decreasing op amp area and power, and avoiding anti-aliasing filter insertion loss. Furthermore, by sampling the reference voltage during the sampling phase and sampling the input voltage during the integration phase using the shared sampling capacitor, a high-bandwidth reference buffer need not be used for the reference voltage.

Claims

1. A switched-capacitor integrator, comprising:

an amplifier having first and second output nodes and first and second input nodes;

a first integration capacitor coupled between the first output node and the first input node;

a second integration capacitor coupled between the second output node and the second input node;

first and second sampling capacitors, each having a first terminal and a second terminal;

a first set of switches configured to

connect reference voltage nodes with the first terminals of the first and second sampling capacitors during a sampling phase of the integrator; and

short the second terminals of the first and second sampling capacitors together during the sampling phase; and

a second set of switches configured, during an integration phase of the integrator, to connect;

input voltage nodes with the first terminals of the first and second sampling capacitors; and

the first and second input nodes of the amplifier with the second terminals of the first and second sampling capacitors, wherein the first set of switches is open during the integration phase and wherein the second set of switches is open during the sampling phase.

2. The integrator of claim 1, wherein the reference voltage nodes comprise a positive reference voltage node and a negative reference voltage node and wherein the input voltage nodes comprise a positive input voltage node and a negative input voltage node.

3. The integrator of claim 2, wherein the first set of switches is configured to connect:

the positive reference voltage node with the first terminal of the first sampling capacitor;

the negative reference voltage node with the first terminal of the second sampling capacitor; and

the second terminal of the first sampling capacitor with the second terminal of the second sampling capacitor.

4. The integrator of claim 3, wherein in a first configuration, the second set of switches is configured to connect:

the positive input voltage node with the first terminal of the first sampling capacitor;

the negative input voltage node with the first terminal of the second sampling capacitor;

the first input node of the amplifier with the second terminal of the first sampling capacitor; and

the second input node of the amplifier with the second terminal of the second sampling capacitor.

5. The integrator of claim 4, wherein in a second configuration, the second set of switches is configured to connect:

the positive input voltage node with the first terminal of the second sampling capacitor;

the negative input voltage node with the first terminal of the first sampling capacitor;

the first input node of the amplifier with the second terminal of the second sampling capacitor; and

the second input node of the amplifier with the second terminal of the first sampling capacitor.

6. The integrator of claim 5, wherein selection between the first and second configurations is controlled by a digital input to a digital-to-analog converter (DAC) in a delta-sigma modulator comprising the integrator.

7. The integrator of claim 5, wherein the first configuration is selected if a control bit for the second set of switches has a first logic level and wherein the second configuration is selected if the control bit has a second logic level opposite the first logic level.

8. The integrator of claim 1, wherein:

the second set of switches has a first configuration and a second configuration; and

selection between the first and second configurations is controlled by a digital input to a digital-to-analog converter (DAC) in a delta-sigma modulator comprising the integrator.

9. A switched-capacitor integrator, comprising:

an amplifier having first and second output nodes and first and second input nodes;

a first integration capacitor coupled between the first output node and the first input node;

a second integration capacitor coupled between the second output node and the second input node;

first and second sampling capacitors, each having a first terminal and a second terminal;

a first set of switches configured to connect reference voltage nodes with the first terminals of the first and second sampling capacitors during a sampling phase of the integrator;

a second set of switches configured, during an integration phase of the integrator, to connect;

input voltage nodes with the first terminals of the first and second sampling capacitors; and

the first and second input nodes of the amplifier with the second terminals of the first and second sampling capacitors, wherein the first set of switches is open during the integration phase and wherein the second set of switches is open during the sampling phase; and

an anti-aliasing filter connected between the input voltage nodes and a portion of the second set of switches, wherein a filter capacitor of the anti-aliasing filter has a substantially larger capacitance than the first sampling capacitor and the second sampling capacitor.

10. A switched-capacitor integrator, comprising:

an amplifier having first and second output nodes and first and second input nodes;

a first integration capacitor coupled between the first output node and the first input node;

a second integration capacitor coupled between the second output node and the second input node;

first and second sampling capacitors, each having a first terminal and a second terminal;

a first set of switches configured to connect reference voltage nodes with the first terminals of the first and second sampling capacitors during a sampling phase of the integrator;

a second set of switches configured, during an integration phase of the integrator, to connect;

input voltage nodes with the first terminals of the first and second sampling capacitors; and

the first and second input nodes of the amplifier with the second terminals of the first and second sampling capacitors, wherein the first set of switches is open during the integration phase and wherein the second set of switches is open during the sampling phase; and

a third set of switches configured to short at least one of the first or second sampling capacitor between the integration phase and the sampling phase.

11. A switched-capacitor integrator, comprising:

an amplifier having first and second output nodes and first and second input nodes;

a first integration capacitor coupled between the first output node and the first input node;

a second integration capacitor coupled between the second output node and the second input node;

first and second sampling capacitors, each having a first terminal and a second terminal;

a first set of switches configured to connect reference voltage nodes with the first terminals of the first and second sampling capacitors during a sampling phase of the integrator;

a second set of switches configured, during an integration phase of the integrator, to connect;

input voltage nodes with the first terminals of the first and second sampling capacitors; and

the first and second input nodes of the amplifier with the second terminals of the first and second sampling capacitors, wherein;

the first set of switches is open during the integration phase;

the second set of switches is open during the sampling phase; and

the first and second sampling capacitors and the second set of switches are part of a digital-to-analog converter (DAC) element having its own control bit; and

one or more additional DAC elements replicating the DAC element, each of the additional DAC elements having a control bit.

12. A switched-capacitor integrator, comprising:

an amplifier comprising an output node and an input node;

an integration capacitor coupled between the output node and the input node of the amplifier;

a sampling capacitor having a first terminal and a second terminal;

a first set of switches configured to connect a reference voltage node with the first terminal of the sampling capacitor during a sampling phase of the integrator; and

a second set of switches configured, during an integration phase of the integrator, to connect;

an input voltage node with the first terminal of the sampling capacitor in a first configuration;

the input voltage node with the second terminal of the sampling capacitor in a second configuration;

the input node of the amplifier with the second terminal of the sampling capacitor in the first configuration; and

the input node of the amplifier with the first terminal of the sampling capacitor in the second configuration, wherein the first set of switches is open during the integration phase and wherein the second set of switches is open during the sampling phase.

13. The integrator of claim 12, wherein the first configuration is selected if a control bit has a first logic level and wherein the second configuration is selected if the control bit has a second logic level opposite the first logic level.

14. The integrator of claim 12, further comprising an anti-aliasing filter connected between the input voltage node and a portion of the second set of switches, wherein a filter capacitor of the anti-aliasing filter has a substantially larger capacitance than the sampling capacitor.

15. The integrator of claim 12, wherein:

the first set of switches is configured to connect the second terminal of the sampling capacitor with a voltage level during the sampling phase;

the input node comprises a negative terminal of the amplifier; and

a positive terminal of the amplifier is connected with the voltage level.

16. The integrator of claim 12, further comprising a switch configured to short the sampling capacitor between the integration phase and the sampling phase.

17. The integrator of claim 12, wherein selection between the first and second configurations is controlled by a digital input to a digital-to-analog converter (DAC) in a delta-sigma modulator comprising the integrator.

18. The integrator of claim 12, wherein:

the sampling capacitor and the second set of switches are part of a digital-to-analog converter (DAC) element having its own control bit; and

the integrator further comprises one or more additional DAC elements replicating the DAC element, each of the additional DAC elements having a control bit and connected in parallel with the DAC element.

19. A switched-capacitor integrator, comprising:

an amplifier having first and second output nodes and first and second input nodes;

a first integration capacitor coupled between the first output node and the first input node;

a second integration capacitor coupled between the second output node and the second input node;

first and second sampling capacitors, each having a first terminal and a second terminal;

a first set of switches configured to connect reference voltage nodes with the first terminals of the first and second sampling capacitors during reference sampling phases of the integrator; and

a second set of switches configured, during integration phases of the integrator, to connect;

the second terminals of the first and second sampling capacitors with the first and second input nodes of the amplifier; and

the first terminals of the first and second sampling capacitors with outputs of first and second sampling networks, wherein the first set of switches is open during the integration phases, wherein the second set of switches is open during the reference sampling phases, and wherein each of the first and second sampling networks comprises;

a first input capacitor having first and second terminals;

a second input capacitor having first and second terminals;

a third set of switches configured to selectively connect an input node of the sampling network with the first terminal of the first input capacitor;

a fourth set of switches configured to connect an output node of the sampling network with the second terminal of the second input capacitor during a first set of the integration phases;

a fifth set of switches configured to selectively connect the input node of the sampling network with the first terminal of the second input capacitor; and

a sixth set of switches configured to connect the output node of the sampling network with the second terminal of the first input capacitor during a second set of the integration phases.

20. The integrator of claim 19, wherein:

the first set of the integration phases comprises odd integration phases;

the second set of the integration phases comprises even integration phases; and

the reference sampling phases overlap neither the first nor the second set of the integration phases.

21. The integrator of claim 19, wherein:

the third set of switches is configured to connect the input node of the sampling network with the first terminal of the first input capacitor during the first set of the integration phases; and

the fifth set of switches is configured to connect the input node of the sampling network with the first terminal of the second input capacitor during the second set of the integration phases.

22. The integrator of claim 19, wherein:

the third set of switches is further configured to selectively connect the second terminal of the first input capacitor to a first voltage level; and

the fourth set of switches is further configured to selectively connect the first terminal of the second input capacitor to a second voltage level.

23. The integrator of claim 22, wherein:

the fifth set of switches is further configured to selectively connect the second terminal of the second input capacitor to the first voltage level; and

the sixth set of switches is further configured to selectively connect the first terminal of the first input capacitor to the second voltage level.

24. The integrator of claim 19, wherein during the integration phases, the first sampling capacitor is effectively connected in series with the first or the second input capacitor in the first sampling network and the second sampling capacitor is effectively connected in series with the first or the second input capacitor in the second sampling network.

25. The integrator of claim 19, wherein the third and fourth sets of switches are open during the second set of the integration phases and wherein the fifth and sixth sets of switches are open during the first set of the integration phases.

26. The integrator of claim 25, wherein:

the third set of switches is closed and the sixth set of switches is open during a first set of input sampling phases; and

the fifth set of switches is closed and the fourth set of switches is open during a second set of input sampling phases, different from the first set of input sampling phases.

27. The integrator of claim 19, further comprising an anti-aliasing filter connected between input voltage nodes and the input nodes of the first and second sampling networks.

28. The integrator of claim 19, wherein:

the reference voltage nodes comprise a positive reference voltage node and a negative reference voltage node; and

the first set of switches is configured to connect;

the positive reference voltage node with the first terminal of the first sampling capacitor;

the negative reference voltage node with the first terminal of the second sampling capacitor; and

the second terminals of the first and second sampling capacitors with a voltage level.

29. The integrator of claim 28, wherein:

in a first configuration, the second set of switches is configured to connect;

the output node of the first sampling network with the first terminal of the first sampling capacitor;

the output node of the second sampling network with the first terminal of the second sampling capacitor;

the first input node of the amplifier with the second terminal of the first sampling capacitor; and

the second input node of the amplifier with the second terminal of the second sampling capacitor; and

in a second configuration, the second set of switches is configured to connect;

the output node of the first sampling network with the first terminal of the second sampling capacitor;

the output node of the second sampling network with the first terminal of the first sampling capacitor;

the first input node of the amplifier with the second terminal of the second sampling capacitor; and

the second input node of the amplifier with the second terminal of the first sampling capacitor.

30. The integrator of claim 29, wherein selection between the first and second configurations is controlled by a digital input to a digital-to-analog converter (DAC) in a delta-sigma modulator comprising the integrator.

31. The integrator of claim 19, wherein:

the second set of switches has a first configuration and a second configuration; and

selection between the first and second configurations is controlled by a digital input to a digital-to-analog converter (DAC) in a delta-sigma modulator comprising the integrator.